M. Falke

897 total citations
57 papers, 743 citations indexed

About

M. Falke is a scholar working on Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering and Surfaces, Coatings and Films. According to data from OpenAlex, M. Falke has authored 57 papers receiving a total of 743 indexed citations (citations by other indexed papers that have themselves been cited), including 29 papers in Atomic and Molecular Physics, and Optics, 22 papers in Electrical and Electronic Engineering and 19 papers in Surfaces, Coatings and Films. Recurrent topics in M. Falke's work include Semiconductor materials and interfaces (22 papers), Electron and X-Ray Spectroscopy Techniques (19 papers) and Surface and Thin Film Phenomena (17 papers). M. Falke is often cited by papers focused on Semiconductor materials and interfaces (22 papers), Electron and X-Ray Spectroscopy Techniques (19 papers) and Surface and Thin Film Phenomena (17 papers). M. Falke collaborates with scholars based in Germany, United Kingdom and United States. M. Falke's co-authors include S. Teichert, Andrew Bleloch, H.‐J. Hinneberg, G. Beddies, Karl Leo, Gregor Schwartz, Karsten Walzer, Sebastian Reineke, U. Falke and Ch. Kleint and has published in prestigious journals such as Physical Review Letters, Angewandte Chemie International Edition and Applied Physics Letters.

In The Last Decade

M. Falke

56 papers receiving 726 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
M. Falke Germany 15 377 314 230 118 113 57 743
Matthieu Picher France 18 662 1.8× 205 0.7× 177 0.8× 78 0.7× 120 1.1× 29 870
S. Isoda Japan 14 365 1.0× 232 0.7× 110 0.5× 79 0.7× 73 0.6× 33 656
Der‐Hsin Wei Taiwan 18 420 1.1× 484 1.5× 507 2.2× 76 0.6× 89 0.8× 80 1.1k
Karsten Tillmann Germany 18 527 1.4× 400 1.3× 276 1.2× 197 1.7× 229 2.0× 40 1.0k
H. Ahmed United Kingdom 15 381 1.0× 404 1.3× 102 0.4× 173 1.5× 105 0.9× 57 732
Zentaro Akase Japan 11 253 0.7× 174 0.6× 196 0.9× 38 0.3× 64 0.6× 37 600
B. Rafferty United Kingdom 11 667 1.8× 443 1.4× 111 0.5× 194 1.6× 166 1.5× 16 963
Daniel Knez Austria 16 327 0.9× 222 0.7× 355 1.5× 39 0.3× 46 0.4× 58 844
Zhaslan Baraissov Singapore 11 348 0.9× 188 0.6× 116 0.5× 78 0.7× 114 1.0× 26 649
S. A. Nepijko Germany 11 246 0.7× 210 0.7× 168 0.7× 56 0.5× 47 0.4× 27 549

Countries citing papers authored by M. Falke

Since Specialization
Citations

This map shows the geographic impact of M. Falke's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Falke with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Falke more than expected).

Fields of papers citing papers by M. Falke

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. Falke. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Falke. The network helps show where M. Falke may publish in the future.

Co-authorship network of co-authors of M. Falke

This figure shows the co-authorship network connecting the top 25 collaborators of M. Falke. A scholar is included among the top collaborators of M. Falke based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with M. Falke. M. Falke is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Schneider, Reinhard, Erich Müller, M. Falke, et al.. (2023). Improvement of Quantitative STEM/EDXS Analyses for Chemical Analysis of Cu(In,Ga)Se2 Solar Cells with Zn(O,S) Buffer Layers. Microscopy and Microanalysis. 29(1). 69–77. 2 indexed citations
2.
Falke, M., et al.. (2019). Composition Analysis by EDS at Elevated Temperatures and More. Microscopy and Microanalysis. 25(S2). 1430–1431.
3.
Salge, T., et al.. (2011). Recent Advances in EDS and EBSD Technology: Revolutionizing the Chemical Analysis of Chondritic Meteorites at the Micro- and Nanometer Scale. LPI. 2723. 4 indexed citations
4.
Brombacher, Christoph, M. Falke, F. Springer, et al.. (2010). Magnetic hedgehog-like nanostructures. Applied Physics Letters. 97(10). 5 indexed citations
5.
Manh, Do Hung, et al.. (2010). The influences of technological conditions and Au cluster islands on morphology of Ga2O3 nanowires grown by VLS method on GaAs substrate. Journal of Materials Science Materials in Electronics. 22(2). 204–216. 5 indexed citations
6.
Spange, Stefan, Patrick Kempe, Andreas Seifert, et al.. (2009). Nanocomposites with Structure Domains of 0.5 to 3 nm by Polymerization of Silicon Spiro Compounds. Angewandte Chemie International Edition. 48(44). 8254–8258. 62 indexed citations
7.
Spange, Stefan, Patrick Kempe, Andreas Seifert, et al.. (2009). Nanokomposite mit 0.5 bis 3 nm großen Strukturdomänen durch Polymerisation von Silicium‐Spiroverbindungen. Angewandte Chemie. 121(44). 8403–8408. 33 indexed citations
8.
Falke, M., Anna Mogilatenko, Holm Kirmse, et al.. (2009). XEDS with SDD-Technology in Scanning Transmission Electron Microscopy. Microscopy and Microanalysis. 15(S2). 202–203. 2 indexed citations
9.
Hörmann, U., T. Remmele, John E. Klepeis, et al.. (2009). Structure and electronic properties of epitaxial fluorite-typeIrSi2on Si(001). Physical Review B. 79(10). 3 indexed citations
10.
Falke, M., Anna Mogilatenko, G. Beddies, et al.. (2007). Axiotaxy of CrSi2 on Si(001); from the Micrometer- to the Angstrom-Scale. Microscopy and Microanalysis. 13(S03). 396–397. 3 indexed citations
11.
Brown, Andy, Rik Brydson, Angus I. Kirkland, et al.. (2006). HREM of the {111} surfaces of iron oxide nanoparticles. Micron. 37(5). 389–395. 8 indexed citations
12.
Sánchez, Ana M., Pedro L. Galindo, S. Kret, et al.. (2006). An approach to the systematic distortion correction in aberration‐corrected HAADF images. Journal of Microscopy. 221(1). 1–7. 30 indexed citations
13.
Sánchez, Ana M., Pedro L. Galindo, S. Kret, et al.. (2006). Quantitative Strain Mapping Applied to Aberration-Corrected HAADF Images. Microscopy and Microanalysis. 12(4). 285–294. 19 indexed citations
14.
Zhou, Zhaoxia, W.M. Rainforth, U. Falke, et al.. (2006). On the structure and composition of nanoscale TiAlN/VN multilayers. The Philosophical Magazine A Journal of Theoretical Experimental and Applied Physics. 87(6). 967–978. 7 indexed citations
15.
Falke, M., U. Falke, & Andrew Bleloch. (2006). Misfit dislocations at the CoSi2/Si (001) interface studied by aberration-corrected high angle annular darkfield imaging. Journal of Physics Conference Series. 26. 21–24. 1 indexed citations
16.
Falke, U., Andrew Bleloch, M. Falke, & S. Teichert. (2004). Atomic Structure of a(2×1)ReconstructedNiSi2/Si(001)Interface. Physical Review Letters. 92(11). 42 indexed citations
17.
Falke, M., et al.. (2001). Epitaxial CoSi2 by solid phase reaction of Co/Ti and Co/Hf bilayers on Si(001). Microelectronic Engineering. 55(1-4). 171–175. 11 indexed citations
18.
Sarkar, D.K., Ileana Rău, M. Falke, et al.. (2001). Structure, interface roughness, and growth mechanism of reactive deposition epitaxy of CoSi2 on Si(100) substrates. Applied Physics Letters. 78(23). 3604–3606. 8 indexed citations
19.
Beddies, G., M. Falke, Jörg Bräuer, et al.. (2000). Plasma etching of ternary silicide top layers. Microelectronic Engineering. 50(1-4). 199–209. 1 indexed citations
20.
Sarkar, D.K., et al.. (2000). Role of buried ultra thin interlayer silicide on the growth of Ni film on Si(100) substrate. Applied Physics A. 70(6). 681–684. 11 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact

Breakdown of academic impact, for papers by Matthieu Picher Breakdown of academic impact, for papers by S. Isoda Breakdown of academic impact, for papers by Der‐Hsin Wei Breakdown of academic impact, for papers by Karsten Tillmann Breakdown of academic impact, for papers by H. Ahmed Breakdown of academic impact, for papers by Zentaro Akase Breakdown of academic impact, for papers by B. Rafferty Breakdown of academic impact, for papers by Daniel Knez Breakdown of academic impact, for papers by Zhaslan Baraissov Breakdown of academic impact, for papers by S. A. Nepijko
Rankless by CCL
2026