Jonghoon J. Kim
- Electrical and Electronic Engineering top 10%
- Aerospace Engineering
- Biomedical Engineering
- Automotive Engineering top 10%
- Media Technology top 10%
- Topics
- 3D IC and TSV technologies (31 papers)Electromagnetic Compatibility and Noise Suppression (18 papers)Energy Harvesting in Wireless Networks (16 papers)
- Journals
- IEEE Transactions on Microwave Theory and TechniquesIEEE Microwave and Wireless Components LettersIEEE Transactions on Electromagnetic Compatibility
- Partner nations
- South KoreaUnited StatesItaly
In The Last Decade
Jonghoon J. Kim
50 papers receiving 539 citations
Peers
Comparison fields: 5 of 29
- Electrical and Electronic Engineering 536
- Aerospace Engineering 81
- Biomedical Engineering 77
- Automotive Engineering 57
- Media Technology 55
Countries citing papers authored by Jonghoon J. Kim
This map shows the geographic impact of Jonghoon J. Kim's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jonghoon J. Kim with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jonghoon J. Kim more than expected).
Fields of papers citing papers by Jonghoon J. Kim
This network shows the impact of papers produced by Jonghoon J. Kim. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jonghoon J. Kim. The network helps show where Jonghoon J. Kim may publish in the future.
Co-authorship network of co-authors of Jonghoon J. Kim
This figure shows the co-authorship network connecting the top 25 collaborators of Jonghoon J. Kim. A scholar is included among the top collaborators of Jonghoon J. Kim based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Jonghoon J. Kim. Jonghoon J. Kim is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 0 | |
| 2 | 12 | |
| 3 | 1 | |
| 4 | 6 | |
| 5 | 47 | |
| 6 | 12 | |
| 7 | 5 | |
| 8 | 37 | |
| 9 | 2 | |
| 10 | 5 | |
| 11 | 1 | |
| 12 | 5 | |
| 13 | 1 | |
| 14 | 4 | |
| 15 | 6 | |
| 16 | 3 | |
| 17 | 4 | |
| 18 | 2 | |
| 19 | 5 | |
| 20 | 21 |
About Jonghoon J. Kim
Jonghoon J. Kim is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Media Technology, having authored 52 papers that have together received 552 indexed citations. Recurring topics across this work include 3D IC and TSV technologies (31 papers), Electromagnetic Compatibility and Noise Suppression (18 papers) and Energy Harvesting in Wireless Networks (16 papers). The work is most often cited by research in Electrical and Electronic Engineering (536 citations), Media Technology (55 citations) and Automotive Engineering (57 citations). Jonghoon J. Kim has collaborated with scholars based in South Korea, United States and Italy. Frequent co-authors include Joungho Kim, D. Jung, Sunkyu Kong, Sukjin Kim, Bumhee Bae, Heegon Kim, Chiuk Song, Seungyoung Ahn, Hongseok Kim and Jonghoon Kim. Their work appears in journals such as IEEE Transactions on Microwave Theory and Techniques, IEEE Microwave and Wireless Components Letters and IEEE Transactions on Electromagnetic Compatibility.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.