H. B. Elswijk

652 total citations
22 papers, 525 citations indexed

About

H. B. Elswijk is a scholar working on Atomic and Molecular Physics, and Optics, Materials Chemistry and Electrical and Electronic Engineering. According to data from OpenAlex, H. B. Elswijk has authored 22 papers receiving a total of 525 indexed citations (citations by other indexed papers that have themselves been cited), including 13 papers in Atomic and Molecular Physics, and Optics, 8 papers in Materials Chemistry and 6 papers in Electrical and Electronic Engineering. Recurrent topics in H. B. Elswijk's work include Surface and Thin Film Phenomena (11 papers), Electron and X-Ray Spectroscopy Techniques (5 papers) and Force Microscopy Techniques and Applications (4 papers). H. B. Elswijk is often cited by papers focused on Surface and Thin Film Phenomena (11 papers), Electron and X-Ray Spectroscopy Techniques (5 papers) and Force Microscopy Techniques and Applications (4 papers). H. B. Elswijk collaborates with scholars based in Netherlands, Finland and United States. H. B. Elswijk's co-authors include E. J. van Loenen, Harold J. W. Zandvliet, D. Dijkkamp, I. S. T. Tsong, J. Th. M. De Hosson, Sander van Smaalen, J. L. de Boer, R. W. J. Hollering, Bene Poelsema and A. van Silfhout and has published in prestigious journals such as Physical Review Letters, Physical review. B, Condensed matter and Applied Physics Letters.

In The Last Decade

H. B. Elswijk

21 papers receiving 498 citations

Peers

H. B. Elswijk

AMPO

EEE

Takahisa Doi Japan

William E. Packard United States

J. Frohn Germany

Gregory J. Whaley United States

M. A. Lutz United States

Silva K. Theiss United States

J.M. Bermond France

Kimihiro Ohta Poland

James McLean United States

K. D. Jamison United States

Takahisa Doi Japan

H. B. Elswijk

336 ×0.9

AMPO

136 ×0.9

EEE

88 ×0.6

93 ×1.0

68 ×0.8

Citations per year, relative to H. B. Elswijk H. B. Elswijk (= 1×) peers Takahisa Doi

Countries citing papers authored by H. B. Elswijk

Since Specialization

Citations

This map shows the geographic impact of H. B. Elswijk's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by H. B. Elswijk with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites H. B. Elswijk more than expected).

Fields of papers citing papers by H. B. Elswijk

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by H. B. Elswijk. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by H. B. Elswijk. The network helps show where H. B. Elswijk may publish in the future.

Co-authorship network of co-authors of H. B. Elswijk

This figure shows the co-authorship network connecting the top 25 collaborators of H. B. Elswijk. A scholar is included among the top collaborators of H. B. Elswijk based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with H. B. Elswijk. H. B. Elswijk is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

Sort: Min cites: Since: Top N: Style:

20 of 20 papers shown

Elswijk, H. B., et al.. (1995). Energy broadening by Coulomb interactions of an electron beam emitted from a point source. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 13(3). 1037–1043.

Zandvliet, Harold J. W., Bene Poelsema, & H. B. Elswijk. (1995). Fluctuations of monatomic steps on Si(001). Physical review. B, Condensed matter. 51(8). 5465–5468. 19 indexed citations

Schiller, Christoph, et al.. (1995). Decapitation of tungsten field emitter tips during sputter sharpening. Surface Science. 339(3). L925–L930. 18 indexed citations

Zandvliet, Harold J. W., et al.. (1993). Why monatomic steps on Si(001) are always rough. Physical Review Letters. 70(14). 2122–2125. 28 indexed citations

Zandvliet, Harold J. W. & H. B. Elswijk. (1993). Morphology of monatomic step edges on vicinal Si(001). Physical review. B, Condensed matter. 48(19). 14269–14275. 29 indexed citations

Elswijk, H. B. & E. J. van Loenen. (1992). Chemisorption and kinetics of Sb on Si(001). Ultramicroscopy. 42-44. 884–888. 7 indexed citations

Zandvliet, Harold J. W., H. B. Elswijk, & E. J. van Loenen. (1992). Surface dynamics of monoatomic steps on Si(001) studied with a high temperature scanning tunneling microscope. Surface Science. 272(1-3). 264–268. 46 indexed citations

Zandvliet, Harold J. W., H. B. Elswijk, E. J. van Loenen, & D. Dijkkamp. (1992). Equilibrium structure of monatomic steps on vicinal Si(001). Physical review. B, Condensed matter. 45(11). 5965–5968. 81 indexed citations

Zandvliet, Harold J. W., H. B. Elswijk, E. J. van Loenen, & I. S. T. Tsong. (1992). Scanning tunneling microscopy and spectroscopy of ion-bombarded Si(111) and Si(100) surfaces. Physical review. B, Condensed matter. 46(12). 7581–7587. 96 indexed citations

10.

Elswijk, H. B., D. Dijkkamp, & E. J. van Loenen. (1991). Geometric and electronic structure of Sb on Si(111) by scanning tunneling microscopy. Physical review. B, Condensed matter. 44(8). 3802–3809. 72 indexed citations

11.

Zandvliet, Harold J. W., H. B. Elswijk, D. Dijkkamp, E. J. van Loenen, & J. Dieleman. (1991). On the period of reflection high-energy electron diffraction intensity oscillations during Si molecular-beam epitaxy on vicinal Si(001). Journal of Applied Physics. 70(5). 2614–2617. 17 indexed citations

12.

Hollering, R. W. J., D. Dijkkamp, & H. B. Elswijk. (1991). Optical second-harmonic generation on a vicinal Si(111) surface. Surface Science. 243(1-3). 121–126. 19 indexed citations

13.

Elswijk, H. B., A. J. Hoeven, E. J. van Loenen, & D. Dijkkamp. (1991). A model for Si molecular-beam epitaxy based on scanning tunneling microscopy observations and computer simulations. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 9(2). 451–456. 25 indexed citations

14.

Melmed, A.J., et al.. (1990). Simulation of field-ion-microscope images for the Al-Mn icosahedral phase. Philosophical Magazine B. 61(5). 811–827. 4 indexed citations

15.

Schneir, J., John A. Dagata, H. H. Harary, et al.. (1989). Scanning Tunneling Microscopy Of Optical Surfaces. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 1164. 112–112. 5 indexed citations

16.

Camus, Paula, H. B. Elswijk, & A.J. Melmed. (1989). OXYGEN CONCENTRATION OF Eu₁ Ba₂ Cu₃ O_7-x IN VACUUM : AN ATOM PROBE STUDY II. Le Journal de Physique Colloques. 50(C8). C8–477. 1 indexed citations

17.

Elswijk, H. B., J. Th. M. De Hosson, Sander van Smaalen, & J. L. de Boer. (1988). Determination of the crystal structure of icosahedral Al-Cu-Li. Physical review. B, Condensed matter. 38(3). 1681–1685. 42 indexed citations

18.

Elswijk, H. B.. (1988). Field ion microscopy of amorphous materials and quasicrystals. Data Archiving and Networked Services (DANS). 1 indexed citations

19.

Elswijk, H. B., P.M. Bronsveld, & J. Th. M. De Hosson. (1988). Field-ion-microscopy contradiction of the quasicrystal model based on twinning of a cubic crystal. Physical review. B, Condensed matter. 37(8). 4261–4264. 7 indexed citations

20.

Elswijk, H. B., P.M. Bronsveld, & J. Th. M. De Hosson. (1987). FIELD ION MICROSCOPE, IMAGING ATOM PROBE STUDY OF METALLIC GLASSES. Le Journal de Physique Colloques. 48(C6). C6–305. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact