E. Knapek

710 total citations
34 papers, 461 citations indexed

About

E. Knapek is a scholar working on Surfaces, Coatings and Films, Electrical and Electronic Engineering and Structural Biology. According to data from OpenAlex, E. Knapek has authored 34 papers receiving a total of 461 indexed citations (citations by other indexed papers that have themselves been cited), including 19 papers in Surfaces, Coatings and Films, 13 papers in Electrical and Electronic Engineering and 12 papers in Structural Biology. Recurrent topics in E. Knapek's work include Electron and X-Ray Spectroscopy Techniques (13 papers), Advanced Electron Microscopy Techniques and Applications (12 papers) and Advancements in Photolithography Techniques (8 papers). E. Knapek is often cited by papers focused on Electron and X-Ray Spectroscopy Techniques (13 papers), Advanced Electron Microscopy Techniques and Applications (12 papers) and Advancements in Photolithography Techniques (8 papers). E. Knapek collaborates with scholars based in Germany, Switzerland and United States. E. Knapek's co-authors include Jacques Dubochet, I. Dietrich, G. Lefranc, H. Formanek, T.W. Jeng, H.G. Heide, R. S. Simon, R. S. Raghavan, H.J. Körner and Michaël Abraham and has published in prestigious journals such as Nature, Journal of Molecular Biology and Physics Letters B.

In The Last Decade

E. Knapek

34 papers receiving 416 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
E. Knapek Germany 13 190 184 110 98 91 34 461
I. Dietrich Germany 11 121 0.6× 133 0.7× 70 0.6× 61 0.6× 56 0.6× 31 325
F. Thon Germany 6 151 0.8× 187 1.0× 98 0.9× 32 0.3× 52 0.6× 9 304
E.J. Kirkland United States 9 163 0.9× 222 1.2× 84 0.8× 122 1.2× 114 1.3× 23 434
V. R. Matricardi United States 7 103 0.5× 128 0.7× 40 0.4× 82 0.8× 22 0.2× 12 299
J. K. Weiss United States 10 217 1.1× 270 1.5× 99 0.9× 93 0.9× 135 1.5× 23 451
Gertrude F. Rempfer United States 14 478 2.5× 339 1.8× 63 0.6× 96 1.0× 263 2.9× 35 683
Göran A. Johansson Sweden 7 23 0.1× 129 0.7× 101 0.9× 46 0.5× 51 0.6× 8 469
T. Tomita Japan 10 119 0.6× 145 0.8× 41 0.4× 131 1.3× 76 0.8× 28 370
L. M. Welter United States 5 197 1.0× 196 1.1× 58 0.5× 95 1.0× 129 1.4× 8 388
A. Fukuhara Japan 11 49 0.3× 42 0.2× 63 0.6× 93 0.9× 104 1.1× 17 332

Countries citing papers authored by E. Knapek

Since Specialization
Citations

This map shows the geographic impact of E. Knapek's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by E. Knapek with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites E. Knapek more than expected).

Fields of papers citing papers by E. Knapek

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by E. Knapek. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by E. Knapek. The network helps show where E. Knapek may publish in the future.

Co-authorship network of co-authors of E. Knapek

This figure shows the co-authorship network connecting the top 25 collaborators of E. Knapek. A scholar is included among the top collaborators of E. Knapek based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with E. Knapek. E. Knapek is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Dubochet, Jacques & E. Knapek. (2018). Ups and downs in early electron cryo-microscopy. PLoS Biology. 16(4). e2005550–e2005550. 6 indexed citations
2.
Knapek, E., et al.. (2007). Unterhaching Power Plant and Overall System. 12 indexed citations
3.
Bertagnolli, E., et al.. (1996). Application of electron beam lithography for downscaling of SOI-bipolar and BiCMOS. Microelectronic Engineering. 30(1-4). 31–34. 1 indexed citations
4.
Knapek, E., et al.. (1995). Design, CAD-data generation and fabrication of diffractive lenses with submicron feature sizes. Microelectronic Engineering. 27(1-4). 175–178. 1 indexed citations
5.
Knapek, E., et al.. (1995). Efficiency enhancement of diffractive optical elements by variable relief profiling. Microelectronic Engineering. 27(1-4). 171–174. 3 indexed citations
6.
Knapek, E., et al.. (1994). CAMP-6, a deep-UV positive tone resist applied to E-beam exposure. Microelectronic Engineering. 23(1-4). 295–298. 2 indexed citations
7.
Knapek, E., et al.. (1994). High efficiency diffractive coupling lenses by three-dimensional profiling with electron-beam lithography and reactive ion etching. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 12(6). 3635–3638. 4 indexed citations
8.
Abraham, Michaël, et al.. (1994). Grid polarizer for the visible spectral region. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 2213. 288–288. 18 indexed citations
9.
Knapek, E., et al.. (1991). Computer aided proximity correction for direct write E-beam lithography. Microelectronic Engineering. 13(1-4). 181–184. 4 indexed citations
10.
Knapek, E., et al.. (1991). Proximity correction using computer aided proximity correction (CAPROX): Evaluation and application. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 9(6). 3043–3047. 8 indexed citations
11.
Franosch, M., et al.. (1991). Process latitude of positive and negative resist systems for direct write Ebeam lithography. Microelectronic Engineering. 13(1-4). 105–108. 1 indexed citations
12.
Brünner, Matthias, Karl‐Heinz Herrmann, A. Heuberger, et al.. (1989). Multi-Beam Concepts for Nanometer Devices. Japanese Journal of Applied Physics. 28(10R). 2058–2058. 3 indexed citations
13.
Knapek, E., H. Formanek, G. Lefranc, & I. Dietrich. (1984). The interpretation of radiation damage measurements with electron diffraction of organic materials at very low temperatures. Ultramicroscopy. 14(3). 253–263. 13 indexed citations
14.
Knapek, E., et al.. (1983). Superconducting Lenses for Steric Structure Determination of Organic Material in the Electron Microscope. Molecular crystals and liquid crystals. 96(1). 293–303. 1 indexed citations
15.
Knapek, E.. (1982). Properties of organic specimens and their supports at 4 K under irradiation in an electron microscope. Ultramicroscopy. 10(1-2). 71–86. 27 indexed citations
16.
Dubochet, Jacques, E. Knapek, & I. Dietrich. (1981). Reduction of beam damage by cryoprotection at 4 K. Ultramicroscopy. 6(1). 77–80. 21 indexed citations
17.
Knapek, E., et al.. (1981). Electron radiation damage of a thin protein crystal at 4 K. Ultramicroscopy. 6(1). 291–295. 4 indexed citations
18.
Knapek, E., et al.. (1981). Electron radiation damage of a thin protein crystal at 4 K. Ultramicroscopy. 6(3). 291–295. 26 indexed citations
19.
Knapek, E. & Jacques Dubochet. (1980). Beam damage to organic material is considerably reduced in cryo-electron microscopy. Journal of Molecular Biology. 141(2). 147–161. 101 indexed citations
20.
Knapek, E., R. S. Simon, R. S. Raghavan, & H.J. Körner. (1969). Nuclear g-factor of the 322 keV intruder state in 125Te. Physics Letters B. 29(9). 581–582. 14 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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