Petra Specht

522 citations

26 papers · 439 indexed · h-index 11

Impact in

Structural Biology top 2%
- Advanced Electron Microscopy Techniques and Applications
Surfaces, Coatings and Films top 5%
- Electron and X-Ray Spectroscopy Techniques

Papers in

Structural Biology 8
- Advanced Electron Microscopy Techniques and Applications 8
Surfaces, Coatings and Films 9
- Electron and X-Ray Spectroscopy Techniques 9

Co-authors: Christian Kisielowski Stig Helveg Alexis T. Bell Zhenmeng Peng Ferenc Somodi Joo Kang Bin Jiang Bastian Barton
Journals: Microscopy and Microanalysis (7 papers)Applied Physics Letters (2 papers)Advanced Functional Materials (2 papers)IEEE Electron Device Letters (1 paper)Physical Review B (1 paper)
Partner nations: United States Netherlands Germany

In The Last Decade

Petra Specht

26 papers receiving 428 citations

Peers

Countries citing papers authored by Petra Specht

Since Specialization

Citations

This map shows the geographic impact of Petra Specht's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Petra Specht with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Petra Specht more than expected).

Fields of papers citing papers by Petra Specht

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Petra Specht. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Petra Specht. The network helps show where Petra Specht may publish in the future.

Co-authorship network

The 25 scholars most cited alongside Petra Specht, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Petra Specht Line = papers co-authored together Petra Specht links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

#	Work
1	Probing the Boundary between Classical and Quantum Mechanics by Analyzing the Energy Dependence of Single-Electron Scattering Events at the Nanoscale Nanomaterials ·Christian Kisielowski, Petra Specht, Stig Helveg, Fu‐Rong Chen, Bert Freitag, Joerg R. Jinschek, D. Van Dyck	2023	2
2	Exploring Functional Materials by Understanding Beam‐Sample Interactions Advanced Functional Materials ·Christian Kisielowski, Petra Specht, Steve Rozeveld, Bert Freitag, E. R. Kieft, Joo Kang, 幸光真田, Maria Protti, D. Van Dyck, David F. Yancey	2022	8
3	Dose Rate Considerations for Semiconductor Electronics: Why Current Variations Enable Unique GaN-based Transmission Electron Microscopy Microscopy and Microanalysis ·Petra Specht, Ronny Kirste, Zlatko Sitar, Travis J. Anderson, Andrew D. Koehler, Christian Kisielowski	2020	1
4	The Ultimate Detection Limit: Building Electron Diffraction Patterns One Electron at a Time Microscopy and Microanalysis ·Christian Kisielowski, Petra Specht, David F. Yancey, Steve Rozeveld, Joo Kang, M. Boekhoff, David G. Barton	2020	1
5	Amorphous gallium oxide sulfide: A highly mismatched alloy Journal of Applied Physics ·しおり花井, Petra Specht, K. M. Yu, Władek Walukiewicz, O. D. Dubón	2019	10
6	Understanding Ziegler-Natta Catalyst Structure via Low-Dose Transmission Electron Microscopy Microscopy and Microanalysis ·David F. Yancey, Christian Kisielowski, Petra Specht, Steve Rozeveld, Joo Kang, Peter N. Nickias	2018	1
7	Utilizing Low-Dose Transmission Electron Microscopy for Structure and Defect Identification in Group III - Nitride Electronic Devices Microscopy and Microanalysis ·Petra Specht, M. Luysberg, هادی براتی, T.R. Weatherford, Travis J. Anderson, Andrew D. Koehler, Christian Kisielowski	2018	2
8	Imaging Atomic-Scale Clustering in III–V Semiconductor Alloys ACS Nano ·Louise C. Hirst, Magee Alex C, Stephanie Tomasulo, J. Abell, M. González, Michael K. Yakes, J. R. Meyer, Robert Walters, Song Cheng, Petra Specht, Peter Ercius, Christian Kisielowski	2017	9
9	On the chemical homogeneity of InxGa1−xN alloys – Electron microscopy at the edge of technical limits Materials Science in Semiconductor Processing ·Petra Specht, Christian Kisielowski	2016	8
10	Degradation mechanisms of AlGaN/GaN HEMTs on sapphire, Si, and SiC substrates under proton irradiation Andrew D. Koehler, Travis J. Anderson, Jennifer K. Hite, B. D. Weaver, Marko J. Tadjer, Michael A. Mastro, Jordan D. Greenlee, Petra Specht, Matthew Porter, T.R. Weatherford, Karl D. Hobart, Fritz J. Kub	2014	10
11	Real-time sub-Ångstrom imaging of reversible and irreversible conformations in rhodium catalysts and graphene Physical Review B ·Christian Kisielowski, Lin‐Wang Wang, Petra Specht, H.A. Calderón, Bastian Barton, Bin Jiang, Joo Kang, Robert Cieslinski	2013	53
12	Reliability of GaN HEMTs: Electrical and Radiation-Induced Failure Mechanism ECS Transactions ·Travis J. Anderson, Andrew D. Koehler, Marko J. Tadjer, Karl D. Hobart, Petra Specht, Matthew Porter, T.R. Weatherford, NTfK, Jennifer K. Hite, Fritz J. Kub	2013	4
13	Atomic Resolution Phase Contrast Imaging and In-Line Holography Using Variable Voltage and Dose Rate Microscopy and Microanalysis ·Bastian Barton, Bin Jiang, Qijun Yang, Petra Specht, H.A. Calderón, Christian Kisielowski	2012	30
14	Quantitative Contrast Evaluation of an Industry‐Style Rhodium Nanocatalyst with Single Atom Sensitivity ChemCatChem ·Petra Specht, Robert Gulotty, David G. Barton, Robert Cieslinski, Steve Rozeveld, Joo Kang, O. D. Dubón, Christian Kisielowski	2011	13
15	Are the Materials Properties of Indiumnitride Dominated by Defects? MRS Proceedings ·Petra Specht, Uwe Strähle, Eicke R. Weber	2007	1
16	Atomic Scale Analysis of Planar Defects in Polycrystalline Diamond Microscopy and Microanalysis ·Rolf Erni, Bert Freitag, Peter Hartel, Heiko Müller, Peter Tiemeijer, Zicheng Li, Isabel Cristina Miranda do Nascimento, D. Hubert, Petra Specht, 洪小斌 HONG Xiaobin	2006	10
17	In situ diffuse reflectance spectroscopy investigation of low-temperature-grown GaAs Applied Physics Letters ·de Carvalho Maugĕ G, Michael Joseph Cich, Petra Specht, Eicke R. Weber	2002	6
18	AFM study of lattice matched and strained InGaAsN layers on GaAs Physica B Condensed Matter ·Jose R. Monzon, Michael Joseph Cich, de Carvalho Maugĕ G, Petra Specht, H. Feick, Eicke R. Weber	2001	6
19	Analysis of twin defects in GaAs(111)B molecular beam epitaxy growth Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena ·Jose R. Monzon, Michael Joseph Cich, de Carvalho Maugĕ G, Petra Specht, Eicke R. Weber, Eric A. Stach, Shinji Nozaki	2000	32
20	Fracture Toughness, Fracture Planes and BDT in Stoichiometric Feal and Nial Single Crystals MRS Proceedings ·Petra Specht, Vincent Pluvinage, Peter Neumann	1994	10

About Petra Specht

Petra Specht is a scholar working on Structural Biology, Surfaces, Coatings and Films, Condensed Matter Physics, Electronic, Optical and Magnetic Materials and Radiation, having authored 26 papers that have together received 439 indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (9 papers), GaN-based semiconductor devices and materials (9 papers), Semiconductor materials and devices (8 papers), Advanced Electron Microscopy Techniques and Applications (8 papers), Ga2O3 and related materials (6 papers), Semiconductor Quantum Structures and Devices (4 papers), Photocathodes and Microchannel Plates (3 papers) and Integrated Circuits and Semiconductor Failure Analysis (3 papers). The work is most often cited by research in Structural Biology (114 citations), Surfaces, Coatings and Films (98 citations), Condensed Matter Physics (98 citations), Catalysis (38 citations) and Electronic, Optical and Magnetic Materials (92 citations). Petra Specht has collaborated with scholars based in United States, Netherlands and Germany. Frequent co-authors include Christian Kisielowski, Stig Helveg, Alexis T. Bell, Zhenmeng Peng, Ferenc Somodi, Joo Kang, Bin Jiang, Bastian Barton, H.A. Calderón and T.R. Weatherford. Their work appears in journals such as Microscopy and Microanalysis, Applied Physics Letters, Advanced Functional Materials, IEEE Electron Device Letters and Physical Review B.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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