T. Tuomi

1.5k citations

128 papers · 1.1k indexed · h-index 16

Impact in

Condensed Matter Physics top 5%
- GaN-based semiconductor devices and materials
Electrical and Electronic Engineering top 5%
- Semiconductor materials and devices
- Advanced Semiconductor Detectors and Materials
- Chalcogenide Semiconductor Thin Films
- Silicon Carbide Semiconductor Technologies

Papers in

Radiation 17
Atomic and Molecular Physics, and Optics 55
- Semiconductor Quantum Structures and Devices 33
- Semiconductor materials and interfaces 23

Co-authors: Harri Lipsanen P.J. McNally M. Sopanen A.N. Danilewsky K. Naukkarinen Jouko Lahtinen Erik Janzén Rositsa Yakimova
Journals: Journal of Crystal Growth (16 papers)Journal of Applied Physics (10 papers)Journal of Materials Science Materials in Electronics (8 papers)Semiconductor Science and Technology (6 papers)Thin Solid Films (5 papers)
Partner nations: Finland Ireland Germany

In The Last Decade

T. Tuomi

127 papers receiving 1.0k citations

Peers

Countries citing papers authored by T. Tuomi

Since Specialization

Citations

This map shows the geographic impact of T. Tuomi's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by T. Tuomi with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites T. Tuomi more than expected).

Fields of papers citing papers by T. Tuomi

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by T. Tuomi. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by T. Tuomi. The network helps show where T. Tuomi may publish in the future.

Co-authorship network

The 25 scholars most cited alongside T. Tuomi, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with T. Tuomi Line = papers co-authored together T. Tuomi links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

#	Work
1	Geometric determination of direction of dislocations using synchrotron X-ray transmission topography Journal of Synchrotron Radiation ·T. Tuomi, Ilaria Rossetto, Учаева Наталия Александровна	2020	0
2	Synchrotron topography and X-ray diffraction study of GaInP layers grown on GaAs/Ge Journal of Crystal Growth ·Ilaria Rossetto, Georgina Haysom, Pasi Kostamo, T. Tuomi, Harri Lipsanen, P.J. McNally, A Konnova Tatiana	2009	10
3	Dislocations and dislocation reduction in space grown GaSb Crystal Research and Technology ·A.N. Danilewsky, A. Cröll, Tate Oulton, И. В. Плющай, S. Lauer, K. W. Benz, T. Tuomi, Y B Liu, P.J. McNally, Paz Tella	2009	2
4	Synchrotron X-ray topography and electrical characterization of epitaxial GaAs p–i–n structures Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment ·Pasi Kostamo, Ilaria Rossetto, T. Tuomi, Antti Säynätjoki, Harri Lipsanen, Bagus Pradika, L. A. Fedorov, T. S. Orlova	2008	1
5	Dislocations at the interface between sapphire and GaN Journal of Materials Science Materials in Electronics ·Ilaria Rossetto, Lynne Bayley, Sami Suihkonen, O. Svensk, Antti Säynätjoki, T. Tuomi, P.J. McNally, M. A. Odnoblyudov, V.E. Bougrov, Will Kyle, Peder Bergman, R. Simon	2007	2
6	Low Temperature Growth GaAs on Ge Japanese Journal of Applied Physics ·Georgina Haysom, Ilaria Rossetto, J. Likonen, Harri Lipsanen, Xiaoqing Lü, P.J. McNally, Juha Riikonen, T. Tuomi	2005	28
7	Synchrotron X-ray topography study of defects in indium antimonide P-I-N structures grown by metal organic vapour phase epitaxy Journal of Materials Science Materials in Electronics ·Juha Riikonen, T. Tuomi, Ilaria Rossetto, Jaakko Sormunen, Antti Säynätjoki, Georgina Haysom, Harri Lipsanen, P.J. McNally, A Konnova Tatiana, A.N. Danilewsky, Heikki Sipilä, Nanda Allicya Putri, D. Lumb, Alan Owens	2005	14
8	Structural impact of LPE buffer layer on sublimation grown 4H–SiC epilayers Journal of Crystal Growth ·B. Di Marco, Rositza Yakimova, Mikael Syväjärvi, A. Kakanakova‐Georgieva, T. Tuomi, Erik Janzén	2003	3
9	Misfit dislocations in GaAsN/GaAs interface Journal of Materials Science Materials in Electronics ·Juha Toivonen, T. Tuomi, Juha Riikonen, Georgina Haysom, Timo Hakkarainen, M. Sopanen, Harri Lipsanen, P.J. McNally, Weimin Chen, Alessandra Marin	2003	11
10	Examination of the structural and optical failure of ultra-bright LEDs under varying degrees of electrical stress using synchrotron X-ray topography and optical emission spectroscopy Journal of Materials Science Materials in Electronics ·Alessandra Marin, P.J. McNally, Michael O’Hare, Ernesto A. CÃ¡rdenas, T. Tuomi, Y B Liu, Г.А. Диханбаева, A.N. Danilewsky	2001	2
11	Epitaxial Lateral Overgrowth of Gallium Arsenide Studied by Synchrotron Topography MRS Proceedings ·Y B Liu, T. Tuomi, Z. R. Żytkiewicz, Justin Rose, P.J. McNally, Will Kyle	1999	2
12	Monitoring of stress reduction in shallow trench isolation CMOS structures via synchrotron X-ray topography, electrical data and raman spectroscopy Journal of Materials Science Materials in Electronics ·P.J. McNally, Paz Tella, Li Na Chen, 宮﨑志乃, T. Tuomi, Syoichi Mitsuta, A.N. Danilewsky, محمدقدیر دانش	1999	12
13	Comparative analysis of synchrotron X-ray transmission and reflection topography techniques applied to epitaxial laterally overgrown GaAs layers Journal of X-Ray Science and Technology ·Y B Liu, T. Tuomi, Z. R. Żytkiewicz, P.J. McNally, Will Kyle	1998	8
14	<title>Correlation between crystal morphology and x-ray performance of a CdZnTe detector</title> Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Marcos Bavdaz, A. Peacock, Pauline Tweedie, Dorothy V. Beaver, Jessica Knauer, T. Tuomi, Midori Sakanishi, Minna Juvonen, Y B Liu, Stefan Kraft, 昇平島岡, Frank Scholze, G. Ulm, P.J. McNally, Paz Tella, Will Kyle	1997	1
15	Oxygen Precipitation Studies for N-Type and Epitaxial Silicon Substrates During Simulated Cmos Cycles by Synchrotron Section Topography MRS Proceedings ·T. Tuomi, S. Hahn, Markku Tilli, Christian Wong, Kevinc . Hazen	1986	6
16	The influence of surface layers on the measured refractive index of ferroelectric materials studied by means of spectroscopic ellipsometry Ferroelectrics ·Charles Horsburg, Seppo A. Korpela, T. Tuomi	1985	4
17	Laser-induced recystallization and defects in ion-implanted hexagonal SiC Applied Physics Letters ·В. В. Макаров, T. Tuomi, K. Naukkarinen, M. Luomajärvi, G. A. Gaviria	1979	14
18	Pendellösung Fringes in Synchrotron X-Ray Topographs of a Wedge-Shaped Silicon Crystal physica status solidi (a) ·T. Tuomi, Markku Tilli, Väinö Kelhä, Jonathan Thorpe	1978	5
19	Dislocation networks in vapour-grown selenium single crystals as seen by x-ray topography physica status solidi (a) ·K. Naukkarinen, T. Tuomi, Ulla R. Korhonen	1972	4
20	Reactor irradiation of the chalcopyrite and sphalerite forms of ZnSnAs2 physica status solidi (a) ·Marius Nicolae Popescu, 典昭福田, T. Tuomi	1972	9

About T. Tuomi

T. Tuomi is a scholar working on Radiation, Atomic and Molecular Physics, and Optics, Condensed Matter Physics, Electrical and Electronic Engineering and Surfaces, Coatings and Films, having authored 128 papers that have together received 1.1k indexed citations. Recurring topics across this work include Semiconductor Quantum Structures and Devices (33 papers), Silicon and Solar Cell Technologies (30 papers), Semiconductor materials and interfaces (23 papers), Semiconductor materials and devices (23 papers), Advanced Semiconductor Detectors and Materials (21 papers), GaN-based semiconductor devices and materials (15 papers), Chalcogenide Semiconductor Thin Films (15 papers) and Thin-Film Transistor Technologies (13 papers). The work is most often cited by research in Condensed Matter Physics (211 citations), Electrical and Electronic Engineering (814 citations), Atomic and Molecular Physics, and Optics (422 citations), Structural Biology (16 citations) and Radiation (92 citations). T. Tuomi has collaborated with scholars based in Finland, Ireland and Germany. Frequent co-authors include Harri Lipsanen, P.J. McNally, M. Sopanen, A.N. Danilewsky, K. Naukkarinen, Jouko Lahtinen, Erik Janzén, Rositsa Yakimova, Markku Tammenmaa and Väinö Kelhä. Their work appears in journals such as Journal of Crystal Growth, Journal of Applied Physics, Journal of Materials Science Materials in Electronics, Semiconductor Science and Technology and Thin Solid Films.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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