A.T. Wu

581 total citations
28 papers, 434 citations indexed

About

A.T. Wu is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Materials Chemistry. According to data from OpenAlex, A.T. Wu has authored 28 papers receiving a total of 434 indexed citations (citations by other indexed papers that have themselves been cited), including 25 papers in Electrical and Electronic Engineering, 12 papers in Atomic and Molecular Physics, and Optics and 6 papers in Materials Chemistry. Recurrent topics in A.T. Wu's work include Semiconductor materials and devices (22 papers), Advancements in Semiconductor Devices and Circuit Design (13 papers) and Semiconductor materials and interfaces (10 papers). A.T. Wu is often cited by papers focused on Semiconductor materials and devices (22 papers), Advancements in Semiconductor Devices and Circuit Design (13 papers) and Semiconductor materials and interfaces (10 papers). A.T. Wu collaborates with scholars based in United States, Italy and Japan. A.T. Wu's co-authors include T.Y. Chan, Chenming Hu, P.K. Ko, P.K. Ko, V. Murali, M.-C. Jeng, J.E. Moon, J.E. Chung, T. George and Shinji Nozaki and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and IEEE Transactions on Electron Devices.

In The Last Decade

A.T. Wu

27 papers receiving 406 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
A.T. Wu United States 13 417 104 48 27 19 28 434
D. Vook United States 11 362 0.9× 164 1.6× 62 1.3× 21 0.8× 22 1.2× 17 403
Mark N. Ruberto United States 11 418 1.0× 82 0.8× 77 1.6× 42 1.6× 21 1.1× 23 458
D.P. Vu France 10 305 0.7× 83 0.8× 79 1.6× 33 1.2× 17 0.9× 33 320
S. Swirhun United States 12 583 1.4× 242 2.3× 67 1.4× 44 1.6× 34 1.8× 23 615
Tai Satô Japan 7 416 1.0× 122 1.2× 75 1.6× 74 2.7× 9 0.5× 12 449
L.C. Parrillo United States 10 372 0.9× 70 0.7× 38 0.8× 18 0.7× 5 0.3× 25 385
M. Togo Japan 14 599 1.4× 62 0.6× 66 1.4× 69 2.6× 7 0.4× 68 619
B. Rose France 11 296 0.7× 238 2.3× 60 1.3× 20 0.7× 21 1.1× 28 344
K. Ohta Japan 11 251 0.6× 207 2.0× 64 1.3× 16 0.6× 26 1.4× 40 350
A. Chou United States 11 657 1.6× 80 0.8× 114 2.4× 71 2.6× 20 1.1× 24 684

Countries citing papers authored by A.T. Wu

Since Specialization
Citations

This map shows the geographic impact of A.T. Wu's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by A.T. Wu with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites A.T. Wu more than expected).

Fields of papers citing papers by A.T. Wu

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by A.T. Wu. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by A.T. Wu. The network helps show where A.T. Wu may publish in the future.

Co-authorship network of co-authors of A.T. Wu

This figure shows the co-authorship network connecting the top 25 collaborators of A.T. Wu. A scholar is included among the top collaborators of A.T. Wu based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with A.T. Wu. A.T. Wu is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Wu, A.T., Leander D. L. Anderegg, Todd E. Dawson, & Anna T. Trugman. (2023). Leaf trait coordination and variation of blue oak across topo-environmental scales. Tree Physiology. 43(12). 2098–2108. 1 indexed citations
2.
Chen, Wei, David B. Fraser, A.T. Wu, Milan Paunović, & C. H. Ting. (2003). The use of selective electroless metal deposition for micron size contact fill. 446–449. 1 indexed citations
4.
Wu, A.T., et al.. (1992). Temperature and field dependence of carrier mobility in MOSFETs with reoxidized nitrided oxide gate dielectrics. Solid-State Electronics. 35(1). 27–32. 14 indexed citations
5.
Alley, G, et al.. (1991). Radiation effects on JFETS, MOSFETS, and bipolar transistors, as related to SSC circuit design. Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment. 307(2-3). 452–457. 6 indexed citations
6.
George, T., et al.. (1990). Transmission electron microscopy investigation of dislocation bending by GaAsP/GaAs strained-layer superlattices on heteroepitaxial GaAs/Si. Journal of Applied Physics. 68(10). 5115–5118. 10 indexed citations
7.
Nozaki, Shinji, et al.. (1990). Metalorganic chemical vapor deposition growth of undoped GaAs with a low electron concentration on a Si substrate. Applied Physics Letters. 57(25). 2669–2671. 13 indexed citations
8.
Wu, A.T., et al.. (1990). Oxides grown on textured single-crystal silicon-dependence on process and application of EEPROMs. IEEE Transactions on Electron Devices. 37(3). 583–590. 17 indexed citations
9.
Wu, A.T., et al.. (1990). Off-state gate current in n-channel MOSFETs with nitrided oxide gate dielectrics. IEEE Electron Device Letters. 11(11). 499–501. 6 indexed citations
10.
Murali, V., A.T. Wu, Amitava Chatterjee, & David B. Fraser. (1990). A novel technique for in-line monitoring of micro-contamination and process induced damage. 103–104. 1 indexed citations
11.
Chan, T.Y., et al.. (1990). Circuit performance of CMOS technologies with silicon dioxide and reoxidized nitrided oxide gate dielectrics. IEEE Electron Device Letters. 11(7). 294–296. 11 indexed citations
12.
Wu, A.T., et al.. (1989). Gate bias polarity dependence of charge trapping and time-dependent dielectric breakdown in nitrided and reoxidized nitrided oxides. IEEE Electron Device Letters. 10(10). 443–445. 28 indexed citations
13.
Wu, A.T., et al.. (1989). Nitridation-induced surface donor layer in silicon. Applied Physics Letters. 55(16). 1665–1667. 8 indexed citations
14.
Murali, V., et al.. (1989). In-situ processing using rapid thermal chemical vapor deposition. Journal of Electronic Materials. 18(6). 731–736. 6 indexed citations
15.
Nozaki, Shinji, et al.. (1989). New mechanism for Si incorporation in GaAs-on-Si heteroepitaxial layers grown by metalorganic chemical vapor deposition. Applied Physics Letters. 55(16). 1674–1676. 18 indexed citations
16.
Wu, A.T., et al.. (1988). Oxides grown on textured single-crystal silicon for enhanced conduction. Applied Physics Letters. 52(14). 1139–1141. 5 indexed citations
17.
Jeng, M.-C., J.E. Chung, A.T. Wu, et al.. (1987). Performance and hot-electron reliability of deep-submicron MOSFET's. Rare & Special e-Zone (The Hong Kong University of Science and Technology). 710–713. 11 indexed citations
18.
Chan, T.Y., A.T. Wu, P.K. Ko, Chenming Hu, & R. R. Razouk. (1986). Asymmetrical characteristics in LDD and minimum-overlap MOSFET's. IEEE Electron Device Letters. 7(1). 16–19. 46 indexed citations
19.
Ko, P.K., T.Y. Chan, A.T. Wu, & Chenming Hu. (1986). The effects of weak gate-to-drain(source) overlap on MOSFET characteristics. Rare & Special e-Zone (The Hong Kong University of Science and Technology). 292–295. 26 indexed citations
20.
Wu, A.T., T.Y. Chan, P.K. Ko, & Chenming Hu. (1986). A source-side injection erasable programmable read-only-memory (SI-EPROM) device. IEEE Electron Device Letters. 7(9). 540–542. 14 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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