Armin Liero
- Electrical and Electronic Engineering top 10%
- Atomic and Molecular Physics, and Optics top 10%
- Condensed Matter Physics top 10%
- Instrumentation top 10%
- Spectroscopy
- Topics
- Advanced Fiber Laser Technologies (21 papers)Semiconductor Lasers and Optical Devices (18 papers)GaN-based semiconductor devices and materials (17 papers)
- Partner nations
- GermanyUnited StatesVietnam
In The Last Decade
Armin Liero
56 papers receiving 487 citations
Peers
Comparison fields: 5 of 31
- Electrical and Electronic Engineering 468
- Atomic and Molecular Physics, and Optics 325
- Condensed Matter Physics 129
- Instrumentation 74
- Spectroscopy 34
Countries citing papers authored by Armin Liero
This map shows the geographic impact of Armin Liero's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Armin Liero with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Armin Liero more than expected).
Fields of papers citing papers by Armin Liero
This network shows the impact of papers produced by Armin Liero. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Armin Liero. The network helps show where Armin Liero may publish in the future.
Co-authorship network of co-authors of Armin Liero
This figure shows the co-authorship network connecting the top 25 collaborators of Armin Liero. A scholar is included among the top collaborators of Armin Liero based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Armin Liero. Armin Liero is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 1 | |
| 2 | 1 | |
| 3 | 2 | |
| 4 | 2 | |
| 5 | 2 | |
| 6 | 3 | |
| 7 | 4 | |
| 8 | 2 | |
| 9 | 18 | |
| 10 | 3 | |
| 11 | 44 | |
| 12 | 2 | |
| 13 | Nanosecond high-current pulsed operation of ridge-waveguide lasers | 3 |
| 14 | Enabling GaN high speed devices: Microwave meets power electronics - And vice versa | 3 |
| 15 | 14 | |
| 16 | Highly linear broadband GaN-based low-noise amplifier | 9 |
| 17 | 67 | |
| 18 | 34 | |
| 19 | 1 | |
| 20 | RF-Measurements of Packaged Broadband Power Transistors | 1 |
About Armin Liero
Armin Liero is a scholar working on Condensed Matter Physics, Instrumentation and Atomic and Molecular Physics, and Optics, having authored 57 papers that have together received 520 indexed citations. Recurring topics across this work include Advanced Fiber Laser Technologies (21 papers), Semiconductor Lasers and Optical Devices (18 papers) and GaN-based semiconductor devices and materials (17 papers). The work is most often cited by research in Instrumentation (74 citations), Condensed Matter Physics (129 citations) and Atomic and Molecular Physics, and Optics (325 citations). Armin Liero has collaborated with scholars based in Germany, United States and Vietnam. Frequent co-authors include A. Klehr, H. Wenzel, W. Heinrich, G. Erbert, G. Tränkle, J. Fricke, Matthias Rudolph, Andrea Knigge, S. Schwertfeger and R. Lossy. Their work appears in journals such as Optics Letters, Optics Express and IEEE Transactions on Microwave Theory and Techniques.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.