Jon Orloff
- Structural Biology top 2%
- Advanced Electron Microscopy Techniques and Applications 6
- Surfaces, Coatings and Films top 5%
- Electron and X-Ray Spectroscopy Techniques 14
- Computational Mechanics top 5%
- Ion-surface interactions and analysis 10
- Geophysics top 10%
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- Integrated Circuits and Semiconductor Failure Analysis 7
- Advancements in Photolithography Techniques 3
- Electrohydrodynamics and Fluid Dynamics 3
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- Mass Spectrometry Techniques and Applications 4
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- Diamond and Carbon-based Materials Research 3
Jon Orloff
30 papers receiving 900 citations
Peers
Comparison fields: 5 of 68
- Structural Biology 133
- Surfaces, Coatings and Films 137
- Computational Mechanics 348
- Geophysics 192
- Atomic and Molecular Physics, and Optics 290
Countries citing papers authored by Jon Orloff
This map shows the geographic impact of Jon Orloff's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jon Orloff with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jon Orloff more than expected).
Fields of papers citing papers by Jon Orloff
This network shows the impact of papers produced by Jon Orloff. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jon Orloff. The network helps show where Jon Orloff may publish in the future.
Co-authorship network
The 25 scholars most cited alongside Jon Orloff, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2011 | 1 | |
| 2 | A Focused Chromium Ion Beam | NIST | 2010 | 1 |
| 3 | 2010 | 9 | |
| 4 | 2008 | 47 | |
| 5 | 2003 | 2 | |
| 6 | 2003 | 9 | |
| 7 | 2003 | 1 | |
| 8 | 2000 | 8 | |
| 9 | 2000 | 9 | |
| 10 | 1999 | 11 | |
| 11 | 1999 | 6 | |
| 12 | 1998 | 202 | |
| 13 | 1998 | 1 | |
| 14 | 1998 | 1 | |
| 15 | 1997 | 11 | |
| 16 | 1996 | 3 | |
| 17 | 1996 | 70 | |
| 18 | 1995 | 1 | |
| 19 | 1990 | 5 | |
| 20 | 1987 | 3 |
About Jon Orloff
Jon Orloff is a scholar working on Structural Biology, Surfaces, Coatings and Films, Computational Mechanics, Electrical and Electronic Engineering and Instrumentation, having authored 30 papers that have together received 950 indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (14 papers), Ion-surface interactions and analysis (10 papers), Integrated Circuits and Semiconductor Failure Analysis (7 papers), Advanced Electron Microscopy Techniques and Applications (6 papers), Mass Spectrometry Techniques and Applications (4 papers), Advancements in Photolithography Techniques (3 papers), Electrohydrodynamics and Fluid Dynamics (3 papers) and Diamond and Carbon-based Materials Research (3 papers). The work is most often cited by research in Structural Biology (133 citations), Surfaces, Coatings and Films (137 citations), Computational Mechanics (348 citations), Geophysics (192 citations) and Atomic and Molecular Physics, and Optics (290 citations). Jon Orloff has collaborated with scholars based in United States, Australia and China. Frequent co-authors include L. W. Swanson, M. Utlaut, Chandrabhas Narayana, Arthur L. Ruoff, Huan Luo, Jabez J. McClelland, Xuefeng Liu, A. Kutyrev, Samuel H. Moseley and Klaus Edinger. Their work appears in journals such as Microelectronic Engineering, Review of Scientific Instruments, Ultramicroscopy, Scientific American and International Journal of Mass Spectrometry.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.