P.R. Menon
Impact in
- Hardware and Architecture top 0.5%
- VLSI and Analog Circuit Testing
- Embedded Systems Design Techniques
- Parallel Computing and Optimization Techniques
- Software top 5%
- Software Testing and Debugging Techniques
Papers in
-
- VLSI and Analog Circuit Testing 41
- Embedded Systems Design Techniques 6
- Parallel Computing and Optimization Techniques 4
- Software 6
- Software Testing and Debugging Techniques 5
- Co-authors
- M. AbramoviciDavid T. MillerY. LevendelRussell TessierIan G. HarrisDominik StoffelWolfgang KunzS.G. Chappell
- Journals
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (11 papers)IEEE Transactions on Computers (2 papers)Bell System Technical Journal (4 papers)Journal of Electronic Testing (1 paper)Design Automation Conference (2 papers)
- Partner nations
- United StatesGermanyCanada
In The Last Decade
P.R. Menon
44 papers receiving 878 citations
Peers
Comparison fields: 5 of 27
- Hardware and Architecture 885
- Software 104
- Electrical and Electronic Engineering 798
- Computational Theory and Mathematics 84
- Management Science and Operations Research 62
Countries citing papers authored by P.R. Menon
This map shows the geographic impact of P.R. Menon's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by P.R. Menon with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites P.R. Menon more than expected).
Fields of papers citing papers by P.R. Menon
This network shows the impact of papers produced by P.R. Menon. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by P.R. Menon. The network helps show where P.R. Menon may publish in the future.
Co-authorship network
The 11 scholars most cited alongside P.R. Menon, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2005 | 1 | |
| 2 | 2003 | 7 | |
| 3 | 2003 | 1 | |
| 4 | 2003 | 7 | |
| 5 | 2002 | 18 | |
| 6 | 2002 | 48 | |
| 7 | 2002 | 14 | |
| 8 | 2001 | 9 | |
| 9 | 2000 | 2 | |
| 10 | 1997 | 16 | |
| 11 | 1997 | 3 | |
| 12 | 1995 | 2 | |
| 13 | 1993 | 1 | |
| 14 | Fault simulation | 1986 | 17 |
| 15 | 1983 | 81 | |
| 16 | 1983 | 89 | |
| 17 | 1983 | 38 | |
| 18 | 1982 | 15 | |
| 19 | 1982 | 37 | |
| 20 | 1981 | 10 |
About P.R. Menon
P.R. Menon is a scholar working on Hardware and Architecture, Software, Electrical and Electronic Engineering, Computational Theory and Mathematics and Management Science and Operations Research, having authored 48 papers that have together received 946 indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (41 papers), Integrated Circuits and Semiconductor Failure Analysis (26 papers), Radiation Effects in Electronics (25 papers), VLSI and FPGA Design Techniques (7 papers), Low-power high-performance VLSI design (7 papers), Embedded Systems Design Techniques (6 papers), Software Testing and Debugging Techniques (5 papers) and Parallel Computing and Optimization Techniques (4 papers). The work is most often cited by research in Hardware and Architecture (885 citations), Software (104 citations), Electrical and Electronic Engineering (798 citations), Computational Theory and Mathematics (84 citations) and Management Science and Operations Research (62 citations). P.R. Menon has collaborated with scholars based in United States, Germany and Canada. Frequent co-authors include M. Abramovici, David T. Miller, Y. Levendel, Russell Tessier, Ian G. Harris, Dominik Stoffel, Wolfgang Kunz, S.G. Chappell, Weifeng Xu and Charles E. Miller. Their work appears in journals such as IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on Computers, Bell System Technical Journal, Journal of Electronic Testing and Design Automation Conference.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.