Jeffrey Lam
- Structural Biology top 10%
- Hardware and Architecture top 10%
- VLSI and Analog Circuit Testing 13
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- Integrated Circuits and Semiconductor Failure Analysis 58
- Semiconductor materials and devices 24
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- Electron and X-Ray Spectroscopy Techniques 17
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- Force Microscopy Techniques and Applications 10
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- Ion-surface interactions and analysis 11
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- Copper Interconnects and Reliability 9
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- Advanced Surface Polishing Techniques 9
- Journals
- Microelectronics Reliability (4 papers)Journal of Vacuum Science & Technology A Vacuum Surfaces and Films (3 papers)AIP Advances (3 papers)
- Partner nations
- SingaporeUnited StatesGermany
In The Last Decade
Jeffrey Lam
64 papers receiving 242 citations
Peers
Comparison fields: 5 of 42
- Structural Biology 13
- Hardware and Architecture 35
- Electrical and Electronic Engineering 195
- Surfaces, Coatings and Films 21
- Atomic and Molecular Physics, and Optics 78
Countries citing papers authored by Jeffrey Lam
This map shows the geographic impact of Jeffrey Lam's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jeffrey Lam with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jeffrey Lam more than expected).
Fields of papers citing papers by Jeffrey Lam
This network shows the impact of papers produced by Jeffrey Lam. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jeffrey Lam. The network helps show where Jeffrey Lam may publish in the future.
Co-authorship network
The 25 scholars most cited alongside Jeffrey Lam, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2024 | 0 | |
| 2 | 2024 | 1 | |
| 3 | 2022 | 4 | |
| 4 | 2018 | 1 | |
| 5 | 2018 | 12 | |
| 6 | 2018 | 2 | |
| 7 | 2017 | 3 | |
| 8 | 2017 | 2 | |
| 9 | 2017 | 1 | |
| 10 | 2017 | 3 | |
| 11 | 2015 | 7 | |
| 12 | 2015 | 1 | |
| 13 | 2015 | 1 | |
| 14 | 2015 | 7 | |
| 15 | 2014 | 7 | |
| 16 | 2014 | 3 | |
| 17 | 2014 | 2 | |
| 18 | 2012 | 4 | |
| 19 | 2012 | 5 | |
| 20 | 2007 | 1 |
About Jeffrey Lam
Jeffrey Lam is a scholar working on Structural Biology, Surfaces, Coatings and Films, Hardware and Architecture, Electrical and Electronic Engineering and Industrial and Manufacturing Engineering, having authored 76 papers that have together received 261 indexed citations. Recurring topics across this work include Integrated Circuits and Semiconductor Failure Analysis (58 papers), Semiconductor materials and devices (24 papers), Electron and X-Ray Spectroscopy Techniques (17 papers), VLSI and Analog Circuit Testing (13 papers), Ion-surface interactions and analysis (11 papers), Force Microscopy Techniques and Applications (10 papers), Copper Interconnects and Reliability (9 papers) and Advanced Surface Polishing Techniques (9 papers). The work is most often cited by research in Structural Biology (13 citations), Hardware and Architecture (35 citations), Electrical and Electronic Engineering (195 citations), Surfaces, Coatings and Films (21 citations) and Atomic and Molecular Physics, and Optics (78 citations). Jeffrey Lam has collaborated with scholars based in Singapore, United States and Germany. Frequent co-authors include Zhihong Mai, P.K. Tan, S.L. Toh, M. K. Dawood, L. C. Hsia, Handong Sun, H. Tan, Zexiang Shen, Fan Zhang and Lin Zhao. Their work appears in journals such as Microelectronics Reliability, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, AIP Advances, IEEE Transactions on Device and Materials Reliability and Japanese Journal of Applied Physics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.