M.E. Levitt

403 total citations
19 papers, 147 citations indexed

About

M.E. Levitt is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering and Industrial and Manufacturing Engineering. According to data from OpenAlex, M.E. Levitt has authored 19 papers receiving a total of 147 indexed citations (citations by other indexed papers that have themselves been cited), including 16 papers in Hardware and Architecture, 16 papers in Electrical and Electronic Engineering and 3 papers in Industrial and Manufacturing Engineering. Recurrent topics in M.E. Levitt's work include VLSI and Analog Circuit Testing (15 papers), Integrated Circuits and Semiconductor Failure Analysis (10 papers) and Low-power high-performance VLSI design (6 papers). M.E. Levitt is often cited by papers focused on VLSI and Analog Circuit Testing (15 papers), Integrated Circuits and Semiconductor Failure Analysis (10 papers) and Low-power high-performance VLSI design (6 papers). M.E. Levitt collaborates with scholars based in United States. M.E. Levitt's co-authors include Jacob A. Abraham, Sridhar Narayanan, Kaushik Roy, Alex K. Jones, Rajagopalan Srinivasan, Kaushik Roy and David Greenhill and has published in prestigious journals such as IEEE Journal of Solid-State Circuits, IEEE Transactions on Very Large Scale Integration (VLSI) Systems and IEEE Spectrum.

In The Last Decade

M.E. Levitt

14 papers receiving 126 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
M.E. Levitt United States 8 130 126 11 11 5 19 147
N. Jarwala United States 6 108 0.8× 119 0.9× 21 1.9× 5 0.5× 17 3.4× 12 127
W. Needham United States 7 355 2.7× 326 2.6× 30 2.7× 9 0.8× 9 1.8× 9 371
A.K. Majhi Netherlands 10 348 2.7× 336 2.7× 10 0.9× 6 0.5× 4 0.8× 17 353
Masaki Hashizume Japan 8 215 1.7× 158 1.3× 5 0.5× 6 0.5× 12 2.4× 100 236
P.G. Ryan United States 8 242 1.9× 246 2.0× 35 3.2× 7 0.6× 5 1.0× 15 262
S. Sermet Akbay United States 7 273 2.1× 246 2.0× 29 2.6× 10 0.9× 3 0.6× 9 291
S.D. Millman United States 9 341 2.6× 346 2.7× 45 4.1× 15 1.4× 7 1.4× 14 356
D.K. Beece United States 3 46 0.4× 53 0.4× 4 0.4× 2 0.2× 10 2.0× 6 64
C. L. Liu United States 4 40 0.3× 25 0.2× 9 0.8× 16 1.5× 13 2.6× 6 67
Anuja Sehgal United States 12 282 2.2× 285 2.3× 28 2.5× 4 0.4× 30 6.0× 22 306

Countries citing papers authored by M.E. Levitt

Since Specialization
Citations

This map shows the geographic impact of M.E. Levitt's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M.E. Levitt with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M.E. Levitt more than expected).

Fields of papers citing papers by M.E. Levitt

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M.E. Levitt. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M.E. Levitt. The network helps show where M.E. Levitt may publish in the future.

Co-authorship network of co-authors of M.E. Levitt

This figure shows the co-authorship network connecting the top 25 collaborators of M.E. Levitt. A scholar is included among the top collaborators of M.E. Levitt based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with M.E. Levitt. M.E. Levitt is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

19 of 19 papers shown
1.
Levitt, M.E.. (2005). Design for manufacturing? design for yield!!!. xxvii–xxvii.
2.
Roy, Kaushik, M.E. Levitt, & Jacob A. Abraham. (2003). The effect of multiple charge-discharge paths on testing of BiCMOS logic circuits. csg 13. 549–553.
3.
Levitt, M.E.. (2003). Economic and productivity considerations in ASIC test and design-for-test. 440–445. 3 indexed citations
4.
Levitt, M.E.. (2003). The economics of scan design. 869–874. 2 indexed citations
5.
Greenhill, David, et al.. (2002). A 64 b microprocessor with multimedia support. 178–179. 1 indexed citations
6.
7.
Levitt, M.E. & Jacob A. Abraham. (2002). Just-in-time methods for semiconductor manufacturing. 3–9. 9 indexed citations
8.
Roy, Kaushik, M.E. Levitt, & Jacob A. Abraham. (2002). Test considerations for BiCMOS logic families. 17.2/1–17.2/4. 6 indexed citations
9.
Levitt, M.E., et al.. (2002). Testability, debuggability, and manufacturability features of the UltraSPARC-I microprocessor. 157–166. 37 indexed citations
10.
Levitt, M.E., Kaushik Roy, & Jacob A. Abraham. (2002). BiCMOS fault models: is stuck-at adequate?. 294–297. 14 indexed citations
11.
Levitt, M.E.. (1998). Market Time DataTM Improving Technical Analysis and Technical Trading. 1 indexed citations
12.
Narayanan, Sridhar, et al.. (1997). A fault diagnosis methodology for the UltraSPARC/sup TM/-I microprocessor. 494–500. 9 indexed citations
13.
Levitt, M.E.. (1997). Designing UltraSparc for testability. IEEE Design & Test of Computers. 14(1). 10–17. 14 indexed citations
14.
Levitt, M.E.. (1997). Microprocessors Lead The Way In Complex Design. IEEE Design & Test of Computers. 14(1). 8–9. 11 indexed citations
15.
Levitt, M.E., Kaushik Roy, & Jacob A. Abraham. (1994). BiCMOS logic testing. IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 2(2). 241–248. 1 indexed citations
16.
Levitt, M.E.. (1992). ASIC testing upgraded. IEEE Spectrum. 29(5). 26–29. 13 indexed citations
17.
Levitt, M.E. & Jacob A. Abraham. (1990). Physical design of testable VLSI: techniques and experiments. IEEE Journal of Solid-State Circuits. 25(2). 474–481. 24 indexed citations
18.
Levitt, M.E.. (1990). Physical Design of Testable VLSI. Illinois Digital Environment for Access to Learning and Scholarship (University of Illinois at Urbana-Champaign). 1 indexed citations
19.
Levitt, M.E. & Jacob A. Abraham. (1989). Physical design of testable VLSI: techniques and experiments. 22.6/1–22.6/4. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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