L. Bideux

1.2k total citations
85 papers, 1.1k citations indexed

About

L. Bideux is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Surfaces, Coatings and Films. According to data from OpenAlex, L. Bideux has authored 85 papers receiving a total of 1.1k indexed citations (citations by other indexed papers that have themselves been cited), including 76 papers in Electrical and Electronic Engineering, 46 papers in Atomic and Molecular Physics, and Optics and 39 papers in Surfaces, Coatings and Films. Recurrent topics in L. Bideux's work include Semiconductor materials and devices (62 papers), Electron and X-Ray Spectroscopy Techniques (39 papers) and Surface and Thin Film Phenomena (22 papers). L. Bideux is often cited by papers focused on Semiconductor materials and devices (62 papers), Electron and X-Ray Spectroscopy Techniques (39 papers) and Surface and Thin Film Phenomena (22 papers). L. Bideux collaborates with scholars based in France, Poland and Czechia. L. Bideux's co-authors include B. Gruzza, B. Akkal, Z. Benamara, Guillaume Monier, C. Robert‐Goumet, B. Gruzza, B. Gruzza, Vladimı́r Matolín, Agnès Rivaton and Matthieu Manceau and has published in prestigious journals such as Nano Letters, Journal of The Electrochemical Society and The Journal of Physical Chemistry C.

In The Last Decade

L. Bideux

83 papers receiving 1.1k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
L. Bideux France 16 867 555 320 212 190 85 1.1k
C. Tatsuyama Japan 21 1.0k 1.2× 724 1.3× 746 2.3× 217 1.0× 211 1.1× 99 1.5k
Yusuke Mizokawa Japan 15 614 0.7× 217 0.4× 530 1.7× 137 0.6× 207 1.1× 49 996
Kazuyuki Ueda Japan 17 481 0.6× 628 1.1× 551 1.7× 164 0.8× 181 1.0× 133 1.2k
S. La Rosa Italy 18 477 0.6× 186 0.3× 450 1.4× 131 0.6× 102 0.5× 54 1.0k
Rei Hobara Japan 23 439 0.5× 1.1k 2.0× 627 2.0× 292 1.4× 68 0.4× 55 1.6k
Der‐Hsin Wei Taiwan 18 484 0.6× 507 0.9× 420 1.3× 191 0.9× 76 0.4× 80 1.1k
S. Banerjee India 18 433 0.5× 213 0.4× 481 1.5× 173 0.8× 98 0.5× 60 984
Masaaki Hirai Japan 17 466 0.5× 405 0.7× 278 0.9× 95 0.4× 138 0.7× 114 946
S. Samarin Australia 19 242 0.3× 628 1.1× 246 0.8× 111 0.5× 268 1.4× 98 1.0k
А.В. Петров Belarus 17 363 0.4× 130 0.2× 491 1.5× 360 1.7× 155 0.8× 65 1.0k

Countries citing papers authored by L. Bideux

Since Specialization
Citations

This map shows the geographic impact of L. Bideux's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by L. Bideux with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites L. Bideux more than expected).

Fields of papers citing papers by L. Bideux

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by L. Bideux. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by L. Bideux. The network helps show where L. Bideux may publish in the future.

Co-authorship network of co-authors of L. Bideux

This figure shows the co-authorship network connecting the top 25 collaborators of L. Bideux. A scholar is included among the top collaborators of L. Bideux based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with L. Bideux. L. Bideux is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
2.
Monier, Guillaume, et al.. (2024). In situ determination of indium/gallium composition in InxGa1-x nanodroplets on GaAs(1 1 1)A based on the complementarity between XPS and REELS. Applied Surface Science. 679. 161218–161218. 3 indexed citations
3.
Shwartz, Nataliya L., C. Robert‐Goumet, Alberto Pimpinelli, et al.. (2024). Growth Mechanisms of GaN/GaAs Nanostructures by Droplet Epitaxy Explained by Complementary Experiments and Simulations. The Journal of Physical Chemistry C. 128(12). 5168–5178. 1 indexed citations
4.
Réveret, François, Catherine Bougerol, C. Robert‐Goumet, et al.. (2019). Study of GaN layer crystallization on GaAs(100) using electron cyclotron resonance or glow discharge N2 plasma sources for the nitriding process. Applied Surface Science. 495. 143586–143586. 9 indexed citations
5.
Rabehi, Abdelaziz, M. Amrani, Z. Benamara, et al.. (2018). Simulation and Experimental Studies of Illumination Effects on the Current Transport of Nitridated GaAs Schottky Diode. Semiconductors. 52(16). 1998–2006. 11 indexed citations
6.
Monier, Guillaume, C. Robert‐Goumet, François Réveret, et al.. (2016). Synthesis and Study of Stable and Size-Controlled ZnO–SiO2 Quantum Dots: Application as a Humidity Sensor. The Journal of Physical Chemistry C. 120(21). 11652–11662. 59 indexed citations
7.
Monier, Guillaume, et al.. (2015). XPS combined with MM-EPES technique for in situ study of ultra thin film deposition: Application to an Au/SiO2/Si structure. Applied Surface Science. 357. 1268–1273. 7 indexed citations
8.
Дубровский, В. Г., Yamina André, Christine Leroux, et al.. (2014). Record Pure Zincblende Phase in GaAs Nanowires down to 5 nm in Radius. Nano Letters. 14(7). 3938–3944. 74 indexed citations
9.
Monier, Guillaume, et al.. (2014). New method for the determination of the correction function of a hemisperical electron analyser based on elastic electron images. Journal of Electron Spectroscopy and Related Phenomena. 197. 80–87. 13 indexed citations
10.
Pauly, Nicolas, Alain Dubus, Guillaume Monier, et al.. (2014). Energy dependence of the energy loss function parametrization of indium in the Drude–Lindhard model. Surface and Interface Analysis. 46(4). 283–288. 5 indexed citations
11.
Robert‐Goumet, C., Guillaume Monier, L. Bideux, et al.. (2013). Development of Monte-Carlo simulations for nano-patterning surfaces associated with MM-EPES analysis. Surface Science. 618. 72–77. 2 indexed citations
12.
Petit, Matthieu, Minh Tuan Dau, Guillaume Monier, et al.. (2012). Carbon diffusion and reactivity in Mn5Ge3 thin films. Physica status solidi. C, Conferences and critical reviews/Physica status solidi. C, Current topics in solid state physics. 9(6). 1374–1377. 5 indexed citations
13.
Bideux, L., et al.. (2007). A novel III–V semiconductor material for NO2 detection and monitoring. Sensors and Actuators A Physical. 142(1). 237–241. 11 indexed citations
14.
Robert‐Goumet, C., Matthieu Petit, L. Bideux, et al.. (2006). Combined EELS, LEED and SR-XPS study of ultra-thin crystalline layers of indium nitride on InP(1 0 0)—Effect of annealing at 450 °C. Applied Surface Science. 253(9). 4445–4449. 4 indexed citations
15.
Benamara, Z., et al.. (2006). Nitridation of InP(100) substrates studied by XPS spectroscopy and electrical analysis. Materials Science and Engineering A. 437(2). 254–258. 12 indexed citations
16.
Varga, D., et al.. (2000). Determination of yield ratios of elastically backscattered electrons for deriving inelastic mean free paths in solids. Surface and Interface Analysis. 30(1). 202–206. 2 indexed citations
17.
Bideux, L., et al.. (1998). Some applications of elastic peak electron spectroscopy for semiconductor surface studies. Surface and Interface Analysis. 26(12). 903–907. 3 indexed citations
18.
Bideux, L., et al.. (1997). Elastic reflection of electrons by porous silicon layered (PSL) surfaces: effects of porosity. Applied Surface Science. 115(2). 111–115. 11 indexed citations
19.
Zeze, Dagou A., et al.. (1997). Retarding field analyser used in elastic peak electron spectroscopy. Vacuum. 48(3-4). 399–401. 14 indexed citations
20.
Porte, A. L., et al.. (1994). The Monte Carlo method applied to the electrons elastically reflected by a copper sample. Vacuum. 45(2-3). 337–339. 5 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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