Akinobu Teramoto
About
In The Last Decade
Akinobu Teramoto
304 papers receiving 2.6k citations
Peers
Comparison fields: 5 of 73
- Electrical and Electronic Engineering 2.3k
- Materials Chemistry 568
- Electronic, Optical and Magnetic Materials 412
- Atomic and Molecular Physics, and Optics 305
- Biomedical Engineering 297
Countries citing papers authored by Akinobu Teramoto
This map shows the geographic impact of Akinobu Teramoto's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Akinobu Teramoto with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Akinobu Teramoto more than expected).
Fields of papers citing papers by Akinobu Teramoto
This network shows the impact of papers produced by Akinobu Teramoto. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Akinobu Teramoto. The network helps show where Akinobu Teramoto may publish in the future.
Co-authorship network of co-authors of Akinobu Teramoto
This figure shows the co-authorship network connecting the top 25 collaborators of Akinobu Teramoto. A scholar is included among the top collaborators of Akinobu Teramoto based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Akinobu Teramoto. Akinobu Teramoto is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 1 | |
| 2 | 2 | |
| 3 | 1 | |
| 4 | 1 | |
| 5 | 1 | |
| 6 | 5 | |
| 7 | Analysis of Random Telegraph Noise Behaviors toward Changes of Source Follower Transistor Operation Conditions using High Accuracy Array Test Circuit | 2 |
| 8 | High Quality SiO | 10 |
| 9 | 19 | |
| 10 | 7 | |
| 11 | 14 | |
| 12 | The data analysis technique of the atomic force microscopy for the atomically flat silicon surface | 2 |
| 13 | The data analysis technique of the atomic force microscopy for the atomically flat silicon surface(Session9A: Silicon Devices IV) | 3 |
| 14 | 窒素-水素ラジカルを用いて形成した窒化ケイ素膜とSi 3 N 4 /Si界面の構造に関する角度分解光電子研究 | 1 |
| 15 | 1 | |
| 16 | 4 | |
| 17 | Development of NBTI Lifetime Prediction Method and Evaluation Method using Hole Injection Technique | 1 |
| 18 | Characterization of Extrinsic Oxide Breakdown on Thin Dielectric Oxide | 1 |
| 19 | Excess currents induced by hot-hole injection and F-N stress in thin SiO2 films | 4 |
| 20 | Area and thickness dependence of the TDDB characteristics of silicon dioxides | 2 |
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.