S.E. Kerns

1.2k citations

59 papers · 774 indexed · h-index 16

Hardware and Architecture top 5%
- VLSI and Analog Circuit Testing 9
Electrical and Electronic Engineering top 5%
- Semiconductor materials and devices 35
- Radiation Effects in Electronics 24
- Advancements in Semiconductor Devices and Circuit Design 16
- Integrated Circuits and Semiconductor Failure Analysis 12
- Low-power high-performance VLSI design 6
Instrumentation
Structural Biology
Radiation
Media Technology
- Engineering Education and Curriculum Development 6
- Experimental Learning in Engineering 4

Co-authors: L. W. Massengill D.V. Kerns Michael L. Alles A. Hoffmann B. L. Bhuva N. Akil Jean‐Pierre Charles W.J. Stapor
Cited by: Hardware and Architecture Electrical and Electronic Engineering Instrumentation
Journals: IEEE Transactions on Nuclear Science (19 papers)Applied Physics Letters (3 papers)IEEE Transactions on Electron Devices (3 papers)
Partner nations: United States France Morocco

In The Last Decade

S.E. Kerns

55 papers receiving 739 citations

Peers

Countries citing papers authored by S.E. Kerns

Since Specialization

Citations

This map shows the geographic impact of S.E. Kerns's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S.E. Kerns with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S.E. Kerns more than expected).

Fields of papers citing papers by S.E. Kerns

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by S.E. Kerns. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S.E. Kerns. The network helps show where S.E. Kerns may publish in the future.

Co-authorship network

The 25 scholars most cited alongside S.E. Kerns, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with S.E. Kerns Line = papers co-authored together S.E. Kerns links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

#	Work
1	Implementing A Multi Faceted Approach For Promoting Diversity In Graduate Engineering Education Papers on Engineering Education Repository (American Society for Engineering Education) ·Rizka Fadila,S.E. Kerns,Fatkhuri Fatkhuri,Carla Purdy,Paige Smith,Lindsay Pew	2020	0
2	Radiation Damage Testing Of Transistors For SSC Front-end Electronics J. Dawson,Jorge Zapata Salcedo,Andrew Stevens,H.W. Kraner,V. Radeka,S. Rescia,S.E. Kerns	2005	0
3	Comparison of Contactless Measurement and Testing Techniques to a New All-Silicon Optical Test and Characterization Method IEEE Transactions on Instrumentation and Measurement ·笹川恵美子,D.V. Kerns,S.E. Kerns	2005	19
4	Effect of Temperature-Dependent Bipolar Gain Distribution on Seu Vulnerability of Soi Cmos Srams Michael L. Alles,L. W. Massengill,S.E. Kerns	2005	17
5	A survey contactless measurement and testing techniques IEEE Potentials ·笹川恵美子,D.V. Kerns,S.E. Kerns	2005	7
6	A return to collegiality in Criteria 2000 visits Scottie E Jackson,Carla Sbarra,Pan-chiu Lai,S.E. Kerns	2003	1
7	Hardening at the design level S.E. Kerns	2002	1
8	Comparative analysis of metal and optical interconnect technology Tarun Mohan,B. L. Bhuva,D.V. Kerns,S.E. Kerns	2002	10
9	Novel x-ray sources and systems using gated electron emitters Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·R. R. Whitlock,David S. Hsu,J. L. Shaw,M. I. Bell,S.E. Kerns,D.V. Kerns,Weng Poo Kang,J.L. Davidson	2002	1
10	Size effect on SEB cross-section of VDMOSFETS Radiation effects and defects in solids ·Chafic Salame,A. Hoffmann,P. Mialhe,Jean‐Pierre Charles,D.V. Kerns,S.E. Kerns	2000	2
11	Circuit technique for threshold voltage stabilization using substrate bias in total dose environments IEEE Transactions on Nuclear Science ·Ahmed Al-Muthana,Hugh Barnaby,B. L. Bhuva,D.V. Kerns,S.E. Kerns	2000	1
12	Threshold voltage stabilization in radiation environments IEEE Transactions on Nuclear Science ·D.V. Kerns,Hugh Barnaby,S.E. Kerns	1998	2
13	Evaluating engineering programs under ABET EC2000 criteria: a perspective from ABET program visitors Peter Daniels,S.E. Kerns,Karan Watson	1998	1
14	A Study Of Plasma-induced Charging Damage Using Various Carrier Injection Conditions And Time-expanded Waveform Approach B. L. Bhuva,Raymond Johnson,S.E. Kerns,Riazantseva Ov	1997	1
15	Simulation of SEU transients in CMOS ICs IEEE Transactions on Nuclear Science ·N. Kaul,B. L. Bhuva,S.E. Kerns	1991	42
16	Automated photocurrent and bussing extraction for dose-rate rail span collapse simulations IEEE Transactions on Nuclear Science ·B. L. Bhuva,古一杉浦,L. W. Massengill,S.E. Kerns	1990	1
17	Circuit related issues due to radiation in hostile environments Journal of Electronic Materials ·John R. Hauser,S.E. Kerns	1990	6
18	Single-event charge enhancement in SOI devices IEEE Electron Device Letters ·L. W. Massengill,Geoffrey Bush,S.E. Kerns,Michael L. Alles	1990	73
19	A Novel CMOS SRAM Feedback Element for SEU Environments IEEE Transactions on Nuclear Science ·S. Verghese,А.К. Автухов,S.E. Kerns	1987	5
20	Single-Event, Enhanced Single-Event and Dose-Rate Effects with Pulsed Proton Beams IEEE Transactions on Nuclear Science ·M.A. Xapsos,Elyousfi Abdulhamid,W.J. Stapor,P. Shapiro,A.B. Campbell,S.E. Kerns,Mitsuaki Taneda,A.R. Knudson	1987	4

About S.E. Kerns

S.E. Kerns is a scholar working on Architecture, Hardware and Architecture, Electrical and Electronic Engineering, Media Technology and Structural Biology, having authored 59 papers that have together received 774 indexed citations. Recurring topics across this work include Semiconductor materials and devices (35 papers), Radiation Effects in Electronics (24 papers), Advancements in Semiconductor Devices and Circuit Design (16 papers), Integrated Circuits and Semiconductor Failure Analysis (12 papers), VLSI and Analog Circuit Testing (9 papers), Low-power high-performance VLSI design (6 papers), Engineering Education and Curriculum Development (6 papers) and Experimental Learning in Engineering (4 papers). The work is most often cited by research in Hardware and Architecture (183 citations), Electrical and Electronic Engineering (686 citations), Instrumentation (21 citations), Structural Biology (5 citations) and Radiation (30 citations). S.E. Kerns has collaborated with scholars based in United States, France and Morocco. Frequent co-authors include L. W. Massengill, D.V. Kerns, Michael L. Alles, A. Hoffmann, B. L. Bhuva, N. Akil, Jean‐Pierre Charles, W.J. Stapor, P.T. McDonald and A.B. Campbell. Their work appears in journals such as IEEE Transactions on Nuclear Science, Applied Physics Letters, IEEE Transactions on Electron Devices, IEEE Electron Device Letters and IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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