Scott A. McHugo

1.2k total citations
53 papers, 908 citations indexed

About

Scott A. McHugo is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Materials Chemistry. According to data from OpenAlex, Scott A. McHugo has authored 53 papers receiving a total of 908 indexed citations (citations by other indexed papers that have themselves been cited), including 47 papers in Electrical and Electronic Engineering, 18 papers in Atomic and Molecular Physics, and Optics and 12 papers in Materials Chemistry. Recurrent topics in Scott A. McHugo's work include Silicon and Solar Cell Technologies (42 papers), Thin-Film Transistor Technologies (24 papers) and Semiconductor materials and interfaces (17 papers). Scott A. McHugo is often cited by papers focused on Silicon and Solar Cell Technologies (42 papers), Thin-Film Transistor Technologies (24 papers) and Semiconductor materials and interfaces (17 papers). Scott A. McHugo collaborates with scholars based in United States, Germany and Japan. Scott A. McHugo's co-authors include E. R. Weber, H. Hieslmair, C. Flink, A. A. Istratov, A. C. Thompson, Harvey E. Doner, Mavrik Zavarin, Daniel G. Strawn, T. Heiser and S. Martinuzzi and has published in prestigious journals such as Physical Review Letters, Applied Physics Letters and Journal of Applied Physics.

In The Last Decade

Scott A. McHugo

50 papers receiving 850 citations

Peers

Countries citing papers authored by Scott A. McHugo

Since Specialization

Citations

This map shows the geographic impact of Scott A. McHugo's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Scott A. McHugo with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Scott A. McHugo more than expected).

Fields of papers citing papers by Scott A. McHugo

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Scott A. McHugo. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Scott A. McHugo. The network helps show where Scott A. McHugo may publish in the future.

Co-authorship network of co-authors of Scott A. McHugo

This figure shows the co-authorship network connecting the top 25 collaborators of Scott A. McHugo. A scholar is included among the top collaborators of Scott A. McHugo based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Scott A. McHugo. Scott A. McHugo is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	Failure mode analysis of oxide VCSELs in high humidity and high temperature 2003 ·Journal of Lightwave Technology ·(unknown), Robert W. Herrick, D. R. Chamberlin, S. J. Rosner, Scott A. McHugo, G. Girolami, (unknown), Seongsin Kim, (unknown)	25
2	Reliability and failure mechanisms of oxide VCSELs in non-hermetic enviroments 2003 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·(unknown), Robert W. Herrick, (unknown), (unknown), (unknown), (unknown), Laura M. Giovane, (unknown), M. Keever, T. D. Osentowski, Scott A. McHugo, (unknown), Seongsin M. Kim, D. R. Chamberlin, S. J. Rosner, G. Girolami	15
3	Characterization of failure mechanisms for oxide VCSELs 2003 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Scott A. McHugo, A.T. Krishnan, J. Krueger, Yong Luo, (unknown), T. D. Osentowski, (unknown), (unknown), Robert W. Herrick, (unknown), (unknown), (unknown), M. Keever, (unknown)	7
4	Studies of ESD-related failure patterns of Agilent oxide VCSELs 2003 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·J. Krueger, (unknown), Scott A. McHugo, (unknown), (unknown), (unknown), (unknown), (unknown), (unknown), M. Keever, (unknown)	14
5	Copper precipitates in silicon: Precipitation, dissolution, and chemical state 2002 ·Journal of Applied Physics ·Scott A. McHugo, (unknown), A. C. Thompson, Barry Lai, Zhonghou Cai	15
6	Microscale investigation into the geochemistry of arsenic, selenium, and iron in soil developed in pyritic shale materials 2002 ·Geoderma ·Daniel G. Strawn, Harvey E. Doner, Mavrik Zavarin, Scott A. McHugo	106
7	Injection of point defects by oxidation of AlGaAs 2002 ·MRS Proceedings ·D. R. Chamberlin, Scott A. McHugo, (unknown), (unknown), T. D. Osentowski, S. J. Rosner	1
8	<title>Characterization of the focal quality of micron-size beams from x-ray mirrors and zone plates</title> 2001 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·A. C. Thompson, J. H. Underwood, Erik H. Anderson, Scott A. McHugo, Barry Lai	3
9	Out-Diffusion and Precipitation of Copper in Silicon: An Electrostatic Model 2000 ·Physical Review Letters ·C. Flink, H. Feick, Scott A. McHugo, W. Seifert, H. Hieslmair, T. Heiser, A. A. Istratov, Eicke R. Weber	55
10	Diffusion, solubility and gettering of copper in silicon 2000 ·Materials Science and Engineering B ·A. A. Istratov, C. Flink, H. Hieslmair, Scott A. McHugo, E. R. Weber	56
11	Synchrotron-based impurity mapping 2000 ·Journal of Crystal Growth ·Scott A. McHugo, A. C. Thompson, C. Flink, E. R. Weber, G. M. Lamble, (unknown), A. A. MacDowell, Richard Celestre, H. A. Padmore, (unknown)	30
12	Defect diagnostics using scanning photoluminescence in multicrystalline silicon 1999 ·Physica B Condensed Matter ·(unknown), S. Ostapenko, (unknown), Scott A. McHugo, S. Koveshnikov, J. Weber, (unknown), Erwin Reisner	13
13	Size and time resolved anthropogenic components of aerosols via synchrotron x-ray fluorescence: application to Asian aerosol transport 1999 ·Thomas A. Cahill, Steven S. Cliff, K. D. Perry, M. P. Jimenez-Cruz, Scott A. McHugo	4
14	Scanning room-temperature photoluminescence in polycrystalline silicon 1999 ·Applied Physics Letters ·Yaroslav Koshka, S. Ostapenko, (unknown), Scott A. McHugo, J.P. Kalejs	36
15	Direct Correlation of Solar Cell Performance with Metal Impurity Distributions in Polycrystalline Silicon using Synchrotron-Based X-ray Analysis 1998 ·MRS Proceedings ·Scott A. McHugo, A. C. Thompson, G. M. Lamble, A. A. MacDowell, Richard Celestre, H. A. Padmore, Mitsuru Imaizumi, Masafumi Yamaguchi, I. Périchaud, S. Martinuzzi, M. Werner, Markus Rinio, Heinrich Möller, Bhushan Sopori, H. Hieslmair, C. Flink, A. A. Istratov, E. R. Weber	2
16	Iron and Nickel Solubilities in Heavily Doped Silicon and their Energy Levels in the Silicon Band Gap at Elevated Temperatures 1998 ·MRS Proceedings ·Scott A. McHugo, R. J. McDonald, A. R. Smith, (unknown), A. A. Istratov, H. Hieslmair, E. R. Weber	1
17	Gettering of iron by oxygen precipitates 1998 ·Applied Physics Letters ·H. Hieslmair, A. A. Istratov, Scott A. McHugo, C. Flink, T. Heiser, E. R. Weber	43
18	Transient ion drift detection of low level copper contamination in silicon 1997 ·Applied Physics Letters ·T. Heiser, Scott A. McHugo, H. Hieslmair, E. R. Weber	39
19	Release of Impurities From Structural Defects in Polycrystalline Silicon Solar Cells 1997 ·MRS Proceedings ·Scott A. McHugo, Mitsuru Imaizumi	0
20	Aluminum backside segregation 1996 ·H. Hieslmair, Scott A. McHugo, E. R. Weber	6

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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