Hans W. P. Koops

1.5k total citations
64 papers, 1.2k citations indexed

About

Hans W. P. Koops is a scholar working on Surfaces, Coatings and Films, Electrical and Electronic Engineering and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, Hans W. P. Koops has authored 64 papers receiving a total of 1.2k indexed citations (citations by other indexed papers that have themselves been cited), including 39 papers in Surfaces, Coatings and Films, 38 papers in Electrical and Electronic Engineering and 23 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in Hans W. P. Koops's work include Electron and X-Ray Spectroscopy Techniques (29 papers), Advancements in Photolithography Techniques (19 papers) and Advanced Electron Microscopy Techniques and Applications (19 papers). Hans W. P. Koops is often cited by papers focused on Electron and X-Ray Spectroscopy Techniques (29 papers), Advancements in Photolithography Techniques (19 papers) and Advanced Electron Microscopy Techniques and Applications (19 papers). Hans W. P. Koops collaborates with scholars based in Germany, Japan and United States. Hans W. P. Koops's co-authors include Johannes Kretz, M. Rudolph, M. Weber, D. P. Kern, T. H. Baum, A. Kaya, Τ. Tschudi, Jeffrey J. Urban, Wolfgang Elsäßer and F. Floreani and has published in prestigious journals such as Japanese Journal of Applied Physics, Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment and Ultramicroscopy.

In The Last Decade

Hans W. P. Koops

60 papers receiving 1.1k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Hans W. P. Koops Germany 17 651 601 493 430 295 64 1.2k
M. Utlaut United States 15 232 0.4× 391 0.7× 189 0.4× 284 0.7× 200 0.7× 32 781
M. Takai Japan 19 316 0.5× 687 1.1× 99 0.2× 702 1.6× 281 1.0× 162 1.3k
Mikio Takai Japan 18 274 0.4× 687 1.1× 85 0.2× 414 1.0× 292 1.0× 129 1.2k
N Kato Japan 9 151 0.2× 270 0.4× 168 0.3× 87 0.2× 126 0.4× 22 537
R. Balboni Italy 16 117 0.2× 458 0.8× 179 0.4× 69 0.2× 257 0.9× 70 870
Fujio Wakaya Japan 15 143 0.2× 536 0.9× 86 0.2× 141 0.3× 286 1.0× 127 963
Ken Fujita Japan 18 163 0.3× 1.0k 1.7× 69 0.1× 124 0.3× 215 0.7× 54 1.3k
Thorsten Mehrtens Germany 16 238 0.4× 265 0.4× 258 0.5× 28 0.1× 154 0.5× 43 741
David F. Kyser United States 17 541 0.8× 1.3k 2.1× 39 0.1× 88 0.2× 304 1.0× 36 1.7k
Hisazo Kawakatsu Poland 11 217 0.3× 232 0.4× 73 0.1× 104 0.2× 76 0.3× 39 479

Countries citing papers authored by Hans W. P. Koops

Since Specialization
Citations

This map shows the geographic impact of Hans W. P. Koops's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Hans W. P. Koops with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Hans W. P. Koops more than expected).

Fields of papers citing papers by Hans W. P. Koops

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Hans W. P. Koops. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Hans W. P. Koops. The network helps show where Hans W. P. Koops may publish in the future.

Co-authorship network of co-authors of Hans W. P. Koops

This figure shows the co-authorship network connecting the top 25 collaborators of Hans W. P. Koops. A scholar is included among the top collaborators of Hans W. P. Koops based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Hans W. P. Koops. Hans W. P. Koops is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Koops, Hans W. P.. (2017). Hyper‐Giant‐Stromtragfähigkeit bei Raumtemperatur. Vakuum in Forschung und Praxis. 29(1). 29–33. 1 indexed citations
2.
Koops, Hans W. P. & Hiroshi Fukuda. (2014). Giant current density via indirect exciton orbit overlapping in polarized nano-granular materials. 84. 1–4. 1 indexed citations
3.
Koops, Hans W. P. & Hiroshi Fukuda. (2014). Room-temperature giant current density discovered in Koops-GranMat. 483. 204–205.
4.
Koops, Hans W. P., et al.. (2011). Miniaturized THz source with free-electron beams. 187–188. 4 indexed citations
5.
Edinger, Klaus, et al.. (2005). Investigation of a microtriode with a planar field emitter-extractor source fabricated by direct-write nanolithography using electron beam induced deposition. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 23(2). 781–785. 8 indexed citations
6.
Koops, Hans W. P.. (2005). Proposal of a miniaturized Orbitron pump for MEMS applications. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 5838. 38–38. 5 indexed citations
7.
8.
Koops, Hans W. P., et al.. (2000). Determination of the refractive index of photonic-crystal material from scattering measurements. 321–321. 1 indexed citations
9.
Babin, S. & Hans W. P. Koops. (1996). Three-dimensional electron-beam lithography using an all-dry resist process. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 14(6). 3860–3863. 6 indexed citations
10.
Koops, Hans W. P., et al.. (1996). Evaluation of the dry resist Vinyl-T8 and ist application to optical microlenses. Microelectronic Engineering. 30(1-4). 539–542. 4 indexed citations
11.
Koops, Hans W. P., et al.. (1996). Three-dimensional additive electron beam lithography. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 2780. 388–388. 1 indexed citations
12.
Koops, Hans W. P., A. Kaya, & M. Weber. (1995). Fabrication and characterization of platinum nanocrystalline material grown by electron-beam induced deposition. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 13(6). 2400–2403. 115 indexed citations
13.
Weber, M., Hans W. P. Koops, M. Rudolph, Johannes Kretz, & G. Schmidt. (1995). New compound quantum dot materials produced by electron-beam induced deposition. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 13(3). 1364–1368. 48 indexed citations
14.
Weber, M., M. Rudolph, Johannes Kretz, & Hans W. P. Koops. (1995). Electron-beam induced deposition for fabrication of vacuum field emitter devices. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 13(2). 461–464. 34 indexed citations
15.
Koops, Hans W. P., et al.. (1994). Characterization and Application of Materials Grown by Electron-Beam-Induced Deposition. Japanese Journal of Applied Physics. 33(12S). 7099–7099. 191 indexed citations
16.
Koops, Hans W. P., et al.. (1994). Combined lithographies for the reduction of stitching errors in lithography. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 12(6). 3265–3269. 2 indexed citations
17.
Koops, Hans W. P., et al.. (1994). Metrology-chip for measurement of diameter and astigmatism of an electron beam with nm resolution using moiré amplification. Microelectronic Engineering. 23(1-4). 387–390. 1 indexed citations
18.
Knapek, E., et al.. (1991). Proximity correction using computer aided proximity correction (CAPROX): Evaluation and application. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 9(6). 3043–3047. 8 indexed citations
19.
Vladimirsky, Yuli & Hans W. P. Koops. (1988). Moiré method and zone plate pattern inaccuracies. Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena. 6(6). 2142–2146. 21 indexed citations
20.
Koops, Hans W. P., et al.. (1986). Electron beam decomposition of carbonyls on silicon. Microelectronic Engineering. 5(1-4). 423–430. 44 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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