J. Ebel

771 total citations
41 papers, 614 citations indexed

About

J. Ebel is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Biomedical Engineering. According to data from OpenAlex, J. Ebel has authored 41 papers receiving a total of 614 indexed citations (citations by other indexed papers that have themselves been cited), including 39 papers in Electrical and Electronic Engineering, 17 papers in Atomic and Molecular Physics, and Optics and 12 papers in Biomedical Engineering. Recurrent topics in J. Ebel's work include Advanced MEMS and NEMS Technologies (13 papers), Advancements in Semiconductor Devices and Circuit Design (11 papers) and Radio Frequency Integrated Circuit Design (10 papers). J. Ebel is often cited by papers focused on Advanced MEMS and NEMS Technologies (13 papers), Advancements in Semiconductor Devices and Circuit Design (11 papers) and Radio Frequency Integrated Circuit Design (10 papers). J. Ebel collaborates with scholars based in United States, Greece and Puerto Rico. J. Ebel's co-authors include H. S. Newman, Nelson Sepúlveda, Dimitris E. Anagnostou, L.L. Liou, John Maciel, C.I. Huang, M.T. Chryssomallis, Benjamin D. Braaten, Kevin Leedy and Rebecca Cortez and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Journal of The Electrochemical Society.

In The Last Decade

J. Ebel

36 papers receiving 579 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
J. Ebel United States	13	535	226	213	111	67	41	614
O. Vendier France	15	676 1.3×	211 0.9×	253 1.2×	64 0.6×	58 0.9×	80	772
Masashi Ueno Japan	12	206 0.4×	187 0.8×	87 0.4×	61 0.5×	98 1.5×	27	418
Takashiro Tsukamoto Japan	12	478 0.9×	291 1.3×	351 1.6×	41 0.4×	79 1.2×	96	616
M.A. Schmidt United States	12	444 0.8×	211 0.9×	177 0.8×	25 0.2×	23 0.3×	25	531
Pekka Rantakari Finland	12	524 1.0×	264 1.2×	323 1.5×	86 0.8×	46 0.7×	42	595
Jin‐Shown Shie Taiwan	11	374 0.7×	191 0.8×	180 0.8×	23 0.2×	75 1.1×	32	457
Kamaljit Rangra India	14	593 1.1×	276 1.2×	404 1.9×	20 0.2×	101 1.5×	87	697
K. Sakiyama Japan	13	430 0.8×	106 0.5×	232 1.1×	47 0.4×	200 3.0×	62	543
Brian A. Lail United States	17	368 0.7×	175 0.8×	322 1.5×	185 1.7×	43 0.6×	69	676
Mojtaba Joodaki Iran	13	472 0.9×	53 0.2×	85 0.4×	136 1.2×	29 0.4×	88	564

Countries citing papers authored by J. Ebel

Since Specialization

Citations

This map shows the geographic impact of J. Ebel's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Ebel with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Ebel more than expected).

Fields of papers citing papers by J. Ebel

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J. Ebel. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Ebel. The network helps show where J. Ebel may publish in the future.

Co-authorship network of co-authors of J. Ebel

This figure shows the co-authorship network connecting the top 25 collaborators of J. Ebel. A scholar is included among the top collaborators of J. Ebel based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with J. Ebel. J. Ebel is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Barton, Taylor W., et al.. (2016). Reconfigurable RF Components for Multifunction RF Systems. Zenodo (CERN European Organization for Nuclear Research). 19. 1–4. 5 indexed citations

Newman, H. S., et al.. (2008). Lifetime Measurements on a High-Reliability RF-MEMS Contact Switch. IEEE Microwave and Wireless Components Letters. 18(2). 100–102. 86 indexed citations

Leedy, Kevin, et al.. (2007). Thin-Film Encapsulated RF MEMS Switches. Journal of Microelectromechanical Systems. 16(2). 304–309. 38 indexed citations

Ebel, J., et al.. (2006). A Latching Capacitive RF MEMS Switch in a Thin Film Package. 79. 259–262. 13 indexed citations

Leedy, Kevin, et al.. (2006). Influence of metal stress on RF MEMS capacitive switches. Sensors and Actuators A Physical. 134(2). 600–605. 9 indexed citations

DelRio‬, Frank W., Cari F. Herrmann‐Abell, Nils Høivik, et al.. (2004). Atomic layer deposition of Al/sub 2/O/sub 3//ZnO nano-scale films for gold RF MEMS. 1923–1926. 3 indexed citations

Leedy, Kevin, et al.. (2003). Metallization schemes for radio frequency microelectromechanical system switches. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 21(4). 1172–1177. 8 indexed citations

Via, D., J. Ebel, T. Quach, et al.. (2002). Xs-MET, a reduced complexity fabrication process using complementary heterostructure field effect transistors for analog, low power, space applications. 2. 622–629.

Stievater, Todd H., William S. Rabinovich, H. S. Newman, et al.. (2002). Measurement of thermal-mechanical noise in microelectromechanical systems. Applied Physics Letters. 81(10). 1779–1781. 19 indexed citations

10.

Jenkins, T., C. Bozada, G. DeSalvo, et al.. (2002). Power performance of thermally-shunted heterojunction bipolar transistors. 2. 949–952. 1 indexed citations

11.

Dettmer, R., T. Jenkins, C. Bozada, et al.. (2002). Effect of device layout on the thermal resistance of high-power thermally-shunted heterojunction bipolar transistors. 3. 1607–1610. 2 indexed citations

12.

Anholt, R., C. Bozada, G. DeSalvo, et al.. (2002). Decoupled electrical/thermal modeling of AlGaAs/GaAs heterojunction bipolar transistors. 167–170.

13.

Fitch, Robert, R. Dettmer, J. Gillespie, et al.. (2002). Thermal studies on heterostructure bipolar transistors using electroluminescence. 45–50. 4 indexed citations

14.

Cortez, Rebecca, et al.. (1999). Film Stress Influence of Bilayer Metallization on the Structure of RF MEMS Switches. MRS Proceedings. 594. 1 indexed citations

15.

Anholt, R., C. Bozada, G. DeSalvo, et al.. (1997). Base and collector resistances in heterojunction bipolar transistors. Solid-State Electronics. 41(11). 1739–1743. 2 indexed citations

16.

Bozada, C., G. DeSalvo, R. Dettmer, et al.. (1997). “Safe” solvent resist process for sub-quarter micron T-gates. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 15(6). 2916–2920. 2 indexed citations

17.

DeSalvo, G., D. C. Look, C. Bozada, & J. Ebel. (1997). Depth measurement of doped semiconductors using the Hall technique. Journal of Applied Physics. 81(1). 281–284. 1 indexed citations

18.

Ebel, J., T. E. Schlesinger, & Meredith Reed. (1996). Scanning Probe Investigations of Cleaved Heterostructure Layers. MRS Proceedings. 451. 1 indexed citations

19.

Anholt, R., C. Bozada, R. Dettmer, et al.. (1996). Measuring, modeling, and minimizing capacitances in heterojunction bipolar transistors. Solid-State Electronics. 39(7). 961–963. 4 indexed citations

20.

Look, D. C., B. Jogai, R. Kaspi, et al.. (1996). Effects of In profile on material and device properties of AlGaAs/InGaAs/GaAs high electron mobility transistors. Journal of Applied Physics. 79(1). 540–544. 4 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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