Thomas Siefke

891 citations
46 papers · 633 indexed · h-index 10

Impact in

Papers in

Thomas Siefke

40 papers receiving 602 citations

Peers

Thomas Siefke
Comparison fields: 5 of 64
  • Surfaces, Coatings and Films 142
  • Atomic and Molecular Physics, and Optics 225
  • Electronic, Optical and Magnetic Materials 131
  • Electrical and Electronic Engineering 265
  • Biomedical Engineering 198
Replace Jean-Benoît Claude with:
Jean-Benoît Claude France
Mohammad Jamali United States
Hui Pang China
A. Schirmacher Germany
A. Piegari Italy
Ali Belarouci France
R. Younkin United States
Hyeong-Do Kim South Korea
Aurélien Bruyant France
Xiumei Shao China
Thomas Siefke relative to Jean-Benoît Claude France Jean-Benoît Claude's profile →
Citations per field
00.5×1.5×2.3×
Jean-Benoît Claude · 1×
Citations per year

Countries citing papers authored by Thomas Siefke

Since Specialization
Citations

This map shows the geographic impact of Thomas Siefke's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Thomas Siefke with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Thomas Siefke more than expected).

Fields of papers citing papers by Thomas Siefke

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Thomas Siefke. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Thomas Siefke. The network helps show where Thomas Siefke may publish in the future.

Co-authors

The 25 scholars most cited alongside Thomas Siefke, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Thomas Siefke Line = papers co-authored together Thomas Siefke links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown
#Work
1 20250
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11 20224
12 20228
13 202116
14 20203
15 20204
16 20195
17 201963
18 20196
19 20171
20 20155

About Thomas Siefke

Thomas Siefke is a scholar working on Surfaces, Coatings and Films, Radiation, Electronic, Optical and Magnetic Materials, Electrical and Electronic Engineering and Atomic and Molecular Physics, and Optics, having authored 46 papers that have together received 633 indexed citations. Recurring topics across this work include Optical Coatings and Gratings (18 papers), Photonic and Optical Devices (12 papers), Plasmonic and Surface Plasmon Research (7 papers), Metamaterials and Metasurfaces Applications (6 papers), Advancements in Photolithography Techniques (5 papers), Thin-Film Transistor Technologies (5 papers), Laser-Plasma Interactions and Diagnostics (4 papers) and Laser-Matter Interactions and Applications (4 papers). The work is most often cited by research in Surfaces, Coatings and Films (142 citations), Atomic and Molecular Physics, and Optics (225 citations), Electronic, Optical and Magnetic Materials (131 citations), Electrical and Electronic Engineering (265 citations) and Biomedical Engineering (198 citations). Thomas Siefke has collaborated with scholars based in Germany, Czechia and Belgium. Frequent co-authors include Stefanie Kroker, Andreas Tünnermann, Ernst‐Bernhard Kley, Adriana Szeghalmi, Kay Dietrich, Daniel Franta, Ivan Ohlı́dal, Kristin Pfeiffer, Uwe D. Zeitner and Martin Heusinger. Their work appears in journals such as Optics Express, Optics Letters, Applied Physics Letters, Measurement Science and Technology and Communications Physics.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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