Jon Orloff

About

Jon Orloff is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films and Computational Mechanics. According to data from OpenAlex, Jon Orloff has authored 30 papers receiving a total of 1.2k indexed citations (citations by other indexed papers that have themselves been cited), including 17 papers in Electrical and Electronic Engineering, 15 papers in Surfaces, Coatings and Films and 9 papers in Computational Mechanics. Recurrent topics in Jon Orloff’s work include Electron and X-Ray Spectroscopy Techniques (15 papers), Ion-surface interactions and analysis (9 papers) and Integrated Circuits and Semiconductor Failure Analysis (7 papers). Jon Orloff is often cited by papers focused on Electron and X-Ray Spectroscopy Techniques (15 papers), Ion-surface interactions and analysis (9 papers) and Integrated Circuits and Semiconductor Failure Analysis (7 papers). Jon Orloff collaborates with scholars based in United States, China and Australia. Jon Orloff's co-authors include L. W. Swanson, M. Utlaut, Chandrabhas Narayana, Arthur L. Ruoff, Huan Luo, Jabez J. McClelland, Xuefeng Liu, A. Kutyrev, Samuel H. Moseley and J. Melngailis and has published in prestigious journals such as Nature, Nano Letters and Review of Scientific Instruments.

In The Last Decade

Co-authorship network of co-authors of Jon Orloff i

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Fields of papers citing papers by Jon Orloff

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Jon Orloff. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jon Orloff. The network helps show where Jon Orloff may publish in the future.

Countries citing papers authored by Jon Orloff

Since Specialization

Citations

This map shows the geographic impact of Jon Orloff's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jon Orloff with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jon Orloff more than expected).

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar’s output or impact.

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