Akinobu Teramoto

3.3k total citations
318 papers, 2.6k citations indexed

About

Akinobu Teramoto is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Electronic, Optical and Magnetic Materials. According to data from OpenAlex, Akinobu Teramoto has authored 318 papers receiving a total of 2.6k indexed citations (citations by other indexed papers that have themselves been cited), including 281 papers in Electrical and Electronic Engineering, 62 papers in Materials Chemistry and 50 papers in Electronic, Optical and Magnetic Materials. Recurrent topics in Akinobu Teramoto's work include Semiconductor materials and devices (221 papers), Advancements in Semiconductor Devices and Circuit Design (143 papers) and Integrated Circuits and Semiconductor Failure Analysis (95 papers). Akinobu Teramoto is often cited by papers focused on Semiconductor materials and devices (221 papers), Advancements in Semiconductor Devices and Circuit Design (143 papers) and Integrated Circuits and Semiconductor Failure Analysis (95 papers). Akinobu Teramoto collaborates with scholars based in Japan, United States and Canada. Akinobu Teramoto's co-authors include Tadahiro Ohmi, Shigetoshi Sugawa, T. Ohmi, Rihito Kuroda, Masaki Hirayama, Tomoyuki Suwa, K. Kobayashi, Kazuhiko Kotani, S. Sugawa and M. Miyashita and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Journal of The Electrochemical Society.

In The Last Decade

Akinobu Teramoto

304 papers receiving 2.6k citations

Peers

Akinobu Teramoto

EEE

EOMM

AMPO

Tanemasa Asano Japan

Jean‐Luc Autran France

Yukinori Morita Japan

Nibir K. Dhar United States

T. S. Sudarshan United States

Dieter Mergel Germany

Tsung Sheng Kao Taiwan

Jia‐Min Shieh Taiwan

Shichang Zou China

L. Di Cioccio France

Tanemasa Asano Japan

Akinobu Teramoto

1.7k ×0.8

EEE

750 ×1.3

218 ×0.5

EOMM

637 ×2.1

AMPO

510 ×1.7

Citations per year, relative to Akinobu Teramoto Akinobu Teramoto (= 1×) peers Tanemasa Asano

Countries citing papers authored by Akinobu Teramoto

Since Specialization

Citations

This map shows the geographic impact of Akinobu Teramoto's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Akinobu Teramoto with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Akinobu Teramoto more than expected).

Fields of papers citing papers by Akinobu Teramoto

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Akinobu Teramoto. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Akinobu Teramoto. The network helps show where Akinobu Teramoto may publish in the future.

Co-authorship network of co-authors of Akinobu Teramoto

This figure shows the co-authorship network connecting the top 25 collaborators of Akinobu Teramoto. A scholar is included among the top collaborators of Akinobu Teramoto based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Akinobu Teramoto. Akinobu Teramoto is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

Sort: Min cites: Since: Top N: Style:

20 of 20 papers shown

Sugawa, Shigetoshi, et al.. (2024). High‐speed and contactless inspection of defective micro‐LEDs through the photovoltaic effect. Journal of the Society for Information Display. 32(12). 825–835. 1 indexed citations

Komeda, Tadahiro, et al.. (2024). Interface analysis of oxide free MoS2 films fabricated by solution process. Scientific Reports. 14(1). 26779–26779. 2 indexed citations

Teramoto, Akinobu, et al.. (2023). Switching Characteristics of MgO Based MTJ with Intermediate State. 1 indexed citations

Suzuki, Hayato, et al.. (2021). A high-precision current measurement platform applied for statistical measurement of discharge current transient spectroscopy of traps in SiN dielectrics. Japanese Journal of Applied Physics. 60(8). 86501–86501. 1 indexed citations

Kuroda, Rihito, et al.. (2020). A high-precision 1 Ω–10 MΩ range resistance measurement platform for statistical evaluation of emerging memory materials. Japanese Journal of Applied Physics. 59(SG). SGGL03–SGGL03. 1 indexed citations

Teramoto, Akinobu, et al.. (2019). Impact of CoFeB surface roughness on reliability of MgO films in CoFeB/MgO/CoFeB magnetic tunnel junction. Japanese Journal of Applied Physics. 58(SI). SIIB29–SIIB29. 5 indexed citations

Teramoto, Akinobu, et al.. (2017). Analysis of Random Telegraph Noise Behaviors toward Changes of Source Follower Transistor Operation Conditions using High Accuracy Array Test Circuit. IEICE Technical Report; IEICE Tech. Rep.. 117(260). 57–62. 2 indexed citations

Kambayashi, Hiroshi, et al.. (2013). High Quality SiO. Japanese Journal of Applied Physics. 52(4). 10 indexed citations

Yonezawa, Akiyoshi, et al.. (2013). The study of time constant analysis in random telegraph noise at the subthreshold voltage region. XT.11.1–XT.11.6. 19 indexed citations

10.

Teramoto, Akinobu, et al.. (2011). Analysis of the Low-Frequency Noise Reduction in Si(100) Metal–Oxide–Semiconductor Field-Effect Transistors. Japanese Journal of Applied Physics. 50(4S). 04DC01–04DC01. 7 indexed citations

11.

Ishitsuka, M., et al.. (2009). The electric properties of low-magnetic-loss magnetic composites containing Zn–Ni–Fe particles. Journal of Physics Condensed Matter. 21(43). 436009–436009. 14 indexed citations

12.

Teramoto, Akinobu, et al.. (2008). The data analysis technique of the atomic force microscopy for the atomically flat silicon surface. 108(122). 265–269. 2 indexed citations

13.

Teramoto, Akinobu, et al.. (2008). The data analysis technique of the atomic force microscopy for the atomically flat silicon surface(Session9A: Silicon Devices IV). 108(121). 265–269. 3 indexed citations

14.

Sugawa, Shigetoshi, et al.. (2008). 窒素-水素ラジカルを用いて形成した窒化ケイ素膜とSi 3 N 4 /Si界面の構造に関する角度分解光電子研究. Journal of Applied Physics. 104(11). 114112. 1 indexed citations

15.

Yamashita, Satoru, Yasuyuki Shirai, Masaki Hirayama, et al.. (2007). Development of Microwave-Excited Plasma-Enhanced Metal–Organic Chemical Vapor Deposition System for Forming Ferroelectric Sr₂(Ta_1-x,Nb_x)₂O₇ Thin Film on Amorphous SiO₂. Japanese Journal of Applied Physics. 46(4S). 2200–2200. 1 indexed citations

16.

Kuroda, Rihito, et al.. (2006). Circuit level prediction of device performance degradation due to negative bias temperature stress. Microelectronics Reliability. 47(6). 930–936. 4 indexed citations

17.

Teramoto, Akinobu, et al.. (2005). Development of NBTI Lifetime Prediction Method and Evaluation Method using Hole Injection Technique. IEICE technical report. Speech. 105(436). 13–18. 1 indexed citations

18.

Teramoto, Akinobu, et al.. (1999). Characterization of Extrinsic Oxide Breakdown on Thin Dielectric Oxide. IEICE Transactions on Electronics. 82(4). 589–592. 1 indexed citations

19.

Teramoto, Akinobu, et al.. (1996). Excess currents induced by hot-hole injection and F-N stress in thin SiO2 films. 113–116. 4 indexed citations

20.

Teramoto, Akinobu, K. Kobayashi, & Makoto Hirayama. (1994). Area and thickness dependence of the TDDB characteristics of silicon dioxides. 94(180). 29–34. 2 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact