N. Jarwala

418 total citations
12 papers, 127 citations indexed

About

N. Jarwala is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering and Control and Systems Engineering. According to data from OpenAlex, N. Jarwala has authored 12 papers receiving a total of 127 indexed citations (citations by other indexed papers that have themselves been cited), including 11 papers in Hardware and Architecture, 8 papers in Electrical and Electronic Engineering and 6 papers in Control and Systems Engineering. Recurrent topics in N. Jarwala's work include VLSI and Analog Circuit Testing (11 papers), Engineering and Test Systems (6 papers) and Integrated Circuits and Semiconductor Failure Analysis (5 papers). N. Jarwala is often cited by papers focused on VLSI and Analog Circuit Testing (11 papers), Engineering and Test Systems (6 papers) and Integrated Circuits and Semiconductor Failure Analysis (5 papers). N. Jarwala collaborates with scholars based in United States. N. Jarwala's co-authors include Dhiraj K. Pradhan, Benoit Nadeau-Dostie, Y. Zorian and Rodham E. Tulloss and has published in prestigious journals such as Computer, IEEE Transactions on Computers and Journal of Electronic Testing.

In The Last Decade

N. Jarwala

11 papers receiving 114 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
N. Jarwala United States 6 119 108 21 17 7 12 127
Masaki Hashizume Japan 8 158 1.3× 215 2.0× 5 0.2× 12 0.7× 8 1.1× 100 236
M.E. Levitt United States 8 126 1.1× 130 1.2× 11 0.5× 5 0.3× 3 0.4× 19 147
Anuja Sehgal United States 12 285 2.4× 282 2.6× 28 1.3× 30 1.8× 2 0.3× 22 306
K.D. Wagner United States 8 233 2.0× 220 2.0× 36 1.7× 20 1.2× 15 2.1× 12 260
D.B.I. Feltham United States 9 308 2.6× 317 2.9× 30 1.4× 10 0.6× 5 0.7× 13 344
Rubin Parekhji India 12 293 2.5× 312 2.9× 33 1.6× 29 1.7× 8 1.1× 65 332
Christian G. Zoellin Germany 8 249 2.1× 239 2.2× 31 1.5× 23 1.4× 4 0.6× 21 266
D.K. Bhavsar United States 9 252 2.1× 243 2.3× 43 2.0× 47 2.8× 11 1.6× 24 292
Shianling Wu United States 8 303 2.5× 299 2.8× 53 2.5× 9 0.5× 12 1.7× 23 313
A.K. Pramanick United States 7 174 1.5× 176 1.6× 15 0.7× 5 0.3× 4 0.6× 14 185

Countries citing papers authored by N. Jarwala

Since Specialization
Citations

This map shows the geographic impact of N. Jarwala's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by N. Jarwala with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites N. Jarwala more than expected).

Fields of papers citing papers by N. Jarwala

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by N. Jarwala. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by N. Jarwala. The network helps show where N. Jarwala may publish in the future.

Co-authorship network of co-authors of N. Jarwala

This figure shows the co-authorship network connecting the top 25 collaborators of N. Jarwala. A scholar is included among the top collaborators of N. Jarwala based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with N. Jarwala. N. Jarwala is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

12 of 12 papers shown
1.
Jarwala, N., et al.. (2005). A Framework for Boundary-Scan Based System Test and Diagnosis. 993–993.
2.
Jarwala, N., et al.. (2005). Achieving Board-Level BIST Using the Boundary-Scan Master. 649–649. 5 indexed citations
3.
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6.
Jarwala, N., et al.. (2002). The boundary-scan master: target applications and functional requirements. 311–315. 10 indexed citations
7.
Jarwala, N., et al.. (2002). A secure data transmission scheme for 1149.1 backplane test bus. 789–796. 3 indexed citations
8.
Jarwala, N.. (1997). Designing “Dual Personality” IEEE 1149.1 Compliant Multi-Chip Modules. Journal of Electronic Testing. 10(1-2). 77–86. 5 indexed citations
9.
Jarwala, N., et al.. (1996). Built-in self-test: assuring system integrity. Computer. 29(11). 39–45. 11 indexed citations
10.
Jarwala, N., et al.. (1994). Boundary-Scan Testing for Electronic Subassemblies and Systems. AT&T Technical Journal. 73(2). 40–48. 1 indexed citations
11.
Jarwala, N. & Dhiraj K. Pradhan. (1988). TRAM: a design methodology for high-performance, easily testable, multimegabit RAMs. IEEE Transactions on Computers. 37(10). 1235–1250. 18 indexed citations
12.
Jarwala, N.. (1987). The seveteenth international symposium on fault tolerant computing. 17(3). 48–48. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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2026