L. Bideux

1.2k citations
85 papers · 1.1k indexed · h-index 16

L. Bideux

83 papers receiving 1.1k citations

Peers

L. Bideux
Comparison fields: 5 of 52
  • Surfaces, Coatings and Films 190
  • Atomic and Molecular Physics, and Optics 555
  • Electrical and Electronic Engineering 867
  • Condensed Matter Physics 172
  • Materials Chemistry 320
Replace C. Tatsuyama with:
C. Tatsuyama Japan
Yusuke Mizokawa Japan
S. La Rosa Italy
Kazuyuki Ueda Japan
S. Samarin Australia
Rei Hobara Japan
А.В. Петров Belarus
Der‐Hsin Wei Taiwan
S. Banerjee India
Masaaki Hirai Japan
L. Bideux relative to C. Tatsuyama Japan C. Tatsuyama's profile →
Citations per field
00.5×3.5×
C. Tatsuyama · 1×
Citations per year

Countries citing papers authored by L. Bideux

Since Specialization
Citations

This map shows the geographic impact of L. Bideux's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by L. Bideux with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites L. Bideux more than expected).

Fields of papers citing papers by L. Bideux

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by L. Bideux. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by L. Bideux. The network helps show where L. Bideux may publish in the future.

Co-authorship network

The 25 scholars most cited alongside L. Bideux, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with L. Bideux Line = papers co-authored together L. Bideux links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown
#Work
1 20241
2 20243
3 20241
4 20199
5 201811
6 201659
7 20157
8 201474
9 201413
10 20145
11 20132
12 20125
13 200711
14 20064
15 200612
16 20002
17 19983
18 199711
19 199714
20 19945

About L. Bideux

L. Bideux is a scholar working on Surfaces, Coatings and Films, Atomic and Molecular Physics, and Optics, Condensed Matter Physics, Electrical and Electronic Engineering and Radiation, having authored 85 papers that have together received 1.1k indexed citations. Recurring topics across this work include Semiconductor materials and devices (62 papers), Electron and X-Ray Spectroscopy Techniques (39 papers), Surface and Thin Film Phenomena (22 papers), Semiconductor materials and interfaces (16 papers), GaN-based semiconductor devices and materials (16 papers), Semiconductor Quantum Structures and Devices (12 papers), Integrated Circuits and Semiconductor Failure Analysis (10 papers) and Ion-surface interactions and analysis (8 papers). The work is most often cited by research in Surfaces, Coatings and Films (190 citations), Atomic and Molecular Physics, and Optics (555 citations), Electrical and Electronic Engineering (867 citations), Condensed Matter Physics (172 citations) and Materials Chemistry (320 citations). L. Bideux has collaborated with scholars based in France, Poland and Czechia. Frequent co-authors include B. Gruzza, B. Akkal, Z. Benamara, Guillaume Monier, C. Robert‐Goumet, B. Gruzza, B. Gruzza, Vladimı́r Matolín, Agnès Rivaton and Matthieu Manceau. Their work appears in journals such as Applied Surface Science, Vacuum, Surface and Interface Analysis, Surface Science and Thin Solid Films.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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