Patrick J. Paniez
- Electrical and Electronic Engineering
- Biomedical Engineering
- Surfaces, Coatings and Films top 10%
- Materials Chemistry
- Electronic, Optical and Magnetic Materials
- Co-authors
- O. JoubertM. PonsJacques PelletierR. PantelC. RosilioPascal DubosB. PannetierB. Dal’zotto
- Topics
- Advancements in Photolithography Techniques (33 papers)Nanofabrication and Lithography Techniques (14 papers)Semiconductor materials and devices (12 papers)
- Partner nations
- FranceUnited StatesSwitzerland
In The Last Decade
Patrick J. Paniez
51 papers receiving 304 citations
Peers
Comparison fields: 5 of 37
- Electrical and Electronic Engineering 240
- Biomedical Engineering 133
- Surfaces, Coatings and Films 67
- Materials Chemistry 53
- Electronic, Optical and Magnetic Materials 53
Countries citing papers authored by Patrick J. Paniez
This map shows the geographic impact of Patrick J. Paniez's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Patrick J. Paniez with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Patrick J. Paniez more than expected).
Fields of papers citing papers by Patrick J. Paniez
This network shows the impact of papers produced by Patrick J. Paniez. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Patrick J. Paniez. The network helps show where Patrick J. Paniez may publish in the future.
Co-authorship network of co-authors of Patrick J. Paniez
This figure shows the co-authorship network connecting the top 25 collaborators of Patrick J. Paniez. A scholar is included among the top collaborators of Patrick J. Paniez based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Patrick J. Paniez. Patrick J. Paniez is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 8 | |
| 2 | 1 | |
| 3 | 14 | |
| 4 | 11 | |
| 5 | 5 | |
| 6 | 4 | |
| 7 | 14 | |
| 8 | 5 | |
| 9 | 1 | |
| 10 | 1 | |
| 11 | 16 | |
| 12 | 2 | |
| 13 | 24 | |
| 14 | 2 | |
| 15 | 2 | |
| 16 | 7 | |
| 17 | 2 | |
| 18 | 0 | |
| 19 | 3 | |
| 20 | 5 |
About Patrick J. Paniez
Patrick J. Paniez is a scholar working on Surfaces, Coatings and Films, Electrical and Electronic Engineering and Electronic, Optical and Magnetic Materials, having authored 54 papers that have together received 333 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (33 papers), Nanofabrication and Lithography Techniques (14 papers) and Semiconductor materials and devices (12 papers). The work is most often cited by research in Surfaces, Coatings and Films (67 citations), Electrical and Electronic Engineering (240 citations) and Biomedical Engineering (133 citations). Patrick J. Paniez has collaborated with scholars based in France, United States and Switzerland. Frequent co-authors include O. Joubert, M. Pons, Jacques Pelletier, R. Pantel, C. Rosilio, Pascal Dubos, B. Pannetier, B. Dal’zotto, C. Clarisse and G. Hollinger. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics and Journal of The Electrochemical Society.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.