M. Matloubian

1.0k citations
42 papers · 745 indexed · h-index 15

M. Matloubian

37 papers receiving 701 citations

Peers

M. Matloubian
Comparison fields: 5 of 22
  • Electrical and Electronic Engineering 740
  • Hardware and Architecture 16
  • Biomedical Engineering 61
  • Condensed Matter Physics 16
  • Atomic and Molecular Physics, and Optics 42
Replace Kit Man Cham with:
Kit Man Cham United States
F.S. Shoucair United States
A.T.A. Zegers-van Duijnhoven Netherlands
Wladek Grabinski Switzerland
J.Y.-C. Sun Taiwan
S.K.H. Fung United States
Javier A. Salcedo United States
J.T. Watt United States
R.J. Havens Netherlands
S. Okhonin Switzerland
M. Matloubian relative to Kit Man Cham United States Kit Man Cham's profile →
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Kit Man Cham · 1×
Citations per year

Countries citing papers authored by M. Matloubian

Since Specialization
Citations

This map shows the geographic impact of M. Matloubian's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Matloubian with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Matloubian more than expected).

Fields of papers citing papers by M. Matloubian

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. Matloubian. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Matloubian. The network helps show where M. Matloubian may publish in the future.

Co-authorship network

The 25 scholars most cited alongside M. Matloubian, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with M. Matloubian Line = papers co-authored together M. Matloubian links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown
#Work
1 200525
2 20030
3 20030
4 20024
5 20022
6 20024
7 20020
8 20024
9 200264
10 20026
11 200214
12 20021
13 200212
14 200188
15 200123
16 19947
17 19911
18 198927
19 1988146
20 198623

About M. Matloubian

M. Matloubian is a scholar working on Electrical and Electronic Engineering, Condensed Matter Physics and Atomic and Molecular Physics, and Optics, having authored 42 papers that have together received 745 indexed citations. Recurring topics across this work include Semiconductor materials and devices (29 papers), Advancements in Semiconductor Devices and Circuit Design (28 papers), Radio Frequency Integrated Circuit Design (17 papers), Silicon Carbide Semiconductor Technologies (9 papers), Integrated Circuits and Semiconductor Failure Analysis (8 papers), Electrostatic Discharge in Electronics (6 papers), Electromagnetic Compatibility and Noise Suppression (5 papers) and Radiation Effects in Electronics (3 papers). The work is most often cited by research in Electrical and Electronic Engineering (740 citations), Hardware and Architecture (16 citations) and Biomedical Engineering (61 citations). M. Matloubian has collaborated with scholars based in United States, Canada and Italy. Frequent co-authors include Yuhua Cheng, R. Sundaresan, Chih‐Hung Chen, M. Jamal Deen, Yuhua Cheng, B.-Y. Mao, G. Pollack, C.C. Wei, J.G. Fossum and D.R. Pehlke. Their work appears in journals such as IEEE Transactions on Electron Devices, IEEE Electron Device Letters and IEEE Transactions on Nuclear Science.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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