P. C. Murley

1.3k total citations
22 papers, 975 citations indexed

About

P. C. Murley is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Mechanical Engineering. According to data from OpenAlex, P. C. Murley has authored 22 papers receiving a total of 975 indexed citations (citations by other indexed papers that have themselves been cited), including 17 papers in Electrical and Electronic Engineering, 5 papers in Atomic and Molecular Physics, and Optics and 2 papers in Mechanical Engineering. Recurrent topics in P. C. Murley's work include Advancements in Semiconductor Devices and Circuit Design (11 papers), Silicon and Solar Cell Technologies (9 papers) and Radiation Effects in Electronics (5 papers). P. C. Murley is often cited by papers focused on Advancements in Semiconductor Devices and Circuit Design (11 papers), Silicon and Solar Cell Technologies (9 papers) and Radiation Effects in Electronics (5 papers). P. C. Murley collaborates with scholars based in United States. P. C. Murley's co-authors include R. R. O’Brien, David P. Kennedy, C. M. Hsieh, G. R. Srinivasan, He Tang, W. Kleinfelder, R. H. Kastl, W. K. Chu, J.S. Moore and R. F. Lever and has published in prestigious journals such as Journal of Applied Physics, Proceedings of the IEEE and Journal of The Electrochemical Society.

In The Last Decade

P. C. Murley

22 papers receiving 906 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
P. C. Murley United States	15	923	244	167	56	48	22	975
J.M. Palau France	24	1.6k 1.8×	451 1.8×	251 1.5×	121 2.2×	99 2.1×	79	1.7k
S. Kuboyama Japan	19	1.1k 1.2×	151 0.6×	66 0.4×	50 0.9×	23 0.5×	72	1.2k
T. F. Miyahira United States	19	762 0.8×	129 0.5×	69 0.4×	32 0.6×	71 1.5×	54	806
David F. Heidel United States	20	1.0k 1.1×	379 1.6×	58 0.3×	54 1.0×	145 3.0×	54	1.2k
D. Binder United States	10	407 0.4×	110 0.5×	25 0.1×	106 1.9×	80 1.7×	16	558
S. D. LaLumondiere United States	16	658 0.7×	142 0.6×	118 0.7×	37 0.7×	53 1.1×	34	742
Charles Slayman United States	12	452 0.5×	151 0.6×	88 0.5×	22 0.4×	30 0.6×	26	488
Milton S. Ash United States	5	423 0.5×	58 0.2×	30 0.2×	41 0.7×	67 1.4×	12	509
Leif Scheick United States	18	813 0.9×	94 0.4×	34 0.2×	59 1.1×	50 1.0×	80	889
R.L. Pease United States	14	814 0.9×	176 0.7×	28 0.2×	41 0.7×	51 1.1×	28	845

Countries citing papers authored by P. C. Murley

Since Specialization

Citations

This map shows the geographic impact of P. C. Murley's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by P. C. Murley with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites P. C. Murley more than expected).

Fields of papers citing papers by P. C. Murley

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by P. C. Murley. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by P. C. Murley. The network helps show where P. C. Murley may publish in the future.

Co-authorship network of co-authors of P. C. Murley

This figure shows the co-authorship network connecting the top 25 collaborators of P. C. Murley. A scholar is included among the top collaborators of P. C. Murley based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with P. C. Murley. P. C. Murley is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Murley, P. C. & G. R. Srinivasan. (1996). Soft-error Monte Carlo modeling program, SEMM. IBM Journal of Research and Development. 40(1). 109–118. 98 indexed citations

Srinivasan, G. R., P. C. Murley, & He Tang. (1994). Accurate, predictive modeling of soft error rate due to cosmic rays and chip alpha radiation. 12–16. 85 indexed citations

Srinivasan, G. R., He Tang, & P. C. Murley. (1994). Parameter-free, predictive modeling of single event upsets due to protons, neutrons, and pions in terrestrial cosmic rays. IEEE Transactions on Nuclear Science. 41(6). 2063–2070. 43 indexed citations

Murley, P. C. & G. R. Srinivasan. (1989). Coupled On/Off‐Buried Layer Modeling of Growth Rate Dependence of Arsenic Autodoping Profiles in Silicon. Journal of The Electrochemical Society. 136(7). 2010–2014. 2 indexed citations

Murley, P. C., et al.. (1989). Effective Charge of Moving Ions in Matter. physica status solidi (b). 151(2). 2 indexed citations

O’Brien, R. R., C. M. Hsieh, J.S. Moore, et al.. (1985). Two-dimensional process modeling: A description of the SAFEPRO program. IBM Journal of Research and Development. 29(3). 229–241. 19 indexed citations

Hsieh, C. M., P. C. Murley, & R. R. O’Brien. (1981). A field-funneling effect on the collection of alpha-particle-generated carriers in silicon devices. IEEE Electron Device Letters. 2(4). 103–105. 225 indexed citations

Hsieh, C. M., P. C. Murley, & R. R. O’Brien. (1981). Dynamics of Charge Collection from Alpha-Particle Tracks in Integrated Circuits. Reliability physics. 69 indexed citations

Chu, W. K., R. H. Kastl, & P. C. Murley. (1980). Low-energy antimony implantation in silicon. Radiation Effects. 47(1-4). 1–6. 17 indexed citations

10.

Kennedy, David P. & P. C. Murley. (1973). Steady State Mathematical Theory for the Insulated Gate Field Effect Transistor. IBM Journal of Research and Development. 17(1). 2–12. 41 indexed citations

11.

Kennedy, David P. & P. C. Murley. (1972). Analysis of epitaxial layer thickness variability in the fabrication of high performance bipolar transistors. Solid-State Electronics. 15(2). 203–213. 5 indexed citations

12.

Kennedy, David P. & P. C. Murley. (1971). Concentration dependent diffusion of arsenic in silicon. Proceedings of the IEEE. 59(2). 335–336. 21 indexed citations

13.

Kennedy, David P. & P. C. Murley. (1968). A Two-Dimensional Mathematical Analysis of the Diffused Semiconductor Resistor. IBM Journal of Research and Development. 12(3). 242–250. 22 indexed citations

14.

Kennedy, David P., P. C. Murley, & W. Kleinfelder. (1968). On the Measurement of Impurity Atom Distributions in Silicon by the Differential Capacitance Technique. IBM Journal of Research and Development. 12(5). 399–409. 129 indexed citations

15.

Kennedy, David P. & P. C. Murley. (1966). Calculations of Impurity Atom Diffusion Through a Narrow Diffusion Mask Opening. IBM Journal of Research and Development. 10(1). 6–12. 14 indexed citations

16.

Kennedy, David P., P. C. Murley, & R. R. O’Brien. (1964). A Statistical Approach to the Design of Diffused Junction Transistors. IBM Journal of Research and Development. 8(5). 482–495. 21 indexed citations

17.

Kennedy, David P. & P. C. Murley. (1964). Impurity atom distribution from a two-step diffusion process. Proceedings of the IEEE. 52(5). 620–621. 16 indexed citations

18.

Murley, P. C., et al.. (1963). Impurity atom diffusion into finite slices of semiconductor material. Proceedings of the IEEE. 51(2). 372–373. 3 indexed citations

19.

Kennedy, David P. & P. C. Murley. (1962). Base Region Transport Characteristics of a Diffused Transistor. Journal of Applied Physics. 33(1). 120–125. 8 indexed citations

20.

Kennedy, David P. & P. C. Murley. (1961). Theoretical current gain of a cylindrical mesa transistor. Solid-State Electronics. 3(3-4). 215–225. 5 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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