E. Franke

444 total citations
13 papers, 361 citations indexed

About

E. Franke is a scholar working on Materials Chemistry, Electrical and Electronic Engineering and Condensed Matter Physics. According to data from OpenAlex, E. Franke has authored 13 papers receiving a total of 361 indexed citations (citations by other indexed papers that have themselves been cited), including 8 papers in Materials Chemistry, 7 papers in Electrical and Electronic Engineering and 3 papers in Condensed Matter Physics. Recurrent topics in E. Franke's work include Boron and Carbon Nanomaterials Research (3 papers), Semiconductor materials and devices (3 papers) and GaN-based semiconductor devices and materials (3 papers). E. Franke is often cited by papers focused on Boron and Carbon Nanomaterials Research (3 papers), Semiconductor materials and devices (3 papers) and GaN-based semiconductor devices and materials (3 papers). E. Franke collaborates with scholars based in Germany and United States. E. Franke's co-authors include M. Schubert, John A. Woollam, H. Neumann, Chris Trimble, J. Hahn, Michael J. DeVries, Frank Richter, B. Rheinländer, Frank Frost and Yan Li and has published in prestigious journals such as Physical review. B, Condensed matter, Applied Physics Letters and Journal of Applied Physics.

In The Last Decade

E. Franke

13 papers receiving 349 citations

Peers

E. Franke

EEE

AMPO

EOMM

F. Pierre France

Shoji Den Japan

А. А. Ситникова Russia

E. G. Wang China

Si Kyung Choi South Korea

Toshiharu Suzuki Japan

Katsumi Yoneda Japan

Naokichi Hosokawa Japan

Marc Chason United States

Sylvain Tricot France

F. Pierre France

E. Franke

214 ×1.1

EEE

183 ×1.0

151 ×2.0

AMPO

83 ×1.2

EOMM

33 ×0.5

Citations per year, relative to E. Franke E. Franke (= 1×) peers F. Pierre

Countries citing papers authored by E. Franke

Since Specialization

Citations

This map shows the geographic impact of E. Franke's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by E. Franke with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites E. Franke more than expected).

Fields of papers citing papers by E. Franke

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by E. Franke. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by E. Franke. The network helps show where E. Franke may publish in the future.

Co-authorship network of co-authors of E. Franke

This figure shows the co-authorship network connecting the top 25 collaborators of E. Franke. A scholar is included among the top collaborators of E. Franke based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with E. Franke. E. Franke is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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13 of 13 papers shown

Li, Yan, John A. Woollam, & E. Franke. (2002). Oxygen plasma effects on optical properties of ZnSe films. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 20(3). 693–701. 17 indexed citations

Franke, E., H. Neumann, M. Schubert, et al.. (2002). Low-orbit-environment protective coating for all-solid-state electrochromic surface heat radiation control devices. Surface and Coatings Technology. 151-152. 285–288. 31 indexed citations

Franke, E., M. Schubert, Chris Trimble, Michael J. DeVries, & John A. Woollam. (2001). Optical properties of amorphous and polycrystalline tantalum oxide thin films measured by spectroscopic ellipsometry from 0.03 to 8.5 eV. Thin Solid Films. 388(1-2). 283–289. 28 indexed citations

Franke, E., M. Schubert, John A. Woollam, et al.. (2000). In situ ellipsometry growth characterization of dual ion beam deposited boron nitride thin films. Journal of Applied Physics. 87(5). 2593–2599. 17 indexed citations

Franke, E., Chris Trimble, Michael J. DeVries, et al.. (2000). Dielectric function of amorphous tantalum oxide from the far infrared to the deep ultraviolet spectral region measured by spectroscopic ellipsometry. Journal of Applied Physics. 88(9). 5166–5174. 76 indexed citations

Schubert, M., E. Franke, H. Neumann, et al.. (1998). Optical investigations of mixed-phase boron nitride thin films by infrared spectroscopic ellipsometry. Thin Solid Films. 313-314. 692–696. 7 indexed citations

Franke, E., M. Schubert, H. Neumann, et al.. (1998). In situ infrared and visible-light ellipsometric investigations of boron nitride thin films at elevated temperatures. Journal of Applied Physics. 84(1). 526–532. 15 indexed citations

Schubert, M., B. Rheinländer, E. Franke, et al.. (1997). Anisotropy of boron nitride thin-film reflectivity spectra by generalized ellipsometry. Applied Physics Letters. 70(14). 1819–1821. 52 indexed citations

Franke, E., H. Neumann, M. Schubert, et al.. (1997). Infrared ellipsometry on hexagonal and cubic boron nitride thin films. Applied Physics Letters. 70(13). 1668–1670. 13 indexed citations

10.

Schubert, M., B. Rheinländer, E. Franke, et al.. (1997). Infrared optical properties of mixed-phase thin films studied by spectroscopic ellipsometry using boron nitride as an example. Physical review. B, Condensed matter. 56(20). 13306–13313. 48 indexed citations

11.

Franke, E., et al.. (1997). Particle energy and angle distributions in ion beam sputtering. Surface and Coatings Technology. 97(1-3). 90–96. 25 indexed citations

12.

Franke, E., M. Schubert, H. Neumann, et al.. (1997). Phase and microstructure investigations of boron nitride thin films by spectroscopic ellipsometry in the visible and infrared spectral range. Journal of Applied Physics. 82(6). 2906–2911. 20 indexed citations

13.

Schubert, M., et al.. (1996). Direct-gap reduction and valence-band splitting of ordered indirect-gap AlInP2studied by dark-field spectroscopy. Physical review. B, Condensed matter. 54(24). 17616–17619. 12 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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