P. E. Schmid
- Materials Chemistry top 1%
- Electronic and Structural Properties of Oxides 8
- Ferroelectric and Piezoelectric Materials 7
- ZnO doping and properties 6
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- Semiconductor materials and devices 12
- Silicon and Solar Cell Technologies 8
- Polymers and Plastics top 5%
- Mechanics of Materials top 2%
- Metal and Thin Film Mechanics 12
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- Semiconductor materials and interfaces 20
- Surface and Thin Film Phenomena 11
P. E. Schmid
68 papers receiving 5.4k citations
Hit Papers
Peers
Comparison fields: 5 of 131
- Renewable Energy, Sustainability and the Environment 2.1k
- Materials Chemistry 3.4k
- Electrical and Electronic Engineering 2.1k
- Polymers and Plastics 465
- Mechanics of Materials 610
Countries citing papers authored by P. E. Schmid
This map shows the geographic impact of P. E. Schmid's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by P. E. Schmid with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites P. E. Schmid more than expected).
Fields of papers citing papers by P. E. Schmid
This network shows the impact of papers produced by P. E. Schmid. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by P. E. Schmid. The network helps show where P. E. Schmid may publish in the future.
Co-authorship network
The 25 scholars most cited alongside P. E. Schmid, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2005 | 47 | |
| 2 | 2005 | 24 | |
| 3 | 2002 | 17 | |
| 4 | 2000 | 82 | |
| 5 | 2000 | 144 | |
| 6 | 2000 | 55 | |
| 7 | 1999 | 212 | |
| 8 | 1998 | 90 | |
| 9 | 1998 | 57 | |
| 10 | 1998 | 4 | |
| 11 | Symmetry measure for the computer aided diagnosis of pigmented skin lesions | 1997 | 1 |
| 12 | 1997 | 35 | |
| 13 | 1996 | 5 | |
| 14 | 1996 | 40 | |
| 15 | 1993 | 2 | |
| 16 | 1990 | 32 | |
| 17 | 1990 | 3 | |
| 18 | 1984 | 10 | |
| 19 | 1982 | 22 | |
| 20 | 1981 | 46 |
About P. E. Schmid
P. E. Schmid is a scholar working on General Materials Science, Atomic and Molecular Physics, and Optics and Materials Chemistry, having authored 68 papers that have together received 5.6k indexed citations. Recurring topics across this work include Semiconductor materials and interfaces (20 papers), Metal and Thin Film Mechanics (12 papers), Semiconductor materials and devices (12 papers), Surface and Thin Film Phenomena (11 papers), Electronic and Structural Properties of Oxides (8 papers), Silicon and Solar Cell Technologies (8 papers), Ferroelectric and Piezoelectric Materials (7 papers) and ZnO doping and properties (6 papers). The work is most often cited by research in Renewable Energy, Sustainability and the Environment (2.1k citations), Materials Chemistry (3.4k citations) and Electrical and Electronic Engineering (2.1k citations). P. E. Schmid has collaborated with scholars based in Switzerland, United States and Japan. Frequent co-authors include Hongyu Tang, F. Lévy, R. Sanjinés, F. Lévy, K. Prasad, H. Berger, G. Bürri, H. Berger, A Bally and O. Banakh. Their work appears in journals such as Surface and Coatings Technology, Journal of Applied Physics, Thin Solid Films, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films and Journal of Physics D Applied Physics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.