Gilson Wirth
Impact in
- Hardware and Architecture top 2%
- VLSI and Analog Circuit Testing
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- Advancements in Semiconductor Devices and Circuit Design
- Semiconductor materials and devices
- Radiation Effects in Electronics
- Integrated Circuits and Semiconductor Failure Analysis
- Low-power high-performance VLSI design
- Advanced Memory and Neural Computing
Papers in
-
- Advancements in Semiconductor Devices and Circuit Design 94
- Semiconductor materials and devices 75
- Radiation Effects in Electronics 45
- Integrated Circuits and Semiconductor Failure Analysis 40
- Low-power high-performance VLSI design 40
- Thin-Film Transistor Technologies 11
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- VLSI and Analog Circuit Testing 30
- Co-authors
- Fernanda Lima Kastensmidt (25 shared papers)Roberto da Silva (17 shared papers)B. Kaczer (6 shared papers)Ulrich Hilleringmann (12 shared papers)Christian Fayomi (9 shared papers)Ralf Brederlow (6 shared papers)Michele O. Vieira (5 shared papers)Tibor Grasser (4 shared papers)
- Journals
- Microelectronics Reliability (12 papers)IEEE Transactions on Electron Devices (10 papers)Journal of Computational Electronics (7 papers)IEEE Transactions on Device and Materials Reliability (4 papers)IEEE Electron Device Letters (3 papers)
- Partner nations
- BrazilUnited StatesGermany
In The Last Decade
Gilson Wirth
139 papers receiving 1.5k citations
Peers
Comparison fields: 5 of 77
- Hardware and Architecture 385
- Electrical and Electronic Engineering 1.5k
- Biomedical Engineering 178
- Materials Chemistry 124
- Safety, Risk, Reliability and Quality 20
Countries citing papers authored by Gilson Wirth
This map shows the geographic impact of Gilson Wirth's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Gilson Wirth with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Gilson Wirth more than expected).
Fields of papers citing papers by Gilson Wirth
This network shows the impact of papers produced by Gilson Wirth. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Gilson Wirth. The network helps show where Gilson Wirth may publish in the future.
Co-authors
The 25 scholars most cited alongside Gilson Wirth, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 150 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2011 | 102 | |
| 2 | 2006 | 91 | |
| 3 | 2011 | 69 | |
| 4 | 2013 | 67 | |
| 5 | 2005 | 65 | |
| 6 | 2008 | 63 | |
| 7 | 2011 | 59 | |
| 8 | 2009 | 45 | |
| 9 | 2007 | 34 | |
| 10 | 2016 | 30 | |
| 11 | 2016 | 29 | |
| 12 | 2023 | 27 | |
| 13 | 2010 | 25 | |
| 14 | 2022 | 24 | |
| 15 | 2007 | 23 | |
| 16 | 2011 | 23 | |
| 17 | 2014 | 22 | |
| 18 | 2008 | 21 | |
| 19 | 2013 | 20 | |
| 20 | 2014 | 18 |
About Gilson Wirth
Gilson Wirth is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Biomedical Engineering, Materials Chemistry and Atomic and Molecular Physics, and Optics, having authored 150 papers that have together received 1.6k indexed citations. Recurring topics across this work include Advancements in Semiconductor Devices and Circuit Design (94 papers), Semiconductor materials and devices (75 papers), Radiation Effects in Electronics (45 papers), Integrated Circuits and Semiconductor Failure Analysis (40 papers), Low-power high-performance VLSI design (40 papers), VLSI and Analog Circuit Testing (30 papers), Analog and Mixed-Signal Circuit Design (15 papers) and Thin-Film Transistor Technologies (11 papers). The work is most often cited by research in Hardware and Architecture (385 citations), Electrical and Electronic Engineering (1.5k citations), Biomedical Engineering (178 citations), Materials Chemistry (124 citations) and Safety, Risk, Reliability and Quality (20 citations). Gilson Wirth has collaborated with scholars based in Brazil, United States and Germany. Frequent co-authors include Fernanda Lima Kastensmidt, Roberto da Silva, B. Kaczer, Ulrich Hilleringmann, Christian Fayomi, Ralf Brederlow, Michele O. Vieira, Tibor Grasser, G. Groeseneken and Ricardo Reis. Their work appears in journals such as Microelectronics Reliability, IEEE Transactions on Electron Devices, Journal of Computational Electronics, IEEE Transactions on Device and Materials Reliability and IEEE Electron Device Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.