Ho-Kyu Kang

911 total citations
35 papers, 722 citations indexed

About

Ho-Kyu Kang is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, Ho-Kyu Kang has authored 35 papers receiving a total of 722 indexed citations (citations by other indexed papers that have themselves been cited), including 35 papers in Electrical and Electronic Engineering, 10 papers in Electronic, Optical and Magnetic Materials and 7 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in Ho-Kyu Kang's work include Semiconductor materials and devices (24 papers), Copper Interconnects and Reliability (10 papers) and Advancements in Semiconductor Devices and Circuit Design (9 papers). Ho-Kyu Kang is often cited by papers focused on Semiconductor materials and devices (24 papers), Copper Interconnects and Reliability (10 papers) and Advancements in Semiconductor Devices and Circuit Design (9 papers). Ho-Kyu Kang collaborates with scholars based in South Korea and United States. Ho-Kyu Kang's co-authors include Cheol Seong Hwang, Soon Oh Park, Hag‐Ju Cho, Moon Yong Lee, Sang In Lee, Kee-Won Kwon, Changseok Kang, Nae-In Lee, Jong‐Ho Lee and Jaehoo Park and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Optics Express.

In The Last Decade

Ho-Kyu Kang

32 papers receiving 696 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Ho-Kyu Kang South Korea 12 639 421 114 95 64 35 722
Badih El-Kareh United States 12 497 0.8× 140 0.3× 90 0.8× 63 0.7× 70 1.1× 30 588
Chao-Ching Cheng Taiwan 17 625 1.0× 547 1.3× 170 1.5× 63 0.7× 99 1.5× 56 863
Bich-Yen Nguyen France 19 1.3k 2.1× 355 0.8× 123 1.1× 88 0.9× 96 1.5× 119 1.4k
Joo Tae Moon South Korea 15 683 1.1× 371 0.9× 82 0.7× 125 1.3× 71 1.1× 61 806
Barry O’Sullivan Belgium 15 970 1.5× 333 0.8× 99 0.9× 63 0.7× 188 2.9× 109 1.1k
Y. Arimoto Japan 12 876 1.4× 318 0.8× 247 2.2× 77 0.8× 96 1.5× 67 1.1k
R. Moazzami United States 12 646 1.0× 626 1.5× 299 2.6× 209 2.2× 92 1.4× 29 938
P.K. Tan Singapore 8 405 0.6× 333 0.8× 115 1.0× 87 0.9× 71 1.1× 56 481
S. Kadomura Japan 11 499 0.8× 75 0.2× 79 0.7× 170 1.8× 34 0.5× 43 542
Yean-Kuen Fang Taiwan 13 474 0.7× 223 0.5× 85 0.7× 114 1.2× 63 1.0× 79 569

Countries citing papers authored by Ho-Kyu Kang

Since Specialization
Citations

This map shows the geographic impact of Ho-Kyu Kang's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Ho-Kyu Kang with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Ho-Kyu Kang more than expected).

Fields of papers citing papers by Ho-Kyu Kang

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Ho-Kyu Kang. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Ho-Kyu Kang. The network helps show where Ho-Kyu Kang may publish in the future.

Co-authorship network of co-authors of Ho-Kyu Kang

This figure shows the co-authorship network connecting the top 25 collaborators of Ho-Kyu Kang. A scholar is included among the top collaborators of Ho-Kyu Kang based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Ho-Kyu Kang. Ho-Kyu Kang is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Kim, Jeong‐Lim, et al.. (2017). Early stage hot spot analysis through standard cell base random pattern generation. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 10148. 101480S–101480S. 2 indexed citations
2.
Lee, Jeongjin, et al.. (2014). The effect of individually-induced processes on image-based overlay and diffraction-based overlay. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 9050. 905039–905039. 5 indexed citations
3.
Ahn, Jeongho, et al.. (2013). Optical analysis on the wafer defect inspection for yield enhancement. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8681. 86811E–86811E. 1 indexed citations
4.
Shin, Joonghan, Beomseok Kim, Eunha Lee, et al.. (2013). Epitaxial growth technology for optical interconnect based on bulk-Si platform. 3–4. 3 indexed citations
5.
Kim, Sang-Su, Dongkyu Lee, Kab-Jin Nam, et al.. (2013). A practical Si nanowire technology with nanowire-on-insulator structure for beyond 10nm logic technologies. 26.5.1–26.5.4. 40 indexed citations
6.
Shim, Seongbo, et al.. (2013). The effect of mask and source complexity on source mask optimization. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8683. 86830C–86830C. 1 indexed citations
7.
8.
Kım, Kihyun, et al.. (2012). The new test pattern selection method for OPC model calibration, based on the process of clustering in a hybrid space. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8522. 85221A–85221A. 19 indexed citations
9.
Ahn, Su Jin, Yoon-Jong Song, Hoon Jeong, et al.. (2011). Reliability perspectives for high density PRAM manufacturing. 12.6.1–12.6.4. 25 indexed citations
10.
Lee, Jang-Hee, In‐Sun Jung, Kyuhee Han, et al.. (2011). Robust porous SiOCH (k=2.5) for 28nm and beyond technology node. 99. 1–3. 1 indexed citations
11.
Kim, Hansu, et al.. (2009). Characterization and Modeling of RF-Performance $(f_{T})$ Fluctuation in MOSFETs. IEEE Electron Device Letters. 30(8). 855–857. 10 indexed citations
12.
13.
Lee, Sunjung, et al.. (2005). New insight into stress induced voiding mechanism in Cu interconnects. 108–110. 6 indexed citations
14.
Won, Seok-Jun, Yongkuk Jeong, Ho-Kyu Kang, et al.. (2004). Novel plasma enhanced atomic layer deposition technology for high-k capacitor with EOT of 8 Å on conventional metal electrode. 23–24. 1 indexed citations
15.
16.
17.
Park, Jaehoo, Cheol Seong Hwang, Hyeong Joon Kim, et al.. (2003). Investigation of interface trap states in TiN/Al2O3/p-Si capacitor by deep level transient spectroscopy. Applied Physics Letters. 82(7). 1066–1068. 27 indexed citations
18.
19.
Ha, Jungmin, et al.. (2001). Characteristics of BF3 plasma-doped gate/source/drain for 0.18-μm pMOSFETs. Surface and Coatings Technology. 136(1-3). 157–161. 5 indexed citations
20.
Park, Soon Oh, et al.. (1996). Fabrication and Electrical Characterization of Pt/(Ba,Sr)TiO3/Pt Capacitors for Ultralarge-Scale Integrated Dynamic Random Access Memory Applications. Japanese Journal of Applied Physics. 35(2S). 1548–1548. 62 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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