Steven P. Kowalczyk

1.1k citations
23 papers · 892 indexed · h-index 14

Steven P. Kowalczyk

23 papers receiving 840 citations

Peers

Steven P. Kowalczyk
Comparison fields: 5 of 55
  • Surfaces, Coatings and Films 111
  • Polymers and Plastics 212
  • Atomic and Molecular Physics, and Optics 318
  • Electrical and Electronic Engineering 555
  • Materials Chemistry 310
Replace Konrad Jarausch with:
Konrad Jarausch United States
David S. Fryer United States
J. Sapjeta United States
Woohong Kim United States
Pavo Dubček Croatia
L. Bideux France
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Gunar Kaune Germany
Fuk Kay Lee Hong Kong
M. Falke Germany
Steven P. Kowalczyk relative to Konrad Jarausch United States Konrad Jarausch's profile →
Citations per field
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Citations per year

Countries citing papers authored by Steven P. Kowalczyk

Since Specialization
Citations

This map shows the geographic impact of Steven P. Kowalczyk's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Steven P. Kowalczyk with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Steven P. Kowalczyk more than expected).

Fields of papers citing papers by Steven P. Kowalczyk

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Steven P. Kowalczyk. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Steven P. Kowalczyk. The network helps show where Steven P. Kowalczyk may publish in the future.

Co-authorship network

The 25 scholars most cited alongside Steven P. Kowalczyk, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Steven P. Kowalczyk Line = papers co-authored together Steven P. Kowalczyk links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown
#Work
1 200872
2 19979
3 19955
4 199425
5 19923
6 19919
7 199163
8 199095
9 199035
10 198920
11 19886
12 198868
13 19863
14 1986163
15 198549
16 19856
17 198311
18 198143
19 198132
20 19793

About Steven P. Kowalczyk

Steven P. Kowalczyk is a scholar working on Polymers and Plastics, Surfaces, Coatings and Films and Atomic and Molecular Physics, and Optics, having authored 23 papers that have together received 892 indexed citations. Recurring topics across this work include Synthesis and properties of polymers (11 papers), Semiconductor materials and devices (8 papers), Molecular Junctions and Nanostructures (6 papers), Tribology and Wear Analysis (4 papers), Semiconductor Quantum Structures and Devices (4 papers), Semiconductor materials and interfaces (3 papers), Conducting polymers and applications (3 papers) and Chalcogenide Semiconductor Thin Films (2 papers). The work is most often cited by research in Surfaces, Coatings and Films (111 citations), Polymers and Plastics (212 citations) and Atomic and Molecular Physics, and Optics (318 citations). Steven P. Kowalczyk has collaborated with scholars based in United States, Sweden and Belgium. Frequent co-authors include R. W. Grant, E. A. Kraut, J. R. Waldrop, Jane M. Shaw, Kang Wook Lee, J. T. Cheung, Christos Dimitrakopoulos, G. F. Walker, Jean Jordan‐Sweet and Young‐Ho Kim. Their work appears in journals such as Physical Review Letters, Physical review. B, Condensed matter and Applied Physics Letters.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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