G. C. Schwartz
- Electrical and Electronic Engineering top 10%
- Materials Chemistry
- Electronic, Optical and Magnetic Materials
- Computational Mechanics top 10%
- Mechanics of Materials top 10%
- Co-authors
- Philipp SchaibleReese E. JonesJ. S. LoganJ. L. MauerW. PatrickWen‐Yaung LeeJ. M. EldridgeR. Carruthers
- Topics
- Semiconductor materials and devices (15 papers)Copper Interconnects and Reliability (14 papers)Anodic Oxide Films and Nanostructures (7 papers)
- Cited by
- Electronic, Optical and Magnetic MaterialsElectrical and Electronic EngineeringComputational Mechanics
- Partner nations
- United States
In The Last Decade
G. C. Schwartz
25 papers receiving 485 citations
Peers
Comparison fields: 5 of 41
- Electrical and Electronic Engineering 402
- Materials Chemistry 192
- Electronic, Optical and Magnetic Materials 142
- Computational Mechanics 132
- Mechanics of Materials 109
Countries citing papers authored by G. C. Schwartz
This map shows the geographic impact of G. C. Schwartz's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by G. C. Schwartz with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites G. C. Schwartz more than expected).
Fields of papers citing papers by G. C. Schwartz
This network shows the impact of papers produced by G. C. Schwartz. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by G. C. Schwartz. The network helps show where G. C. Schwartz may publish in the future.
Co-authorship network of co-authors of G. C. Schwartz
This figure shows the co-authorship network connecting the top 25 collaborators of G. C. Schwartz. A scholar is included among the top collaborators of G. C. Schwartz based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with G. C. Schwartz. G. C. Schwartz is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 9 | |
| 2 | 9 | |
| 3 | 53 | |
| 4 | 3 | |
| 5 | Proceedings of the eighth symposium on plasma processing | 39 |
| 6 | 0 | |
| 7 | 14 | |
| 8 | 60 | |
| 9 | 1 | |
| 10 | 35 | |
| 11 | 3 | |
| 12 | 71 | |
| 13 | 34 | |
| 14 | 1 | |
| 15 | 77 | |
| 16 | 1 | |
| 17 | 11 | |
| 18 | 34 | |
| 19 | 24 | |
| 20 | 32 |
About G. C. Schwartz
G. C. Schwartz is a scholar working on Electronic, Optical and Magnetic Materials, Electrical and Electronic Engineering and Surfaces, Coatings and Films, having authored 26 papers that have together received 535 indexed citations. Recurring topics across this work include Semiconductor materials and devices (15 papers), Copper Interconnects and Reliability (14 papers) and Anodic Oxide Films and Nanostructures (7 papers). The work is most often cited by research in Electronic, Optical and Magnetic Materials (142 citations), Electrical and Electronic Engineering (402 citations) and Computational Mechanics (132 citations). G. C. Schwartz has collaborated with scholars based in United States. Frequent co-authors include Philipp Schaible, Reese E. Jones, J. S. Logan, J. L. Mauer, W. Patrick, Wen‐Yaung Lee, J. M. Eldridge, R. Carruthers, L. I. Maissel and J. Chapple-Sokol. Their work appears in journals such as Journal of Applied Physics, Journal of The Electrochemical Society and Thin Solid Films.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.