P. S. Ho

1.4k total citations
30 papers, 1.1k citations indexed

About

P. S. Ho is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Materials Chemistry. According to data from OpenAlex, P. S. Ho has authored 30 papers receiving a total of 1.1k indexed citations (citations by other indexed papers that have themselves been cited), including 15 papers in Electrical and Electronic Engineering, 13 papers in Atomic and Molecular Physics, and Optics and 10 papers in Materials Chemistry. Recurrent topics in P. S. Ho's work include Semiconductor materials and interfaces (13 papers), Synthesis and properties of polymers (7 papers) and Copper Interconnects and Reliability (7 papers). P. S. Ho is often cited by papers focused on Semiconductor materials and interfaces (13 papers), Synthesis and properties of polymers (7 papers) and Copper Interconnects and Reliability (7 papers). P. S. Ho collaborates with scholars based in United States. P. S. Ho's co-authors include F. K. LeGoues, Gary W. Rubloff, B. D. Silverman, P. E. Schmid, Peter Hahn, M. Liehr, Johann W. Bartha, John E. Lewis, H. Föll and Franz Faupel and has published in prestigious journals such as Science, Physical Review Letters and Physical review. B, Condensed matter.

In The Last Decade

P. S. Ho

30 papers receiving 1.1k citations

Peers

P. S. Ho

EEE

AMPO

EOMM

G. R. Gruzalski United States

R. Flitsch United States

G. Couturier France

J. Szczyrbowski Poland

J. P. de Souza Brazil

Yusuke Mizokawa Japan

N. David Theodore United States

J. A. Aboaf United States

G.M. Crean Ireland

S. P. Wong Hong Kong

G. R. Gruzalski United States

P. S. Ho

1.1k ×1.8

EEE

226 ×0.5

AMPO

467 ×1.6

147 ×0.7

214 ×1.0

EOMM

Citations per year, relative to P. S. Ho P. S. Ho (= 1×) peers G. R. Gruzalski

Countries citing papers authored by P. S. Ho

Since Specialization

Citations

This map shows the geographic impact of P. S. Ho's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by P. S. Ho with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites P. S. Ho more than expected).

Fields of papers citing papers by P. S. Ho

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by P. S. Ho. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by P. S. Ho. The network helps show where P. S. Ho may publish in the future.

Co-authorship network of co-authors of P. S. Ho

This figure shows the co-authorship network connecting the top 25 collaborators of P. S. Ho. A scholar is included among the top collaborators of P. S. Ho based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with P. S. Ho. P. S. Ho is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Ho, P. S., et al.. (1996). Film Thickness Effect on Tensile Properties and Microstructures of Submicron Aluminum Thin Films on Polyimide. MRS Proceedings. 436. 9 indexed citations

Ho, P. S., et al.. (1992). Electromigration in two-level interconnect structures with Al alloy lines and W studs. Journal of Applied Physics. 72(1). 291–293. 33 indexed citations

Ho, P. S.. (1990). Chemistry and adhesion of metal-polymer interfaces. Applied Surface Science. 41-42. 559–566. 32 indexed citations

Faupel, Franz, D. Gupta, B. D. Silverman, & P. S. Ho. (1989). Direct measurements of Cu diffusion into a polyimide below the glass transition temperature. Applied Physics Letters. 55(4). 357–359. 44 indexed citations

LeGoues, F. K., B. D. Silverman, & P. S. Ho. (1988). The microstructure of metal–polyimide interfaces. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 6(4). 2200–2204. 94 indexed citations

Silverman, B. D., et al.. (1988). Molecular orbital analysis of the XPS spectrum of a fluorine containing polyimide: PMDA–BDAF. Journal of Polymer Science Part A Polymer Chemistry. 26(4). 1199–1205. 7 indexed citations

Kirillov, D., P. S. Ho, & Gary A. Davis. (1986). Raman scattering study of disordering and alloying of GaAs-AlAs superlattice by As implantation and rapid thermal annealing. Applied Physics Letters. 48(1). 53–55. 14 indexed citations

Silverman, B. D., P. N. Sanda, P. S. Ho, & Angelo R. Rossi. (1985). Origin of the carbon 1s‐core level shifts in polyimide model compounds. Journal of Polymer Science Polymer Chemistry Edition. 23(11). 2857–2863. 36 indexed citations

Liehr, M., P. E. Schmid, F. K. LeGoues, & P. S. Ho. (1985). Summary Abstract: Influence of interface quality on the Schottky barrier height in the epitaxial Ni-silicide/Si(111) system. Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena. 3(4). 1190–1191. 3 indexed citations

10.

Liehr, M., P. E. Schmid, F. K. LeGoues, & P. S. Ho. (1985). Correlation of Schottky-Barrier Height and Microstructure in the Epitaxial Ni Silicide on Si(111). Physical Review Letters. 54(19). 2139–2142. 121 indexed citations

11.

Sanda, P. N., Johann W. Bartha, B. D. Silverman, P. S. Ho, & Angelo R. Rossi. (1984). Model Compound Approach for Polymer-Metal InterFaces: ESCA Studies. MRS Proceedings. 40. 2 indexed citations

12.

Hahn, Peter, Gary W. Rubloff, Johann W. Bartha, et al.. (1984). Chemical Interactions at Metal-Polymer Interfaces. MRS Proceedings. 40. 19 indexed citations

13.

Purtell, R. J., G. Hollinger, Gary W. Rubloff, & P. S. Ho. (1983). Schottky barrier formation at Pd, Pt, and Ni/Si(111) interfaces. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 1(2). 566–569. 22 indexed citations

14.

Gupta, D., et al.. (1982). Grain-boundary diffusion of Sn in Pb. Journal of Applied Physics. 53(5). 3620–3623. 15 indexed citations

15.

Chen, Haydn, et al.. (1982). An X-ray study of domain structure and stress in Pd2Si films at Pd-Si interfaces. Thin Solid Films. 93(1-2). 161–169. 13 indexed citations

16.

Ho, P. S.. (1982). General aspects of barrier layers for very-large-scale integration applications I: Concepts. Thin Solid Films. 96(4). 301–316. 25 indexed citations

17.

Rubloff, Gary W., et al.. (1981). Chemical bonding and reactions at the Pd/Si interface. Physical review. B, Condensed matter. 23(8). 4183–4196. 113 indexed citations

18.

Ho, P. S., P. E. Schmid, & H. Föll. (1981). Stoichiometric and Structural Origin of Electronic States at thePd2Si-Si Interface. Physical Review Letters. 46(12). 782–785. 78 indexed citations

19.

Freeouf, J. L., Gary W. Rubloff, P. S. Ho, & T. S. Kuan. (1980). Reactive Schottky barrier formation: The Pd/Si interface. Journal of Vacuum Science and Technology. 17(5). 916–919. 21 indexed citations

20.

Köster, Uwe, P. S. Ho, & Moshe Ron. (1980). Thermal reactions between aluminum and palladium layered films. Thin Solid Films. 67(1). 35–44. 43 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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