R.J. Havens

1.5k total citations
45 papers, 1.1k citations indexed

About

R.J. Havens is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, R.J. Havens has authored 45 papers receiving a total of 1.1k indexed citations (citations by other indexed papers that have themselves been cited), including 44 papers in Electrical and Electronic Engineering, 5 papers in Biomedical Engineering and 4 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in R.J. Havens's work include Radio Frequency Integrated Circuit Design (27 papers), Advancements in Semiconductor Devices and Circuit Design (23 papers) and Semiconductor materials and devices (19 papers). R.J. Havens is often cited by papers focused on Radio Frequency Integrated Circuit Design (27 papers), Advancements in Semiconductor Devices and Circuit Design (23 papers) and Semiconductor materials and devices (19 papers). R.J. Havens collaborates with scholars based in Netherlands, Belgium and Finland. R.J. Havens's co-authors include L.F. Tiemeijer, A.J. Scholten, R. van Langevelde, A.T.A. Zegers-van Duijnhoven, V. C. Venezia, R. de Kort, D.B.M. Klaassen, P.H. Woerlee, J.C.J. Paasschens and Jurriaan Schmitz and has published in prestigious journals such as IEEE Journal of Solid-State Circuits, IEEE Transactions on Microwave Theory and Techniques and IEEE Transactions on Electron Devices.

In The Last Decade

R.J. Havens

44 papers receiving 982 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
R.J. Havens Netherlands	17	1.1k	136	69	37	27	45	1.1k
E.P. Vandamme Belgium	12	762 0.7×	66 0.5×	73 1.1×	62 1.7×	40 1.5×	40	791
S. Decoutere Belgium	12	602 0.6×	255 1.9×	33 0.5×	16 0.4×	10 0.4×	29	610
M. Dehan Belgium	17	1.1k 1.0×	159 1.2×	44 0.6×	22 0.6×	19 0.7×	58	1.1k
J.Y.-C. Sun Taiwan	10	646 0.6×	121 0.9×	133 1.9×	8 0.2×	55 2.0×	28	666
H. Ishiuchi Japan	16	594 0.6×	94 0.7×	54 0.8×	12 0.3×	13 0.5×	63	611
M. Matloubian United States	15	740 0.7×	61 0.4×	42 0.6×	16 0.4×	21 0.8×	42	745
Kit Man Cham United States	11	340 0.3×	59 0.4×	70 1.0×	18 0.5×	16 0.6×	34	366
F. Allibert France	15	717 0.7×	176 1.3×	134 1.9×	22 0.6×	94 3.5×	69	736
Wei Liat Chan Netherlands	9	657 0.6×	71 0.5×	51 0.7×	34 0.9×	65 2.4×	14	681

Countries citing papers authored by R.J. Havens

Since Specialization

Citations

This map shows the geographic impact of R.J. Havens's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by R.J. Havens with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites R.J. Havens more than expected).

Fields of papers citing papers by R.J. Havens

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by R.J. Havens. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by R.J. Havens. The network helps show where R.J. Havens may publish in the future.

Co-authorship network of co-authors of R.J. Havens

This figure shows the co-authorship network connecting the top 25 collaborators of R.J. Havens. A scholar is included among the top collaborators of R.J. Havens based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with R.J. Havens. R.J. Havens is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Tiemeijer, L.F., et al.. (2007). Low-Loss Patterned Ground Shield Interconnect Transmission Lines in Advanced IC Processes. IEEE Transactions on Microwave Theory and Techniques. 55(3). 561–570. 36 indexed citations

Wel, P.J. van der, et al.. (2007). RF Characterisation and Process Control for Passive Integration Components. 1855–1860. 3 indexed citations

Havens, R.J., et al.. (2006). Application of the 1-D silicon limit to varactors. IEEE Transactions on Electron Devices. 53(7). 1601–1607. 3 indexed citations

Detcheverry, C., et al.. (2005). New low-cost thermally stable process to reduce silicon substrate losses: a way to extreme frequencies for high volume Si technologies. 463–466. 5 indexed citations

Paasschens, J.C.J., et al.. (2005). Physically based analytical modeling of base-collector charge, capacitance and transit time of III-V HBT's. 283–286. 3 indexed citations

Havens, R.J., R. de Kort, A.J. Scholten, et al.. (2005). Record RF performance of standard 90 nm CMOS technology. University of Twente Research Information. 441–444. 32 indexed citations

Tiemeijer, L.F., et al.. (2005). Comparison of the "pad-open-short" and "open-short-load" deembedding techniques for accurate on-wafer RF characterization of high-quality passives. IEEE Transactions on Microwave Theory and Techniques. 53(2). 723–729. 83 indexed citations

Tiemeijer, L.F., R.J. Havens, R. de Kort, & A.J. Scholten. (2005). Improved Y-factor method for wide-band on-wafer noise-parameter measurements. IEEE Transactions on Microwave Theory and Techniques. 53(9). 2917–2925. 35 indexed citations

Dekker, Rommert, et al.. (2004). "on-glass" process option for BiCMOS technology. 64–67. 1 indexed citations

10.

Tiemeijer, L.F., et al.. (2004). Predictive spiral inductor compact model for frequency and time domain. 36.4.1–36.4.4. 30 indexed citations

11.

Langevelde, R. van, J.C.J. Paasschens, A.J. Scholten, et al.. (2004). New compact model for induced gate current noise [MOSFET]. 36.2.1–36.2.4. 21 indexed citations

12.

Havens, R.J., D.B.M. Klaassen, A.J. Scholten, et al.. (2003). Noise Modeling with MOS Model 11 for RF-CMOS Applications. TechConnect Briefs. 2(2003). 286–289. 1 indexed citations

13.

Schmitz, Jurriaan, F.N. Cubaynes, R.J. Havens, et al.. (2003). RF capacitance-voltage characterization of MOSFETs with high leakage dielectrics. IEEE Electron Device Letters. 24(1). 37–39. 53 indexed citations

14.

Scholten, A.J., L.F. Tiemeijer, R. van Langevelde, et al.. (2003). Accurate thermal noise model for deep-submicron CMOS. 155–158. 56 indexed citations

15.

Havens, R.J., et al.. (2002). RF Applications of MOS Model 11. TechConnect Briefs. 1(2002). 674–677. 1 indexed citations

16.

Langevelde, R. van, L.F. Tiemeijer, R.J. Havens, et al.. (2002). RF-distortion in deep-submicron CMOS technologies. 807–810. 50 indexed citations

17.

Tiemeijer, L.F., et al.. (2002). Record Q spiral inductors in standard CMOS. 40.7.1–40.7.3. 31 indexed citations

18.

Venezia, V. C., A.J. Scholten, C. Detcheverry, et al.. (2002). The RF Potential of High-performance 100nm CMOS Technology. 491–494. 9 indexed citations

19.

Paasschens, J.C.J., W.J. Kloosterman, R.J. Havens, & H.C. de Graaff. (2002). Improved modeling of output conductance and cut-off frequency of bipolar transistors. 62–65. 2 indexed citations

20.

Paasschens, J.C.J., W.J. Kloosterman, R.J. Havens, & H.C. de Graaff. (2001). Improved compact modeling of output conductance and cutoff frequency of bipolar transistors. IEEE Journal of Solid-State Circuits. 36(9). 1390–1398. 4 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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