J. Pétry

945 total citations
43 papers, 727 citations indexed

About

J. Pétry is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Materials Chemistry. According to data from OpenAlex, J. Pétry has authored 43 papers receiving a total of 727 indexed citations (citations by other indexed papers that have themselves been cited), including 32 papers in Electrical and Electronic Engineering, 11 papers in Atomic and Molecular Physics, and Optics and 9 papers in Materials Chemistry. Recurrent topics in J. Pétry's work include Semiconductor materials and devices (32 papers), Advancements in Semiconductor Devices and Circuit Design (16 papers) and Integrated Circuits and Semiconductor Failure Analysis (12 papers). J. Pétry is often cited by papers focused on Semiconductor materials and devices (32 papers), Advancements in Semiconductor Devices and Circuit Design (16 papers) and Integrated Circuits and Semiconductor Failure Analysis (12 papers). J. Pétry collaborates with scholars based in Belgium, United States and Netherlands. J. Pétry's co-authors include Wilfried Vandervorst, Thierry Conard, Noham Sebaïhi, Marc Heyns, Hiroshi Nohira, Stefan De Gendt, Jan Willem Maes, Wei‐Bor Tsai, W.F.A. Besling and Edward Young and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Journal of The Electrochemical Society.

In The Last Decade

J. Pétry

42 papers receiving 701 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
J. Pétry Belgium	14	374	363	97	86	63	43	727
M. M. Chirila United States	10	159 0.4×	340 0.9×	86 0.9×	112 1.3×	88 1.4×	19	561
Shanshan Du China	15	266 0.7×	582 1.6×	61 0.6×	89 1.0×	29 0.5×	29	728
Xiaojun Tan China	13	122 0.3×	183 0.5×	69 0.7×	156 1.8×	50 0.8×	52	658
Elena Rojas Spain	16	135 0.4×	283 0.8×	69 0.7×	280 3.3×	35 0.6×	24	712
Zilu Liu China	15	409 1.1×	433 1.2×	41 0.4×	70 0.8×	89 1.4×	41	747
Kun He China	15	272 0.7×	345 1.0×	46 0.5×	151 1.8×	33 0.5×	24	558
Lindsay C. C. Elliott United States	8	153 0.4×	178 0.5×	64 0.7×	181 2.1×	28 0.4×	9	434
Filippo Gambinossi Italy	14	128 0.3×	194 0.5×	54 0.6×	147 1.7×	58 0.9×	29	671
Haitao Yin China	13	239 0.6×	391 1.1×	143 1.5×	108 1.3×	111 1.8×	69	635
Kuo Qi China	12	277 0.7×	642 1.8×	90 0.9×	191 2.2×	130 2.1×	18	933

Countries citing papers authored by J. Pétry

Since Specialization

Citations

This map shows the geographic impact of J. Pétry's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Pétry with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Pétry more than expected).

Fields of papers citing papers by J. Pétry

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J. Pétry. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Pétry. The network helps show where J. Pétry may publish in the future.

Co-authorship network of co-authors of J. Pétry

This figure shows the co-authorship network connecting the top 25 collaborators of J. Pétry. A scholar is included among the top collaborators of J. Pétry based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with J. Pétry. J. Pétry is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Alasonati, Enrica, T. Caebergs, J. Pétry, et al.. (2020). Size measurement of silica nanoparticles by Asymmetric Flow Field-Flow Fractionation coupled to Multi-Angle Light Scattering: A comparison exercise between two metrological institutes. Journal of Chromatography A. 1638. 461859–461859. 9 indexed citations

Murugadoss, Sivakumar, Frédéric Brassinne, Noham Sebaïhi, et al.. (2020). Agglomeration of titanium dioxide nanoparticles increases toxicological responses in vitro and in vivo. Particle and Fibre Toxicology. 17(1). 10–10. 98 indexed citations

Murugadoss, Sivakumar, Sybille van den Brûle, Frédéric Brassinne, et al.. (2020). Is aggregated synthetic amorphous silica toxicologically relevant?. Particle and Fibre Toxicology. 17(1). 1–1. 47 indexed citations

Sebaïhi, Noham, et al.. (2017). Dimensional characterization of extracellular vesicles using atomic force microscopy. Measurement Science and Technology. 28(3). 34006–34006. 41 indexed citations

Qian, Jun, J. Pétry, Jean‐Pierre Kruth, et al.. (2012). Design of a sample approach mechanism for a metrological atomic force microscope. Measurement. 46(1). 739–746. 2 indexed citations

Qian, Jun, et al.. (2010). Design of a sample holder for a metrological atomic force microscope. Lirias (KU Leuven). 2 indexed citations

Boccardi, G., J. Pétry, G. Vellianitis, et al.. (2010). Multi-V<inf>T</inf> engineering in highly scaled CMOS bulk and FinFET devices through Ion Implantation into the metal gate stack featuring a 1.0nm EOT high-K oxide. 112–113. 4 indexed citations

Vellianitis, G., et al.. (2007). Reliability degradation of HfSiO gate dielectric layers: influence of nitridation. Microelectronic Engineering. 84(9-10). 1972–1975.

Pantisano, L., Anil Kottantharayil, J. Pétry, et al.. (2007). Reduction of the anomalous VT behavior in MOSFETs with high-κ/metal gate stacks. Microelectronic Engineering. 84(9-10). 1882–1885. 8 indexed citations

10.

Vellianitis, G., Z. M. Rittersma, & J. Pétry. (2006). Charge trapping in nitrided HfSiO gate dielectric layers. Applied Physics Letters. 89(9). 6 indexed citations

11.

Polspoel, W., Wilfried Vandervorst, J. Pétry, Thierry Conard, & A. Benedetti. (2005). Comparison of electric properties of ultra-thin thermal and plasma nitrided silicon oxides with different post-deposition treatments using C-AFM. Microelectronic Engineering. 80. 436–439. 6 indexed citations

12.

Pétry, J., et al.. (2005). On the data interpretation of the C-AFM measurements in the characterization of thin insulating layers. Microelectronics Reliability. 45(5-6). 815–818. 15 indexed citations

13.

Blasco, Xavier, M. Porti, M. Nafrı́a, et al.. (2005). Electrical characterization of high-dielectric-constant/SiO₂metal–oxide–semiconductor gate stacks by a conductive atomic force microscope. Nanotechnology. 16(9). 1506–1511. 7 indexed citations

14.

Blasco, Xavier, M. Nafrı́a, X. Aymerich, J. Pétry, & Wilfried Vandervorst. (2004). Breakdown spots of ultra-thin (EOT<1.5nm) HfO2/SiO2 stacks observed with enhanced—CAFM. Microelectronics Reliability. 45(5-6). 811–814. 10 indexed citations

15.

Elshocht, Sven Van, Matty Caymax, Stefan De Gendt, et al.. (2004). Composition and Growth Kinetics of the Interfacial Layer for MOCVD HfO[sub 2] Layers on Si Substrates. Journal of The Electrochemical Society. 151(4). F77–F77. 25 indexed citations

16.

Pétry, J., Wilfried Vandervorst, Olivier Richard, et al.. (2004). On the Nature of Weak Spots in High-k Layers Submitted to Anneals. MRS Proceedings. 811. 6 indexed citations

17.

Vandervorst, Wilfried, Bert Brijs, H. Bender, et al.. (2003). Physical characterization of ultrathin high k dielectrics. 40–50. 2 indexed citations

18.

Elshocht, Sven Van, Matty Caymax, Stefan De Gendt, et al.. (2002). Growth and Physical Properties of MOCVD-Deposited Hafnium Oxide Films and Their Properties on Silicon. MRS Proceedings. 745. 3 indexed citations

19.

Vandervorst, Wilfried, Bert Brijs, H. Bender, et al.. (2002). Physcial characterization of ultrathin high k dielectrics. MRS Proceedings. 745. 3 indexed citations

20.

Pétry, J., et al.. (1997). Ion mobility measurements of metal halide clusters. Zeitschrift für Physik D Atoms Molecules and Clusters. 40(1). 476–478. 13 indexed citations

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