P. E. Schmid

6.5k total citations · 3 hit papers
68 papers, 5.6k citations indexed

About

P. E. Schmid is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, P. E. Schmid has authored 68 papers receiving a total of 5.6k indexed citations (citations by other indexed papers that have themselves been cited), including 30 papers in Electrical and Electronic Engineering, 30 papers in Materials Chemistry and 28 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in P. E. Schmid's work include Semiconductor materials and interfaces (20 papers), Metal and Thin Film Mechanics (12 papers) and Semiconductor materials and devices (12 papers). P. E. Schmid is often cited by papers focused on Semiconductor materials and interfaces (20 papers), Metal and Thin Film Mechanics (12 papers) and Semiconductor materials and devices (12 papers). P. E. Schmid collaborates with scholars based in Switzerland, United States and France. P. E. Schmid's co-authors include Hongyu Tang, F. Lévy, R. Sanjinés, F. Lévy, K. Prasad, H. Berger, G. Bürri, H. Berger, A Bally and O. Banakh and has published in prestigious journals such as Physical Review Letters, Physical review. B, Condensed matter and Applied Physics Letters.

In The Last Decade

P. E. Schmid

68 papers receiving 5.4k citations

Hit Papers

Electrical and optical properties of TiO2 anatase thin films 1993 2026 2004 2015 1994 1993 1995 500 1000 1.5k

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
P. E. Schmid Switzerland 30 3.4k 2.1k 2.1k 726 610 68 5.6k
Beibei Xu China 32 2.0k 0.6× 814 0.4× 1.2k 0.6× 419 0.6× 176 0.3× 161 3.8k
Bin Li China 36 1.2k 0.3× 504 0.2× 1.4k 0.7× 339 0.5× 261 0.4× 185 4.5k
Jiyoung Kim South Korea 49 6.3k 1.8× 532 0.3× 6.2k 3.0× 885 1.2× 287 0.5× 360 9.7k
Yoshiki Shimizu Japan 40 3.3k 0.9× 546 0.3× 1.3k 0.6× 263 0.4× 617 1.0× 222 5.8k
Rong Chen China 44 5.4k 1.6× 3.0k 1.5× 5.0k 2.4× 360 0.5× 365 0.6× 302 9.4k
Masataka Imura Japan 48 5.4k 1.6× 2.4k 1.2× 4.5k 2.2× 444 0.6× 916 1.5× 276 10.0k
Zhuhua Zhang China 49 8.0k 2.3× 1.8k 0.9× 3.1k 1.5× 816 1.1× 146 0.2× 200 10.6k
Wei Yi China 32 2.6k 0.8× 470 0.2× 2.0k 1.0× 764 1.1× 144 0.2× 134 4.6k
Howard M. Branz United States 36 3.1k 0.9× 592 0.3× 4.3k 2.0× 713 1.0× 75 0.1× 210 5.5k
Bin Liu China 39 3.2k 0.9× 642 0.3× 3.3k 1.6× 879 1.2× 290 0.5× 408 6.2k

Countries citing papers authored by P. E. Schmid

Since Specialization
Citations

This map shows the geographic impact of P. E. Schmid's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by P. E. Schmid with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites P. E. Schmid more than expected).

Fields of papers citing papers by P. E. Schmid

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by P. E. Schmid. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by P. E. Schmid. The network helps show where P. E. Schmid may publish in the future.

Co-authorship network of co-authors of P. E. Schmid

This figure shows the co-authorship network connecting the top 25 collaborators of P. E. Schmid. A scholar is included among the top collaborators of P. E. Schmid based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with P. E. Schmid. P. E. Schmid is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Sanjinés, R., M. Benkahoul, C.S. Sandu, P. E. Schmid, & F. Lévy. (2005). Relationship between the physical and structural properties of NbzSiyNx thin films deposited by dc reactive magnetron sputtering. Journal of Applied Physics. 98(12). 24 indexed citations
2.
Sanjinés, R., M. Benkahoul, C.S. Sandu, P. E. Schmid, & F. Lévy. (2005). Electronic states and physical properties of hexagonal β-Nb2N and δ′-NbN nitrides. Thin Solid Films. 494(1-2). 190–195. 47 indexed citations
3.
Fischer, Stefan, et al.. (2002). Analysis of skin lesions with pigmented networks. Infoscience (Ecole Polytechnique Fédérale de Lausanne). 1. 323–326. 17 indexed citations
4.
Dumitriu, Daniela, A Bally, Christophe Ballif, et al.. (2000). Photocatalytic degradation of phenol by TiO2 thin films prepared by sputtering. Applied Catalysis B: Environmental. 25(2-3). 83–92. 144 indexed citations
5.
Székely, Gábor, Ch. Brechbühler, Jürg Dual, et al.. (2000). Virtual Reality-Based Simulation of Endoscopic Surgery. PRESENCE Virtual and Augmented Reality. 9(3). 310–333. 55 indexed citations
6.
Schmid, P. E.. (1999). Segmentation of digitized dermatoscopic images by two-dimensional color clustering. IEEE Transactions on Medical Imaging. 18(2). 164–171. 212 indexed citations
7.
Székely, Gábor J., Michael Bajka, Christian Brechbühler, et al.. (1999). Virtual reality based surgery simulation for endoscopic gynaecology.. PubMed. 62. 351–7. 21 indexed citations
8.
Bally, A, P. Hones, R. Sanjinés, P. E. Schmid, & F. Lévy. (1998). Mechanical and electrical properties of fcc TiO1+x thin films prepared by r.f. reactive sputtering. Surface and Coatings Technology. 108-109. 166–170. 57 indexed citations
9.
Schmid, P. E., et al.. (1998). Electrical and pyroelectric properties of lithium tantalate thin films. Ferroelectrics. 209(1). 471–482. 4 indexed citations
10.
Schmid, P. E.. (1997). Symmetry measure for the computer aided diagnosis of pigmented skin lesions. Infoscience (Ecole Polytechnique Fédérale de Lausanne). 998. 1 indexed citations
11.
Wu, Weiliang, P. E. Schmid, & F. Lévy. (1996). Structural and optical properties of Pd1−xInx thin films. Applied Surface Science. 92. 391–395. 5 indexed citations
12.
Rosenfeld, David, et al.. (1996). Electrical transport properties of thin-film metal-oxide-metal Nb2O5 oxygen sensors. Sensors and Actuators B Chemical. 37(1-2). 83–89. 40 indexed citations
13.
Catana, A., P. E. Schmid, M. Heintze, et al.. (1990). Atomic scale study of local TiSi2/Si epitaxies. Journal of Applied Physics. 67(4). 1820–1825. 32 indexed citations
14.
Catana, A., M. Heintze, P. E. Schmid, & PA Stadelmann. (1990). Atomic scale study of CoSi/Si (111) and CoSi2/Si (111) interfaces. Infoscience (Ecole Polytechnique Fédérale de Lausanne). 3 indexed citations
15.
Ho, P Shing, M. Liehr, P. E. Schmid, et al.. (1986). Schottky barrier, electronic states and microstructure at Ni silicide-silicon interfaces. Surface Science. 168(1-3). 184–192. 10 indexed citations
16.
Schmid, P. E., M. Liehr, F. K. LeGoues, & P Shing Ho. (1985). Schottky Barrier and Electronic States at Silicide-Silicon Interfaces. MRS Proceedings. 54. 5 indexed citations
17.
Liehr, M., P. E. Schmid, F. K. LeGoues, & P. S. Ho. (1985). Summary Abstract: Influence of interface quality on the Schottky barrier height in the epitaxial Ni-silicide/Si(111) system. Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena. 3(4). 1190–1191. 3 indexed citations
18.
Schmid, P. E. & H. Melchior. (1984). Coplanar flip-chip mounting technique for picosecond devices. Review of Scientific Instruments. 55(11). 1854–1858. 10 indexed citations
19.
Schmid, P. E., P Shing Ho, & T. Y. Tan. (1982). Summary Abstract: Correlation between Schottky barrier height and phase stoichiometry/structure of silicide–silicon interfaces. Journal of Vacuum Science and Technology. 20(3). 688–689. 22 indexed citations
20.
Schmid, P. E., P Shing Ho, H. Föll, & Gary W. Rubloff. (1981). Electronic states and atomic structure at the Pd2Si–Si interface. Journal of Vacuum Science and Technology. 18(3). 937–943. 46 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact

Rankless by CCL
2026