Hans W. P. Koops
- Surfaces, Coatings and Films top 0.5%
- Electrical and Electronic Engineering top 10%
- Structural Biology top 0.2%
- Computational Mechanics top 2%
- Biomedical Engineering top 10%
- Topics
- Electron and X-Ray Spectroscopy Techniques (29 papers)Advancements in Photolithography Techniques (19 papers)Advanced Electron Microscopy Techniques and Applications (19 papers)
- Journals
- Japanese Journal of Applied PhysicsNuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated EquipmentUltramicroscopy
- Partner nations
- GermanyJapanUnited States
In The Last Decade
Hans W. P. Koops
60 papers receiving 1.1k citations
Peers
Comparison fields: 5 of 40
- Surfaces, Coatings and Films 651
- Electrical and Electronic Engineering 601
- Structural Biology 493
- Computational Mechanics 430
- Biomedical Engineering 295
Countries citing papers authored by Hans W. P. Koops
This map shows the geographic impact of Hans W. P. Koops's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Hans W. P. Koops with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Hans W. P. Koops more than expected).
Fields of papers citing papers by Hans W. P. Koops
This network shows the impact of papers produced by Hans W. P. Koops. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Hans W. P. Koops. The network helps show where Hans W. P. Koops may publish in the future.
Co-authorship network of co-authors of Hans W. P. Koops
This figure shows the co-authorship network connecting the top 25 collaborators of Hans W. P. Koops. A scholar is included among the top collaborators of Hans W. P. Koops based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Hans W. P. Koops. Hans W. P. Koops is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 1 | |
| 2 | 1 | |
| 3 | 0 | |
| 4 | Miniaturized THz source with free-electron beams | 4 |
| 5 | 8 | |
| 6 | 1 | |
| 7 | 1 | |
| 8 | 15 | |
| 9 | 1 | |
| 10 | 6 | |
| 11 | 1 | |
| 12 | 4 | |
| 13 | 1 | |
| 14 | 115 | |
| 15 | 48 | |
| 16 | 2 | |
| 17 | 191 | |
| 18 | 8 | |
| 19 | 21 | |
| 20 | 44 |
About Hans W. P. Koops
Hans W. P. Koops is a scholar working on Structural Biology, Surfaces, Coatings and Films and Atomic and Molecular Physics, and Optics, having authored 64 papers that have together received 1.2k indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (29 papers), Advancements in Photolithography Techniques (19 papers) and Advanced Electron Microscopy Techniques and Applications (19 papers). The work is most often cited by research in Structural Biology (493 citations), Surfaces, Coatings and Films (651 citations) and Computational Mechanics (430 citations). Hans W. P. Koops has collaborated with scholars based in Germany, Japan and United States. Frequent co-authors include Johannes Kretz, M. Rudolph, M. Weber, D. P. Kern, T. H. Baum, A. Kaya, Τ. Tschudi, Jeffrey J. Urban, Wolfgang Elsäßer and F. Floreani. Their work appears in journals such as Japanese Journal of Applied Physics, Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment and Ultramicroscopy.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.