P. Mack

638 total citations
28 papers, 519 citations indexed

About

P. Mack is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Surfaces, Coatings and Films. According to data from OpenAlex, P. Mack has authored 28 papers receiving a total of 519 indexed citations (citations by other indexed papers that have themselves been cited), including 16 papers in Electrical and Electronic Engineering, 10 papers in Materials Chemistry and 9 papers in Surfaces, Coatings and Films. Recurrent topics in P. Mack's work include Electron and X-Ray Spectroscopy Techniques (8 papers), Semiconductor materials and devices (7 papers) and Ion-surface interactions and analysis (4 papers). P. Mack is often cited by papers focused on Electron and X-Ray Spectroscopy Techniques (8 papers), Semiconductor materials and devices (7 papers) and Ion-surface interactions and analysis (4 papers). P. Mack collaborates with scholars based in United Kingdom, Germany and United States. P. Mack's co-authors include Gregor Mori, John C. Walmsley, Otto Lunder, Kemal Nisancioḡl̄ū, Albert C. Kneissl, Gerald Luckeneder, Martin Fleischanderl, R.G. White, Jackie Wolstenholme and J. Donnelly and has published in prestigious journals such as Electrochimica Acta, Corrosion Science and Applied Surface Science.

In The Last Decade

P. Mack

26 papers receiving 505 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
P. Mack United Kingdom 12 346 160 75 60 57 28 519
S.H. Lee South Korea 12 247 0.7× 209 1.3× 47 0.6× 71 1.2× 33 0.6× 42 595
Haixing Zheng United States 13 392 1.1× 106 0.7× 60 0.8× 55 0.9× 7 0.1× 23 602
H.D. Shashikala India 20 784 2.3× 256 1.6× 57 0.8× 105 1.8× 41 0.7× 68 1.3k
Anna Elsukova Sweden 16 383 1.1× 192 1.2× 17 0.2× 58 1.0× 23 0.4× 42 616
Zhaoshun Gao China 18 466 1.3× 157 1.0× 51 0.7× 114 1.9× 13 0.2× 46 803
Randall G. Schmidt United States 14 266 0.8× 43 0.3× 28 0.4× 57 0.9× 13 0.2× 22 555
Chaogang Lou China 16 535 1.5× 374 2.3× 17 0.2× 46 0.8× 23 0.4× 77 730
Hengyong Wei China 14 264 0.8× 122 0.8× 21 0.3× 39 0.7× 92 1.6× 52 552
Chuan‐Hui Zhang China 14 396 1.1× 69 0.4× 37 0.5× 226 3.8× 109 1.9× 58 601
Liwei Zhang China 20 516 1.5× 306 1.9× 24 0.3× 111 1.9× 57 1.0× 93 968

Countries citing papers authored by P. Mack

Since Specialization
Citations

This map shows the geographic impact of P. Mack's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by P. Mack with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites P. Mack more than expected).

Fields of papers citing papers by P. Mack

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by P. Mack. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by P. Mack. The network helps show where P. Mack may publish in the future.

Co-authorship network of co-authors of P. Mack

This figure shows the co-authorship network connecting the top 25 collaborators of P. Mack. A scholar is included among the top collaborators of P. Mack based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with P. Mack. P. Mack is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
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Juodkazytė, Jurga, Benjaminas Šebeka, Irena Savickaja, et al.. (2014). Study on copper oxide stability in photoelectrochemical cell composed of nanostructured TiO2 and CuxO electrodes. Electrochimica Acta. 137. 363–371. 21 indexed citations
4.
Brüns, Michael, Philipp Brüner, Thomas Grehl, et al.. (2012). Structure and chemical composition of mixed benzylguanine‐ and methoxy‐terminated self‐assembled monolayers for immobilization of biomolecules. Surface and Interface Analysis. 44(8). 909–913. 12 indexed citations
5.
Hinder, Steven J., M. Audronis, V. Bellido-González, P. Mack, & Mark Baker. (2012). Surface characterisation of PET modified using a p‐DC or HIPIMS reactive sputter pre‐treatment. Surface and Interface Analysis. 44(8). 1063–1067.
6.
Zatsepin, D. A., P. Mack, A.E. Wright, Bernd Schmidt, & H.‐J. Fitting. (2011). XPS analysis and valence band structure of a low‐dimensional SiO2/Si system after Si+ ion implantation. physica status solidi (a). 208(7). 1658–1661. 27 indexed citations
7.
Nunney, Tim, P. Mack, Mark Wall, et al.. (2011). Characterizing a Liquid Repellent Nano-coating Using a Multi-Technique Approach. Microscopy and Microanalysis. 17(S2). 1216–1217. 1 indexed citations
8.
Gonçalves, Anne‐Marie, Muriel Bouttemy, C. Mathieu, et al.. (2010). An ARXPS study of the passivating layer formed on III‐V surface by an innovative anodic treatment in liquid ammonia. Surface and Interface Analysis. 42(6-7). 775–778. 4 indexed citations
9.
Luckeneder, Gerald, et al.. (2010). Chemistry of corrosion products on Zn–Al–Mg alloy coated steel. Corrosion Science. 52(10). 3271–3279. 159 indexed citations
10.
Mack, P., T. Walter, Dimitrios Hariskos, R. Schäffler, & B. Dimmler. (2009). Endurance Testing and Accelerated Ageing of CIGS Thin Film Solar Cells. EU PVSEC. 2439–2442. 2 indexed citations
11.
Saheli, Ghazal, G. Conti, M.A. Foad, et al.. (2008). Characterization of an ultrashallow junction structure using angle resolved x-ray photoelectron spectroscopy and medium energy ion scattering. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 26(1). 298–304. 6 indexed citations
12.
Mack, P., T. Walter, Robert Kniese, Dimitrios Hariskos, & R. Schäffler. (2008). Reverse Bias and Reverse Currents in CIGS Thin Film Solar Cells and Modules. EU PVSEC. 2156–2159. 8 indexed citations
13.
Mack, P., R.G. White, Jackie Wolstenholme, & Thierry Conard. (2005). The use of angle resolved XPS to measure the fractional coverage of high-k dielectric materials on silicon and silicon dioxide surfaces. Applied Surface Science. 252(23). 8270–8276. 30 indexed citations
14.
Mack, P.. (2005). The Use of Model Data to Characterize Depth Profile Generation from Angle Resolved XPS. AIP conference proceedings. 788. 112–118. 4 indexed citations
15.
Lunder, Otto, John C. Walmsley, P. Mack, & Kemal Nisancioḡl̄ū. (2004). Formation and characterisation of a chromate conversion coating on AA6060 aluminium. Corrosion Science. 47(7). 1604–1624. 92 indexed citations
16.
Szummer, A., M. Janik‐Czachor, P. Mack, & Marcin Pisarek. (2003). Electron Probe and Auger Electron Microprobe Characterization of Modified Cu-Based Amorphous Alloys. Microscopy and Microanalysis. 9(4). 359–367. 3 indexed citations
17.
Mack, P., et al.. (2003). Non‐destructive analysis of ultrathin dielectric films. Surface and Interface Analysis. 35(13). 1028–1033. 26 indexed citations
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19.
Janik‐Czachor, M., A. Szummer, J. Bukowska, et al.. (2002). Modification of surface activity of Cu-based amorphous alloys by chemical processes of metal degradation. Applied Catalysis A General. 235(1-2). 157–170. 20 indexed citations
20.
Donnelly, J., et al.. (2001). FOLLOW‐UP OF BREAST CANCER: TIME FOR A NEW APPROACH?. International Journal of Clinical Practice. 55(7). 431–433. 37 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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