E. Lorfèvre

1.3k total citations
49 papers, 702 citations indexed

About

E. Lorfèvre is a scholar working on Electrical and Electronic Engineering, Astronomy and Astrophysics and Computational Mechanics. According to data from OpenAlex, E. Lorfèvre has authored 49 papers receiving a total of 702 indexed citations (citations by other indexed papers that have themselves been cited), including 41 papers in Electrical and Electronic Engineering, 6 papers in Astronomy and Astrophysics and 6 papers in Computational Mechanics. Recurrent topics in E. Lorfèvre's work include Radiation Effects in Electronics (31 papers), Semiconductor materials and devices (23 papers) and Integrated Circuits and Semiconductor Failure Analysis (14 papers). E. Lorfèvre is often cited by papers focused on Radiation Effects in Electronics (31 papers), Semiconductor materials and devices (23 papers) and Integrated Circuits and Semiconductor Failure Analysis (14 papers). E. Lorfèvre collaborates with scholars based in France, United States and Netherlands. E. Lorfèvre's co-authors include F. Bezerra, R. Ecoffet, Ronald D. Schrimpf, J.M. Palau, L. Dusseau, J. Boch, C. Dachs, Robert Ecoffet, Frédéric Saigné and C. Detcheverry and has published in prestigious journals such as IEEE Transactions on Nuclear Science, Microelectronics Reliability and Journal of Geophysical Research Space Physics.

In The Last Decade

E. Lorfèvre

49 papers receiving 674 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
E. Lorfèvre France 16 606 87 73 64 62 49 702
D. Falguère France 14 430 0.7× 100 1.1× 83 1.1× 87 1.4× 76 1.2× 36 531
F. Bezerra France 17 756 1.2× 115 1.3× 32 0.4× 154 2.4× 109 1.8× 76 822
Thierry Nuns France 15 423 0.7× 69 0.8× 43 0.6× 32 0.5× 34 0.5× 50 483
D.L. Oberg United States 13 438 0.7× 71 0.8× 32 0.4× 98 1.5× 49 0.8× 23 525
C.S. Dyer United Kingdom 9 197 0.3× 79 0.9× 73 1.0× 24 0.4× 98 1.6× 15 329
Robert Ecoffet France 12 271 0.4× 70 0.8× 85 1.2× 62 1.0× 75 1.2× 33 387
B. Quaghebeur Netherlands 7 184 0.3× 83 1.0× 99 1.4× 12 0.2× 98 1.6× 12 342
R. H. Maurer United States 11 179 0.3× 45 0.5× 130 1.8× 29 0.5× 44 0.7× 56 407
K.P. Ray United States 12 166 0.3× 34 0.4× 220 3.0× 24 0.4× 63 1.0× 34 409
A. Roach United States 11 201 0.3× 33 0.4× 144 2.0× 60 0.9× 13 0.2× 18 369

Countries citing papers authored by E. Lorfèvre

Since Specialization
Citations

This map shows the geographic impact of E. Lorfèvre's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by E. Lorfèvre with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites E. Lorfèvre more than expected).

Fields of papers citing papers by E. Lorfèvre

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by E. Lorfèvre. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by E. Lorfèvre. The network helps show where E. Lorfèvre may publish in the future.

Co-authorship network of co-authors of E. Lorfèvre

This figure shows the co-authorship network connecting the top 25 collaborators of E. Lorfèvre. A scholar is included among the top collaborators of E. Lorfèvre based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with E. Lorfèvre. E. Lorfèvre is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Jannet, G., Thierry Dudok de Wit, V. Krasnoselskikh, et al.. (2020). Measurement of Magnetic Field Fluctuations in the Parker Solar Probe and Solar Orbiter Missions. Journal of Geophysical Research Space Physics. 126(2). 16 indexed citations
2.
Bourdarie, S., C. Inguimbert, A. Sicard, et al.. (2017). Benchmarking ionizing space environment models. IEEE Transactions on Nuclear Science. 1–1. 8 indexed citations
3.
Boch, J., A. Michez, M.C. Rousselet, et al.. (2015). Dose Rate Switching Technique to Estimate the Low Dose Rate Response of Bipolar Technologies. 1–4. 2 indexed citations
4.
Wrobel, F., et al.. (2015). Experimental Characterization and In-Flight Observation of Weakened Cell in SDRAM. 1–8. 4 indexed citations
5.
Lorfèvre, E., et al.. (2015). CARMEN1 and CARMEN2 Experiment: Comparison between In-Flight Measured SEE Rates and Predictions. 41. 1–6. 3 indexed citations
6.
Touboul, Antoine, Mickaël Petit, J.-J. Huselstein, et al.. (2014). Impact of Single Event Gate Rupture and Latent Defects on Power MOSFETs Switching Operation. IEEE Transactions on Nuclear Science. 61(4). 1856–1864. 5 indexed citations
7.
Gonzalez-Velo, Y., J. Boch, Julien Mekki, et al.. (2011). The Use of Electron-Beam Lithography for Localized Micro-Beam Irradiations. IEEE Transactions on Nuclear Science. 58(3). 1104–1111. 3 indexed citations
10.
Dusseau, L., et al.. (2011). First In-Flight Data Analysis of Displacement Damage on the OSL Sensor On-Board CARMEN-2. IEEE Transactions on Nuclear Science. 58(3). 939–944. 10 indexed citations
11.
Dusseau, L., J. Boch, Frédéric Saigné, et al.. (2009). Accelerated Irradiation Method to Study Synergy Effects in Bipolar Integrated Circuits. IEEE Transactions on Nuclear Science. 56(4). 1971–1977. 20 indexed citations
12.
Bezerra, F., E. Lorfèvre, Robert Ecoffet, et al.. (2009). In flight observation of proton induced destructive single event phenomena. 16 indexed citations
13.
Touboul, Antoine, C. Petit, F. Wrobel, et al.. (2009). Contribution of Latent Defects Induced by High-Energy Heavy Ion Irradiation on the Gate Oxide Breakdown. IEEE Transactions on Nuclear Science. 56(4). 2213–2217. 10 indexed citations
14.
Dusseau, L., J. Boch, Nicolás Roche, et al.. (2008). Review and Analysis of the Radiation-Induced Degradation Observed for the Input Bias Current of Linear Integrated Circuits. IEEE Transactions on Nuclear Science. 55(6). 3174–3181. 20 indexed citations
15.
Beaumel, Matthieu, Thierry Bouchet, Larry L. Pater, et al.. (2007). SEGR study on Power MOSFETs: Multiple impacts assumption. 1–8. 2 indexed citations
17.
Boch, J., Ronald D. Schrimpf, J.-R. Vaillé, et al.. (2005). Estimation of low-dose-rate degradation on bipolar linear integrated circuits using switching experiments. IEEE Transactions on Nuclear Science. 52(6). 2616–2621. 36 indexed citations
18.
Boch, J., Frédéric Saigné, Ronald D. Schrimpf, et al.. (2005). Analysis of Total-Dose Response of A Bipolar Voltage Comparator Combining Radiation Experiments And Design Data. 49. F2–1. 14 indexed citations
19.
Lorfèvre, E., G. Bruguier, J.M. Palau, et al.. (1999). Cell design modifications to harden an N-channel power IGBT against single event latchup. IEEE Transactions on Nuclear Science. 46(6). 1410–1414. 5 indexed citations
20.
Detcheverry, C., C. Dachs, E. Lorfèvre, et al.. (1997). SEU critical charge and sensitive area in a submicron CMOS technology. IEEE Transactions on Nuclear Science. 44(6). 2266–2273. 60 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact

Rankless by CCL
2026