Alan Righter
Impact in
- Hardware and Architecture top 2%
- VLSI and Analog Circuit Testing
-
- Integrated Circuits and Semiconductor Failure Analysis
- Electrostatic Discharge in Electronics
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Electromagnetic Compatibility and Noise Suppression
- Radiation Effects in Electronics
- Low-power high-performance VLSI design
Papers in
-
- Electrostatic Discharge in Electronics 15
- Integrated Circuits and Semiconductor Failure Analysis 15
- Semiconductor materials and devices 7
- Electromagnetic Compatibility and Noise Suppression 5
- Advancements in Semiconductor Devices and Circuit Design 3
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- VLSI and Analog Circuit Testing 6
- Physical Unclonable Functions (PUFs) and Hardware Security 2
- Co-authors
- C.F. Hawkins (5 shared papers)J.M. Soden (5 shared papers)F.J. Ferguson (3 shared papers)Jean-Jacques Hajjar (7 shared papers)Javier A. Salcedo (4 shared papers)Yuanzhong Zhou (2 shared papers)Alexander P. Maxwell (1 shared paper)J. L. Edwards (1 shared paper)
- Journals
- IEEE Electron Device Letters (1 paper)Journal of The Electrochemical Society (1 paper)Microelectronics Reliability (1 paper)International Test Conference (3 papers)Fraunhofer-Publica (Fraunhofer-Gesellschaft) (1 paper)
- Partner nations
- United StatesGermanyUnited Kingdom
In The Last Decade
Alan Righter
24 papers receiving 409 citations
Peers
Comparison fields: 5 of 15
- Hardware and Architecture 287
- Electrical and Electronic Engineering 426
- Software 5
- Industrial and Manufacturing Engineering 9
- Control and Systems Engineering 19
Countries citing papers authored by Alan Righter
This map shows the geographic impact of Alan Righter's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Alan Righter with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Alan Righter more than expected).
Fields of papers citing papers by Alan Righter
This network shows the impact of papers produced by Alan Righter. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Alan Righter. The network helps show where Alan Righter may publish in the future.
Co-authors
The 23 scholars most cited alongside Alan Righter, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 24 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2002 | 135 | |
| 2 | Defect Classes - An Overdue Paradigm for CMOS IC | 1994 | 56 |
| 3 | 2007 | 34 | |
| 4 | A General Purpose IDDQ Measurement Circuit | 1993 | 29 |
| 5 | 2002 | 29 | |
| 6 | CDM ESD current characterization — Package variability effects and comparison to die-level CDM | 2009 | 25 |
| 7 | Real-world charged board model (CBM) failures | 2003 | 21 |
| 8 | 2002 | 18 | |
| 9 | 2002 | 15 | |
| 10 | 2002 | 14 | |
| 11 | 1984 | 12 | |
| 12 | 2008 | 9 | |
| 13 | A new ESD model: The Charged Strip Model | 2002 | 8 |
| 14 | A new ESD design methodology for high voltage DMOS applications | 2010 | 6 |
| 15 | 2011 | 5 | |
| 16 | 2013 | 4 | |
| 17 | 2004 | 3 | |
| 18 | 1995 IEEE International Test Conference Proceedings | 1995 | 2 |
| 19 | Progress towards a joint ESDA/JEDEC CDM standard: Methods, experiments, and results | 2012 | 2 |
| 20 | Activities towards a new transient latch-up standard | 2013 | 2 |
About Alan Righter
Alan Righter is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Electronic, Optical and Magnetic Materials, Control and Systems Engineering and Materials Chemistry, having authored 24 papers that have together received 433 indexed citations. Recurring topics across this work include Electrostatic Discharge in Electronics (15 papers), Integrated Circuits and Semiconductor Failure Analysis (15 papers), Semiconductor materials and devices (7 papers), VLSI and Analog Circuit Testing (6 papers), Electromagnetic Compatibility and Noise Suppression (5 papers), Advancements in Semiconductor Devices and Circuit Design (3 papers), Physical Unclonable Functions (PUFs) and Hardware Security (2 papers) and Copper Interconnects and Reliability (2 papers). The work is most often cited by research in Hardware and Architecture (287 citations), Electrical and Electronic Engineering (426 citations), Software (5 citations), Industrial and Manufacturing Engineering (9 citations) and Control and Systems Engineering (19 citations). Alan Righter has collaborated with scholars based in United States, Germany and United Kingdom. Frequent co-authors include C.F. Hawkins, J.M. Soden, F.J. Ferguson, Jean-Jacques Hajjar, Javier A. Salcedo, Yuanzhong Zhou, Alexander P. Maxwell, J. L. Edwards, Juin J. Liou and Slavica Malobabic. Their work appears in journals such as IEEE Electron Device Letters, Journal of The Electrochemical Society, Microelectronics Reliability, International Test Conference and Fraunhofer-Publica (Fraunhofer-Gesellschaft).
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.