Gilson Wirth

2.2k total citations
149 papers, 1.6k citations indexed

About

Gilson Wirth is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Biomedical Engineering. According to data from OpenAlex, Gilson Wirth has authored 149 papers receiving a total of 1.6k indexed citations (citations by other indexed papers that have themselves been cited), including 144 papers in Electrical and Electronic Engineering, 33 papers in Hardware and Architecture and 19 papers in Biomedical Engineering. Recurrent topics in Gilson Wirth's work include Advancements in Semiconductor Devices and Circuit Design (94 papers), Semiconductor materials and devices (76 papers) and Radiation Effects in Electronics (44 papers). Gilson Wirth is often cited by papers focused on Advancements in Semiconductor Devices and Circuit Design (94 papers), Semiconductor materials and devices (76 papers) and Radiation Effects in Electronics (44 papers). Gilson Wirth collaborates with scholars based in Brazil, United States and Germany. Gilson Wirth's co-authors include Fernanda Lima Kastensmidt, Roberto da Silva, B. Kaczer, Ulrich Hilleringmann, Ralf Brederlow, Christian Fayomi, Ricardo Reis, Michele O. Vieira, Yu Cao and Tibor Grasser and has published in prestigious journals such as Advanced Functional Materials, Nanoscale and IEEE Access.

In The Last Decade

Gilson Wirth

139 papers receiving 1.5k citations

Peers

Gilson Wirth

EEE

AMPO

Pieter Weckx Belgium

Dimitri Linten Belgium

Payman Zarkesh-Ha United States

J. Martín-Martínez Spain

David Fried United States

Sangwoo Pae South Korea

K. Tsuji Japan

Harish M. Kittur India

Christophe Lallement France

S.A. Hareland United States

Pieter Weckx Belgium

Gilson Wirth

1.8k ×1.2

EEE

184 ×0.5

128 ×0.7

130 ×1.1

63 ×1.4

AMPO

Citations per year, relative to Gilson Wirth Gilson Wirth (= 1×) peers Pieter Weckx

Countries citing papers authored by Gilson Wirth

Since Specialization

Citations

This map shows the geographic impact of Gilson Wirth's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Gilson Wirth with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Gilson Wirth more than expected).

Fields of papers citing papers by Gilson Wirth

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Gilson Wirth. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Gilson Wirth. The network helps show where Gilson Wirth may publish in the future.

Co-authorship network of co-authors of Gilson Wirth

This figure shows the co-authorship network connecting the top 25 collaborators of Gilson Wirth. A scholar is included among the top collaborators of Gilson Wirth based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Gilson Wirth. Gilson Wirth is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Bonnin, Michele, et al.. (2025). Modeling and Predicting Noise-Induced Failure Rates in Ultra-Low-Voltage SRAM Bitcells Affected by Process Variations. IEEE Transactions on Circuits and Systems I Regular Papers. 72(3). 989–1002.

Wirth, Gilson, et al.. (2024). Three-dimensional quantum-corrected Monte Carlo device simulator of n-FinFETs. Journal of Computational Electronics. 23(2). 257–266. 1 indexed citations

Wirth, Gilson, et al.. (2023). Random Telegraph Noise in Analog CMOS Circuits. IEEE Transactions on Circuits and Systems I Regular Papers. 70(6). 2229–2242. 5 indexed citations

Wang, Ziyi, et al.. (2023). Thermal Effects in Fully-Depleted SOI Devices. 1–4. 1 indexed citations

Pazos, Sebastián, Marco A. Villena, Wenwen Zheng, et al.. (2023). High‐Temporal‐Resolution Characterization Reveals Outstanding Random Telegraph Noise and the Origin of Dielectric Breakdown in h‐BN Memristors. Advanced Functional Materials. 34(15). 27 indexed citations

Wirth, Gilson, et al.. (2023). Random Telegraph Noise-Based True Random Number Generator for Fully Integrated Systems. Fluctuation and Noise Letters. 22(3). 1 indexed citations

Silva, Roberto da & Gilson Wirth. (2022). RTS noise in semiconductor devices: time constants estimates and observation window analysis. Journal of Statistical Mechanics Theory and Experiment. 2022(4). 43201–43201. 1 indexed citations

Vasileska, Dragica, et al.. (2021). 3-D non-isothermal particle-based device simulator for p-type MOSFETs. Journal of Computational Electronics. 20(5). 1644–1656. 1 indexed citations

Wirth, Gilson, et al.. (2021). Ensemble Monte Carlo Simulation of Hole Transport in SiGe Alloys. Journal of Integrated Circuits and Systems. 16(1). 1–5. 1 indexed citations

10.

Tuinhout, Hans, et al.. (2019). A Compact Statistical Model for the Low-Frequency Noise in Halo-Implanted MOSFETs: Large RTN Induced by Halo Implants. IEEE Transactions on Electron Devices. 66(8). 3521–3526. 4 indexed citations

11.

Wirth, Gilson, et al.. (2018). Design Flow Methodology for Radiation Hardened by Design CMOS Enclosed-Layout-Transistor-Based Standard-Cell Library. Journal of Electronic Testing. 34(6). 735–747. 11 indexed citations

12.

Wirth, Gilson, et al.. (2018). Time domain electrical characterization in zinc oxide nanoparticle thin-film transistors. Publikationsdatenbank der Fraunhofer-Gesellschaft (Fraunhofer-Gesellschaft). 86. 1–6. 1 indexed citations

13.

Wirth, Gilson, et al.. (2013). Analysis of Total Ionizing Dose Effects on 0.13µm Technology-Temperature-Compensated Voltage References. Journal of Aerospace Technology and Management. 5(3). 335–340. 1 indexed citations

14.

Velamala, Jyothi, Ketul B. Sutaria, Hiromitsu Awano, et al.. (2013). Compact Modeling of Statistical BTI Under Trapping/Detrapping. IEEE Transactions on Electron Devices. 60(11). 3645–3654. 66 indexed citations

15.

Wirth, Gilson, et al.. (2012). Curvature correction method based on subthreshold currents for bandgap voltage references. 1–4. 6 indexed citations

16.

Wirth, Gilson, et al.. (2012). A PLL for clock generation with automatic frequency control under TID effects. 2. 1–5. 1 indexed citations

17.

Silva, Roberto da, et al.. (2010). Statistical fluctuations for the noise current from random telegraph signals in semiconductor devices: Monte Carlo computer simulations and best fits. Physica A Statistical Mechanics and its Applications. 389(14). 2687–2699. 7 indexed citations

18.

Assis, T., Fernanda Lima Kastensmidt, Gilson Wirth, & Ricardo Reis. (2009). Measuring the effectiveness of symmetric and asymmetric transistor sizing for Single Event Transient mitigation in CMOS 90nm technologies. 1. 1–6. 5 indexed citations

19.

Wirth, Gilson, et al.. (2007). Impact of Noise on Trim Circuits for Bandgap Voltage References. 775–778. 5 indexed citations

20.

Vieira, Michele O., et al.. (2005). Evaluating fault coverage of bulk built-in current sensor for soft errors in combinational and sequential logic. 62–62. 18 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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