Markku Tilli

459 total citations
25 papers, 289 citations indexed

About

Markku Tilli is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering and Mechanical Engineering. According to data from OpenAlex, Markku Tilli has authored 25 papers receiving a total of 289 indexed citations (citations by other indexed papers that have themselves been cited), including 18 papers in Electrical and Electronic Engineering, 6 papers in Biomedical Engineering and 5 papers in Mechanical Engineering. Recurrent topics in Markku Tilli's work include Silicon and Solar Cell Technologies (10 papers), Semiconductor materials and devices (8 papers) and Microstructure and Mechanical Properties of Steels (5 papers). Markku Tilli is often cited by papers focused on Silicon and Solar Cell Technologies (10 papers), Semiconductor materials and devices (8 papers) and Microstructure and Mechanical Properties of Steels (5 papers). Markku Tilli collaborates with scholars based in Finland, Germany and United States. Markku Tilli's co-authors include Mervi Paulasto‐Kröckel, T. Tuomi, Vesa Vuorinen, Väinö Kelhä, Tor Meinander, A. Oja, Heikki Seppä, Panu Pekko, Jaakko Saarilahti and Heikki Kuisma and has published in prestigious journals such as Journal of Applied Physics, Journal of The Electrochemical Society and Thin Solid Films.

In The Last Decade

Markku Tilli

24 papers receiving 280 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Markku Tilli Finland 10 208 80 80 66 30 25 289
B. Taylor United States 12 391 1.9× 92 1.1× 98 1.2× 43 0.7× 17 0.6× 25 486
S. J. Licht United States 10 335 1.6× 195 2.4× 97 1.2× 47 0.7× 19 0.6× 22 417
M. Namkung United States 8 54 0.3× 57 0.7× 103 1.3× 89 1.3× 30 1.0× 50 256
А. А. Семенов Ukraine 9 156 0.8× 117 1.5× 151 1.9× 138 2.1× 30 1.0× 67 346
E. te Kaat Germany 10 202 1.0× 69 0.9× 107 1.3× 25 0.4× 17 0.6× 12 339
C. Arnone Italy 10 154 0.7× 76 0.9× 146 1.8× 121 1.8× 12 0.4× 29 321
W. Zierau Germany 11 67 0.3× 183 2.3× 90 1.1× 109 1.7× 37 1.2× 27 326
J. M. Blum United States 11 248 1.2× 164 2.0× 136 1.7× 65 1.0× 11 0.4× 23 368
Raegan L. Johnson‐Wilke United States 10 106 0.5× 61 0.8× 233 2.9× 119 1.8× 35 1.2× 34 351
J. Yasaitis United States 12 617 3.0× 334 4.2× 127 1.6× 210 3.2× 17 0.6× 31 693

Countries citing papers authored by Markku Tilli

Since Specialization
Citations

This map shows the geographic impact of Markku Tilli's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Markku Tilli with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Markku Tilli more than expected).

Fields of papers citing papers by Markku Tilli

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Markku Tilli. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Markku Tilli. The network helps show where Markku Tilli may publish in the future.

Co-authorship network of co-authors of Markku Tilli

This figure shows the co-authorship network connecting the top 25 collaborators of Markku Tilli. A scholar is included among the top collaborators of Markku Tilli based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Markku Tilli. Markku Tilli is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Lemettinen, Jori, Timo Sajavaara, Markku Tilli, et al.. (2019). In-situ annealing characterization of atomic-layer-deposited Al2O3 in N2, H2 and vacuum atmospheres. Thin Solid Films. 682. 147–155. 5 indexed citations
2.
Tuomi, T., Pasi Kostamo, Henri Jussila, et al.. (2016). Synchrotron X-ray diffraction topography study of bonding-induced strain in silicon-on-insulator wafers. Thin Solid Films. 603. 435–440. 1 indexed citations
3.
Mäkinen, Jari, et al.. (2013). Dopant-induced stress in microfabricated silicon devices. Journal of Applied Physics. 114(4). 12 indexed citations
4.
Tilli, Markku, et al.. (2008). Intelligent silicon substrates for a shorter microsystem design cycle. 1–3. 1 indexed citations
5.
Kyynäräinen, Jukka, Jaakko Saarilahti, H. Kattelus, et al.. (2007). 3D Micromechanical Compass. Sensor Letters. 5(1). 126–129. 8 indexed citations
6.
Kyynäräinen, Jukka, Jaakko Saarilahti, H. Kattelus, et al.. (2007). A 3D micromechanical compass. Sensors and Actuators A Physical. 142(2). 561–568. 70 indexed citations
7.
Molarius, J. M., et al.. (1997). Flow pattern defects in Czochralski-grown silicon crystals. Physica Scripta. T69. 264–267. 2 indexed citations
8.
Tilli, Markku, et al.. (1992). Metal Contamination Removal on Silicon Wafers using Dilute Acidic Solutions. Journal of The Electrochemical Society. 139(6). 1751–1756. 16 indexed citations
9.
Tilli, Markku, et al.. (1992). Effect of Chemicals on Metal Contamination on Silicon Wafers. Journal of The Electrochemical Society. 139(4). 1180–1185. 19 indexed citations
10.
Carlberg, Torbjörn, et al.. (1989). Infra-red assisted Czochralski growth of silicon crystals. Journal of Crystal Growth. 98(4). 793–800.
11.
12.
Tuomi, T., et al.. (1985). Detection of defect-free zones in annealed Czochralski silicon with synchrotron section topography. Journal of Applied Physics. 57(4). 1384–1386. 11 indexed citations
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14.
Tuomi, T., et al.. (1984). Synchrotron Section Topographic Study of the Denuded Zone Formation in Annealed Silicon. MRS Proceedings. 41. 4 indexed citations
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16.
Tuomi, T., et al.. (1979). Application of synchrotron topography to the study of magnetic domain movements in (100) Fe–3wt% Si produced by a mechanical stress. physica status solidi (a). 53(2). 571–576. 4 indexed citations
17.
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19.
Tuomi, T., et al.. (1978). Pendellösung Fringes in Synchrotron X-Ray Topographs of a Wedge-Shaped Silicon Crystal. physica status solidi (a). 50(2). 427–431. 5 indexed citations
20.
Kelhä, Väinö, et al.. (1978). Reconstructed topographs of polycrystalline (110) Fe-3 WT % Si samples and the observation of their magnetic domain images using synchrotron radiation. Nuclear Instruments and Methods. 152(1). 319–322. 4 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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