M. Franosch
- Materials Chemistry
- Electrical and Electronic Engineering
- Mechanical Engineering top 10%
- Civil and Structural Engineering top 10%
- Biomedical Engineering
- Co-authors
- M. StrasserG. WachutkaRobert AignerC. LauterbachThomas F. SturmT.F. MeisterKlaus AufingerM. Wurzer
- Topics
- Radio Frequency Integrated Circuit Design (4 papers)Semiconductor materials and devices (4 papers)Advancements in Photolithography Techniques (2 papers)
- Journals
- Sensors and Actuators A PhysicalMicroelectronic EngineeringProceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
In The Last Decade
M. Franosch
14 papers receiving 446 citations
Peers
Comparison fields: 5 of 37
- Materials Chemistry 293
- Electrical and Electronic Engineering 237
- Mechanical Engineering 175
- Civil and Structural Engineering 141
- Biomedical Engineering 91
Countries citing papers authored by M. Franosch
This map shows the geographic impact of M. Franosch's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Franosch with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Franosch more than expected).
Fields of papers citing papers by M. Franosch
This network shows the impact of papers produced by M. Franosch. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Franosch. The network helps show where M. Franosch may publish in the future.
Co-authorship network of co-authors of M. Franosch
This figure shows the co-authorship network connecting the top 25 collaborators of M. Franosch. A scholar is included among the top collaborators of M. Franosch based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with M. Franosch. M. Franosch is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 2 | |
| 2 | 9 | |
| 3 | 1 | |
| 4 | 213 | |
| 5 | 19 | |
| 6 | 22 | |
| 7 | 10 | |
| 8 | 18 | |
| 9 | 175 | |
| 10 | Zwicker-tones for pure tone plus bandlimited noise | 1 |
| 11 | 2 | |
| 12 | In-Situ Doped Emitter-Polysilicon for 0.5 μm Silicon Bipolar Technology | 1 |
| 13 | 1 | |
| 14 | 6 |
About M. Franosch
M. Franosch is a scholar working on Electrical and Electronic Engineering, Condensed Matter Physics and Hardware and Architecture, having authored 14 papers that have together received 480 indexed citations. Recurring topics across this work include Radio Frequency Integrated Circuit Design (4 papers), Semiconductor materials and devices (4 papers) and Advancements in Photolithography Techniques (2 papers). The work is most often cited by research in Civil and Structural Engineering (141 citations), Materials Chemistry (293 citations) and Mechanical Engineering (175 citations). M. Franosch has collaborated with scholars based in Germany, Austria and Canada. Frequent co-authors include M. Strasser, G. Wachutka, Robert Aigner, C. Lauterbach, Thomas F. Sturm, T.F. Meister, Klaus Aufinger, M. Wurzer, J. Böck and S. Boguth. Their work appears in journals such as Sensors and Actuators A Physical, Microelectronic Engineering and Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.