Ian Stobert

435 total citations
20 papers, 265 citations indexed

About

Ian Stobert is a scholar working on Electrical and Electronic Engineering, Industrial and Manufacturing Engineering and Surfaces, Coatings and Films. According to data from OpenAlex, Ian Stobert has authored 20 papers receiving a total of 265 indexed citations (citations by other indexed papers that have themselves been cited), including 18 papers in Electrical and Electronic Engineering, 8 papers in Industrial and Manufacturing Engineering and 5 papers in Surfaces, Coatings and Films. Recurrent topics in Ian Stobert's work include Advancements in Photolithography Techniques (17 papers), Industrial Vision Systems and Defect Detection (8 papers) and Integrated Circuits and Semiconductor Failure Analysis (7 papers). Ian Stobert is often cited by papers focused on Advancements in Photolithography Techniques (17 papers), Industrial Vision Systems and Defect Detection (8 papers) and Integrated Circuits and Semiconductor Failure Analysis (7 papers). Ian Stobert collaborates with scholars based in United States, Japan and Canada. Ian Stobert's co-authors include Karen Nummy, Javier Ayala, Stewart E. Rauch, Yusheng Bian, Aslı Şahin, Jessie Rosenberg, Ken Giewont, Frederick A. Anderson, Bo Peng and Michał Rakowski and has published in prestigious journals such as IEEE Journal of Selected Topics in Quantum Electronics, Journal of Graph Theory and Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE.

In The Last Decade

Ian Stobert

18 papers receiving 241 citations

Author Peers

Peers are selected by citation overlap in the author's most active subfields. citations · hero ref

Author Last Decade Papers Cites
Ian Stobert 225 70 47 40 24 20 265
T. Sudo 399 1.8× 90 1.3× 46 1.0× 10 0.3× 3 0.1× 32 445
Eric Chang 317 1.4× 56 0.8× 32 0.7× 43 1.1× 2 0.1× 25 352
Miles Murdocca 382 1.7× 64 0.9× 18 0.4× 63 1.6× 27 437
Yufei Xing 295 1.3× 143 2.0× 18 0.4× 90 2.3× 2 0.1× 29 354
Jungdal Choi 252 1.1× 20 0.3× 36 0.8× 7 0.2× 1 0.0× 25 309
R.W. Dutton 310 1.4× 110 1.6× 16 0.3× 2 0.1× 8 0.3× 21 335
Daniel Micusik 366 1.6× 33 0.5× 111 2.4× 20 0.5× 22 389
Peter S. Guilfoyle 264 1.2× 100 1.4× 23 0.5× 39 1.0× 1 0.0× 59 334
N. Hedenstierna 507 2.3× 70 1.0× 127 2.7× 11 0.3× 9 0.4× 14 525
Neal K. Bambha 134 0.6× 97 1.4× 21 0.4× 61 1.5× 1 0.0× 35 323

Countries citing papers authored by Ian Stobert

Since Specialization
Citations

This map shows the geographic impact of Ian Stobert's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Ian Stobert with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Ian Stobert more than expected).

Fields of papers citing papers by Ian Stobert

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Ian Stobert. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Ian Stobert. The network helps show where Ian Stobert may publish in the future.

Co-authorship network of co-authors of Ian Stobert

This figure shows the co-authorship network connecting the top 25 collaborators of Ian Stobert. A scholar is included among the top collaborators of Ian Stobert based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Ian Stobert. Ian Stobert is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Yin, Lianghong, et al.. (2022). Machine learning based error classification for curvilinear designs. 8–8. 2 indexed citations
2.
Giewont, Ken, Shuren Hu, Bo Peng, et al.. (2019). 300-mm Monolithic Silicon Photonics Foundry Technology. IEEE Journal of Selected Topics in Quantum Electronics. 25(5). 1–11. 169 indexed citations
3.
Stobert, Ian, et al.. (2018). Model-based correction for local stress-induced overlay errors. 28. 12–12. 2 indexed citations
4.
Stobert, Ian, et al.. (2015). New method of detection and classification of yield-impacting EUV mask defects. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 9635. 96350M–96350M. 6 indexed citations
5.
Badger, Karen, et al.. (2013). Your worst nightmare: inspection of aggressive OPC on 14nm masks with emphasis on defect sensitivity and wafer defect print predictability. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8880. 88800E–88800E. 2 indexed citations
6.
Stobert, Ian & Derren Dunn. (2013). Etch correction, and OPC, a look at the current state and future of etch correction. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8685. 868504–868504. 5 indexed citations
7.
Stobert, Ian, et al.. (2011). Contact patterning strategies for 32nm and 28nm technology. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 7973. 797319–797319. 2 indexed citations
8.
Stobert, Ian, et al.. (2011). Strategies for single patterning of contacts for 32nm and 28nm technology. 6154. 1–8. 4 indexed citations
9.
Bailey, Todd, et al.. (2010). Substrate aware OPC rules for edge effect in block levels. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 7823. 78233U–78233U. 3 indexed citations
10.
Stobert, Ian, et al.. (2009). OPC simplification and mask cost reduction using regular design fabrics. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 7274. 727417–727417. 12 indexed citations
11.
Tirapu-Azpiroz, Jaione, et al.. (2009). Improving yield through the application of process window OPC. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 7274. 727411–727411. 15 indexed citations
12.
Dunn, Derren, et al.. (2009). Etch aware optical proximity correction: a first step toward integrated pattern engineering. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 7274. 727412–727412. 4 indexed citations
13.
HIGUCHI, Masaru, et al.. (2008). Exploring new metrology for complex photomask patterns. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 7122. 71222S–71222S. 1 indexed citations
14.
Stobert, Ian, et al.. (2008). The comparison of OPC performance and run time for dense versus sparse solutions. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 6924. 69243G–69243G.
15.
Stobert, Ian, et al.. (2008). Optimizing models based OPC fragmentation using genetic algorithms. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 7122. 71220V–71220V. 4 indexed citations
16.
Wei, Alexander, et al.. (2007). The effect of the OPC parameters on the performance of the OPC model. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 6730. 673055–673055. 2 indexed citations
17.
Badger, Karen, et al.. (2007). Impact of transmitted and reflected light inspection on mask inspectability, defect sensitivity, and mask design rule restrictions. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 6607. 66072E–66072E. 2 indexed citations
18.
Burns, Ryan L., et al.. (2006). Improvements in post-OPC data constraints for enhanced process corrections. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 6154. 61543G–61543G. 2 indexed citations
19.
Stobert, Ian, et al.. (2006). Managing high-accuracy and fast convergence in OPC. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 6349. 634924–634924. 3 indexed citations
20.
Richter, R. Bruce, et al.. (1996). The crossing number ofC5 �Cn. Journal of Graph Theory. 22(3). 239–243. 25 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact

Breakdown of academic impact, for papers by T. Sudo Breakdown of academic impact, for papers by Eric Chang Breakdown of academic impact, for papers by Miles Murdocca Breakdown of academic impact, for papers by Yufei Xing Breakdown of academic impact, for papers by Jungdal Choi Breakdown of academic impact, for papers by R.W. Dutton Breakdown of academic impact, for papers by Daniel Micusik Breakdown of academic impact, for papers by Peter S. Guilfoyle Breakdown of academic impact, for papers by N. Hedenstierna Breakdown of academic impact, for papers by Neal K. Bambha
Rankless by CCL
2026