A.T. Krishnan

2.2k total citations
42 papers, 1.7k citations indexed

About

A.T. Krishnan is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, A.T. Krishnan has authored 42 papers receiving a total of 1.7k indexed citations (citations by other indexed papers that have themselves been cited), including 38 papers in Electrical and Electronic Engineering, 9 papers in Materials Chemistry and 5 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in A.T. Krishnan's work include Semiconductor materials and devices (29 papers), Advancements in Semiconductor Devices and Circuit Design (26 papers) and Integrated Circuits and Semiconductor Failure Analysis (15 papers). A.T. Krishnan is often cited by papers focused on Semiconductor materials and devices (29 papers), Advancements in Semiconductor Devices and Circuit Design (26 papers) and Integrated Circuits and Semiconductor Failure Analysis (15 papers). A.T. Krishnan collaborates with scholars based in United States, India and United Kingdom. A.T. Krishnan's co-authors include S. Krishnan, V. Reddy, S. Chakravarthi, J. Antonio Travieso-Rodríguez, C. Machala, J. P. Campbell, Patrick M. Lenahan, Rakesh Vattikonda, Wenping Wang and Yu Cao and has published in prestigious journals such as Physical Review Letters, Physical review. B, Condensed matter and Applied Physics Letters.

In The Last Decade

A.T. Krishnan

41 papers receiving 1.6k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
A.T. Krishnan United States 17 1.5k 152 139 101 99 42 1.7k
Wolfgang Goes Austria 21 1.9k 1.3× 48 0.3× 240 1.7× 229 2.3× 50 0.5× 98 2.0k
K. Sunouchi Japan 13 799 0.5× 36 0.2× 208 1.5× 386 3.8× 69 0.7× 34 1.1k
Hongxia Guo China 13 610 0.4× 72 0.5× 31 0.2× 166 1.6× 66 0.7× 121 709
Jaesoo Ahn United States 13 680 0.4× 23 0.2× 277 2.0× 189 1.9× 58 0.6× 18 728
R. Krishnan United States 11 870 0.6× 80 0.5× 105 0.8× 468 4.6× 77 0.8× 24 1000
S. Demuynck Belgium 18 985 0.6× 32 0.2× 360 2.6× 151 1.5× 307 3.1× 101 1.2k
G. Ghidini Italy 21 1.8k 1.2× 18 0.1× 176 1.3× 406 4.0× 45 0.5× 127 1.8k
Wei‐Chou Hsu Taiwan 14 532 0.4× 14 0.1× 203 1.5× 107 1.1× 116 1.2× 96 619
W. W. Molzen United States 12 520 0.3× 59 0.4× 125 0.9× 153 1.5× 32 0.3× 20 681
T. Chiarella Belgium 19 1.3k 0.8× 26 0.2× 174 1.3× 147 1.5× 25 0.3× 109 1.3k

Countries citing papers authored by A.T. Krishnan

Since Specialization
Citations

This map shows the geographic impact of A.T. Krishnan's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by A.T. Krishnan with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites A.T. Krishnan more than expected).

Fields of papers citing papers by A.T. Krishnan

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by A.T. Krishnan. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by A.T. Krishnan. The network helps show where A.T. Krishnan may publish in the future.

Co-authorship network of co-authors of A.T. Krishnan

This figure shows the co-authorship network connecting the top 25 collaborators of A.T. Krishnan. A scholar is included among the top collaborators of A.T. Krishnan based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with A.T. Krishnan. A.T. Krishnan is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Kaur, Simran, A.T. Krishnan, & Sudip Chakraborty. (2023). Recent advances and challenges of carbon nano onions (CNOs) for application in supercapacitor devices (SCDs). Journal of Energy Storage. 71. 107928–107928. 15 indexed citations
2.
3.
Ryan, Jason T., Patrick M. Lenahan, A.T. Krishnan, S. Krishnan, & J. P. Campbell. (2009). Spin dependent recombination study of the atomic-scale effects of fluorine on the negative bias temperature instability. 988–991. 2 indexed citations
4.
Campbell, J. P., Patrick M. Lenahan, A.T. Krishnan, & S. Krishnan. (2007). Identification of atomic-scale defect structure involved in the negative bias temperature instability in plasma-nitrided devices. Applied Physics Letters. 91(13). 11 indexed citations
5.
Campbell, J. P., Patrick M. Lenahan, A.T. Krishnan, & S. Krishnan. (2007). Location, Structure, and Density of States of NBTI-Induced Defects in Plasma Nitrided pMOSFETs. 503–510. 19 indexed citations
6.
Campbell, J. P., Patrick M. Lenahan, A.T. Krishnan, & S. Krishnan. (2007). Atomic-scale defects involved in NBTI in plasma-nitrided pMOSFETs. 12–17. 2 indexed citations
7.
Nicollian, Paul E., et al.. (2006). The roles of hydrogen and holes in trap generation and breakdown in ultra-thin SiON dielectrics. 713. 392–395. 14 indexed citations
8.
Campbell, J. P., Patrick M. Lenahan, A.T. Krishnan, & S. Krishnan. (2005). Direct observation of the structure of defect centers involved in the negative bias temperature instability. Applied Physics Letters. 87(20). 38 indexed citations
9.
Chakravarthi, S., A.T. Krishnan, V. Reddy, C. Machala, & S. Krishnan. (2004). A comprehensive framework for predictive modeling of negative bias temperature instability. 273–282. 256 indexed citations
10.
Krishnan, A.T., V. Reddy, S. Chakravarthi, et al.. (2004). NBTI impact on transistor and circuit: models, mechanisms and scaling effects [MOSFETs]. 14.5.1–14.5.4. 169 indexed citations
11.
Krishnan, A.T., et al.. (2004). A charge damage study using an electron beam low k treatment. 190–192. 3 indexed citations
12.
McHugo, Scott A., A.T. Krishnan, J. Krueger, et al.. (2003). Characterization of failure mechanisms for oxide VCSELs. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 4994. 55–55. 7 indexed citations
13.
Reddy, V., A.T. Krishnan, Andrew Marshall, et al.. (2003). Impact of negative bias temperature instability on digital circuit reliability. 248–254. 194 indexed citations
14.
Schein, J., Kelly Campbell, N. Qi, & A.T. Krishnan. (2002). Ultra-fast UV-triggered high voltage diamond switch. IEEE Conference Record - Abstracts. PPPS-2001 Pulsed Power Plasma Science 2001. 28th IEEE International Conference on Plasma Science and 13th IEEE International Pulsed Power Conference (Cat. No.01CH37255). 243–243. 2 indexed citations
15.
Croft, Mark, et al.. (1982). Cooperative Configuration Change in EuPd2Si2. Physical Review Letters. 48(12). 826–829. 78 indexed citations
16.
Yang, Tao, A.T. Krishnan, N. Benczer-Koller, & G. Bayreuther. (1982). Surface Magnetic Hyperfine Interactions inFe2O3Determined by Energy-Resolved Conversion-Electron Mössbauer Spectroscopy. Physical Review Letters. 48(18). 1292–1295. 33 indexed citations
17.
Krishnan, A.T.. (1978). Microcomputer-Controlled Electric Discharge Machine. IETE Journal of Research. 24(3-4). 141–143. 2 indexed citations
18.
Krishnan, A.T., et al.. (1977). Thyristor trigger circuit using a 555 IC timer. International Journal of Electronics. 42(5). 515–517. 1 indexed citations
19.
Krishnan, A.T., et al.. (1974). Maximum power transfer in relaxation generator for electric discharge machining†. International Journal of Electronics. 36(1). 73–79. 1 indexed citations
20.
Krishnan, A.T., et al.. (1973). A simple division circuit. International Journal of Electronics. 35(6). 857–858.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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