Michael Stockinger
Impact in
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- Electrostatic Discharge in Electronics
- Integrated Circuits and Semiconductor Failure Analysis
- Electromagnetic Compatibility and Noise Suppression
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Silicon Carbide Semiconductor Technologies
- 3D IC and TSV technologies
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- Physical Unclonable Functions (PUFs) and Hardware Security
Papers in
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- Physical Unclonable Functions (PUFs) and Hardware Security 2
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- Electrostatic Discharge in Electronics 24
- Integrated Circuits and Semiconductor Failure Analysis 20
- Electromagnetic Compatibility and Noise Suppression 16
- Semiconductor materials and devices 8
- Advancements in Semiconductor Devices and Circuit Design 7
- Silicon Carbide Semiconductor Technologies 3
- Co-authors
- James W. MillerVishnu KamatS. SelberherrElyse RosenbaumAndreas WildJames M. L. MillerVincent Heath WhitneyDaryl G. Beetner
- Journals
- Microelectronics Reliability (2 papers)Journal of Electrostatics (2 papers)IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (1 paper)IEEE Transactions on Electromagnetic Compatibility (1 paper)Applied Physics A (1 paper)
- Partner nations
- United StatesAustriaItaly
In The Last Decade
Michael Stockinger
30 papers receiving 252 citations
Peers
Comparison fields: 5 of 14
- Electrical and Electronic Engineering 347
- Hardware and Architecture 23
- Computational Theory and Mathematics 4
- Materials Chemistry 11
- Numerical Analysis 1
Countries citing papers authored by Michael Stockinger
This map shows the geographic impact of Michael Stockinger's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Michael Stockinger with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Michael Stockinger more than expected).
Fields of papers citing papers by Michael Stockinger
This network shows the impact of papers produced by Michael Stockinger. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Michael Stockinger. The network helps show where Michael Stockinger may publish in the future.
Co-authorship network
The 19 scholars most cited alongside Michael Stockinger, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2017 | 10 | |
| 2 | 2015 | 5 | |
| 3 | Device interactions between ESD diodes and NMOS clamps in CMOS processes | 2014 | 2 |
| 4 | 2014 | 3 | |
| 5 | An active MOSFET rail clamp network for component and system level protection | 2013 | 18 |
| 6 | Investigation of product burn-in failures due to powered NPN bipolar latching of active MOSFET rail clamps | 2013 | 9 |
| 7 | A CDM robust 5V distributed ESD clamp network leveraging both active MOS and lateral NPN conduction | 2011 | 15 |
| 8 | When good trigger circuits go bad: A case history | 2011 | 7 |
| 9 | CDM protection design for CMOS applications using RC-triggered rail clamps | 2009 | 20 |
| 10 | 2007 | 9 | |
| 11 | Comprehensive ESD protection for flip-chip products in a dual gate oxide 65nm CMOS technology | 2006 | 10 |
| 12 | Characterization and modeling of three CMOS diode structures in the CDM to HBM timeframe | 2006 | 35 |
| 13 | 2006 | 1 | |
| 14 | ESD protection for advanced CMOS SOI technologies | 2005 | 11 |
| 15 | 2004 | 10 | |
| 16 | Boosted and distributed rail clamp networks for ESD protection in advanced CMOS technologies | 2003 | 73 |
| 17 | Automatic Device Design Optimization with TCAD Frameworks | 2000 | 1 |
| 18 | Closed-Loop MOSFET Doping Profile Optimization for Portable Systems | 1999 | 7 |
| 19 | Closed-Loop CMOS Gate Delay Time Optimization | 1999 | 1 |
| 20 | 1999 | 7 |
About Michael Stockinger
Michael Stockinger is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering, Industrial and Manufacturing Engineering, Computer Networks and Communications and Materials Chemistry, having authored 32 papers that have together received 351 indexed citations. Recurring topics across this work include Electrostatic Discharge in Electronics (24 papers), Integrated Circuits and Semiconductor Failure Analysis (20 papers), Electromagnetic Compatibility and Noise Suppression (16 papers), Semiconductor materials and devices (8 papers), Advancements in Semiconductor Devices and Circuit Design (7 papers), Silicon Carbide Semiconductor Technologies (3 papers), High voltage insulation and dielectric phenomena (2 papers) and Physical Unclonable Functions (PUFs) and Hardware Security (2 papers). The work is most often cited by research in Electrical and Electronic Engineering (347 citations), Hardware and Architecture (23 citations), Computational Theory and Mathematics (4 citations), Materials Chemistry (11 citations) and Numerical Analysis (1 citation). Michael Stockinger has collaborated with scholars based in United States, Austria and Italy. Frequent co-authors include James W. Miller, Vishnu Kamat, S. Selberherr, Elyse Rosenbaum, Andreas Wild, James M. L. Miller, Vincent Heath Whitney, Daryl G. Beetner, Reto J. Strasser and David Pommerenke. Their work appears in journals such as Microelectronics Reliability, Journal of Electrostatics, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on Electromagnetic Compatibility and Applied Physics A.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.