P. Franco

583 citations
13 papers · 401 indexed · h-index 8
Topics
VLSI and Analog Circuit Testing (9 papers)Integrated Circuits and Semiconductor Failure Analysis (8 papers)semigroups and automata theory (3 papers)
Partner nations
United StatesFrance

In The Last Decade

P. Franco

13 papers receiving 386 citations

Peers

P. Franco
Comparison fields: 5 of 23
  • Electrical and Electronic Engineering 377
  • Hardware and Architecture 347
  • Control and Systems Engineering 32
  • Software 31
  • Artificial Intelligence 7
Replace Kuo-Liang Cheng with:
Kuo-Liang Cheng Taiwan
F. P. M. Beenker Netherlands
E. Volkerink United States
Samy Makar United States
T.J. Chakraborty United States
Kee Sup Kim United States
T.J. Snethen United States
I. Hartanto United States
Ho Fai Ko Canada
D.B.I. Feltham United States
P. Franco relative to Kuo-Liang Cheng Taiwan Kuo-Liang Cheng's profile →
Citations per field
00.5×1.5×
Kuo-Liang Cheng · 1×
Citations per year

Countries citing papers authored by P. Franco

Since Specialization
Citations

This map shows the geographic impact of P. Franco's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by P. Franco with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites P. Franco more than expected).

Fields of papers citing papers by P. Franco

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by P. Franco. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by P. Franco. The network helps show where P. Franco may publish in the future.

Co-authorship network of co-authors of P. Franco

This figure shows the co-authorship network connecting the top 25 collaborators of P. Franco. A scholar is included among the top collaborators of P. Franco based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with P. Franco. P. Franco is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

13 of 13 papers shown
#WorkIndexed citations
1 1
2 25
3 27
4 49
5 15
6 27
7 3
8 213
9 16
10
Testing Digital Circuits for Timing Failures by Output Waveform Analysis
6
11
An Experimental Chip to Evaluate Test Techniques Part 1: Description of Experiment
7
12 10
13 2

About P. Franco

P. Franco is a scholar working on Hardware and Architecture, Computer Graphics and Computer-Aided Design and Computational Theory and Mathematics, having authored 13 papers that have together received 401 indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (9 papers), Integrated Circuits and Semiconductor Failure Analysis (8 papers) and semigroups and automata theory (3 papers). The work is most often cited by research in Hardware and Architecture (347 citations), Software (31 citations) and Electrical and Electronic Engineering (377 citations). P. Franco has collaborated with scholars based in United States and France. Frequent co-authors include E.J. McCluskey, N.R. Saxena and Jeremy Chang. Their work appears in journals such as IEEE Transactions on Computers and Discrete & Computational Geometry.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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