Alan Righter

587 total citations
24 papers, 433 citations indexed

About

Alan Righter is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Electronic, Optical and Magnetic Materials. According to data from OpenAlex, Alan Righter has authored 24 papers receiving a total of 433 indexed citations (citations by other indexed papers that have themselves been cited), including 21 papers in Electrical and Electronic Engineering, 7 papers in Hardware and Architecture and 2 papers in Electronic, Optical and Magnetic Materials. Recurrent topics in Alan Righter's work include Integrated Circuits and Semiconductor Failure Analysis (15 papers), Electrostatic Discharge in Electronics (15 papers) and Semiconductor materials and devices (7 papers). Alan Righter is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (15 papers), Electrostatic Discharge in Electronics (15 papers) and Semiconductor materials and devices (7 papers). Alan Righter collaborates with scholars based in United States, Germany and United Kingdom. Alan Righter's co-authors include C.F. Hawkins, J.M. Soden, F.J. Ferguson, Jean-Jacques Hajjar, Javier A. Salcedo, Yuanzhong Zhou, Alexander P. Maxwell, J. L. Edwards, R. J. Roedel and Juin J. Liou and has published in prestigious journals such as Journal of The Electrochemical Society, IEEE Electron Device Letters and Microelectronics Reliability.

In The Last Decade

Alan Righter

24 papers receiving 409 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
Alan Righter United States	11	426	287	19	11	9	24	433
W. Needham United States	7	355 0.8×	326 1.1×	30 1.6×	3 0.3×	3 0.3×	9	371
Yuzo Takamatsu Japan	10	300 0.7×	292 1.0×	36 1.9×	13 1.2×	8 0.9×	66	324
N.V. Arvind India	6	391 0.9×	350 1.2×	30 1.6×	22 2.0×	1 0.1×	10	395
Yi-Shing Chang United States	11	341 0.8×	232 0.8×	7 0.4×	28 2.5×	3 0.3×	28	351
A.K. Majhi Netherlands	10	348 0.8×	336 1.2×	10 0.5×	8 0.7×	1 0.1×	17	353
R.K. Treece United States	9	252 0.6×	163 0.6×	8 0.4×	3 0.3×	4 0.4×	16	259
Rajkumar Sankaralingam United States	7	613 1.4×	577 2.0×	92 4.8×	2 0.2×	15 1.7×	16	620
E. Hamdy United States	10	286 0.7×	101 0.4×	7 0.4×	28 2.5×	9 1.0×	34	305
D. Overhauser United States	10	289 0.7×	119 0.4×	5 0.3×	28 2.5×	4 0.4×	20	304
A. Pavlov Canada	8	300 0.7×	129 0.4×	3 0.2×	5 0.5×	5 0.6×	13	319

Countries citing papers authored by Alan Righter

Since Specialization

Citations

This map shows the geographic impact of Alan Righter's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Alan Righter with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Alan Righter more than expected).

Fields of papers citing papers by Alan Righter

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Alan Righter. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Alan Righter. The network helps show where Alan Righter may publish in the future.

Co-authorship network of co-authors of Alan Righter

This figure shows the co-authorship network connecting the top 25 collaborators of Alan Righter. A scholar is included among the top collaborators of Alan Righter based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Alan Righter. Alan Righter is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Righter, Alan, et al.. (2016). JS-002 module and product CDM result comparison to JEDEC and ESDA CDM methods. Fraunhofer-Publica (Fraunhofer-Gesellschaft). 1–7. 1 indexed citations

Righter, Alan, et al.. (2014). Non-EOS root causes of EOS-like damage. Electrical Overstress/Electrostatic Discharge Symposium. 1–6. 1 indexed citations

Zhou, Yuanzhong, Alan Righter, & Jean-Jacques Hajjar. (2013). Investigation on effectiveness of series gate resistor in CDM ESD protection designs. 1–4. 4 indexed citations

Stadler, Wolfgang, R.A. Ashton, K. Domański, et al.. (2013). Activities towards a new transient latch-up standard. 1–10. 2 indexed citations

Hajjar, Jean-Jacques, et al.. (2013). Failure analysis considerations in designing for EOS/ESD robustness. 67–71. 1 indexed citations

Righter, Alan, T. L. Welsher, Marcel Dekker, et al.. (2012). Progress towards a joint ESDA/JEDEC CDM standard: Methods, experiments, and results. 10–10. 2 indexed citations

Malobabic, Slavica, Javier A. Salcedo, Alan Righter, Jean-Jacques Hajjar, & Juin J. Liou. (2011). Correlation of Human Metal Model and Transmission Line Pulsing Testing. IEEE Electron Device Letters. 32(9). 1200–1202. 5 indexed citations

Malobabic, Slavica, Javier A. Salcedo, Alan Righter, Jean-Jacques Hajjar, & Juin J. Liou. (2010). A new ESD design methodology for high voltage DMOS applications. Journal of International Crisis and Risk Communication Research. 1–10. 6 indexed citations

Righter, Alan, et al.. (2009). CDM ESD current characterization — Package variability effects and comparison to die-level CDM. 1–10. 25 indexed citations

10.

Salcedo, Javier A., Haiyang Zhu, Alan Righter, & Jean-Jacques Hajjar. (2008). Electrostatic discharge protection framework for mixed-signal high voltage CMOS applications. 329–332. 9 indexed citations

11.

Righter, Alan, et al.. (2004). Real-world printed circuit board ESD failures. Microelectronics Reliability. 45(2). 287–295. 3 indexed citations

12.

Righter, Alan, et al.. (2003). Real-world charged board model (CBM) failures. Electrical Overstress/Electrostatic Discharge Symposium. 1–10. 21 indexed citations

13.

Righter, Alan, et al.. (2002). A new ESD model: The Charged Strip Model. Electrical Overstress/Electrostatic Discharge Symposium. 163–177. 8 indexed citations

14.

Righter, Alan, et al.. (2002). High resolution I/sub DDQ/ characterization and testing-practical issues. 259–268. 15 indexed citations

15.

Righter, Alan, et al.. (2002). i/sub DD/ pulse response testing applied to complex CMOS ICs. 32–39. 14 indexed citations

16.

Righter, Alan, C.F. Hawkins, J.M. Soden, & Alexander P. Maxwell. (2002). CMOS IC reliability indicators and burn-in economics. 194–203. 29 indexed citations

17.

Righter, Alan, et al.. (2002). A general purpose I/sub DDQ/ measurement circuit. 642–651. 18 indexed citations

18.

Soden, J.M., et al.. (1995). 1995 IEEE International Test Conference Proceedings. International Test Conference. 1002–1002. 2 indexed citations

19.

Hawkins, C.F., J.M. Soden, Alan Righter, & F.J. Ferguson. (1994). Defect Classes - An Overdue Paradigm for CMOS IC. International Test Conference. 413–425. 56 indexed citations

20.

Righter, Alan, et al.. (1993). A General Purpose IDDQ Measurement Circuit. International Test Conference. 642–651. 29 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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