James Oberschmidt

599 total citations
34 papers, 446 citations indexed

About

James Oberschmidt is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Surfaces, Coatings and Films. According to data from OpenAlex, James Oberschmidt has authored 34 papers receiving a total of 446 indexed citations (citations by other indexed papers that have themselves been cited), including 28 papers in Electrical and Electronic Engineering, 10 papers in Materials Chemistry and 8 papers in Surfaces, Coatings and Films. Recurrent topics in James Oberschmidt's work include Advancements in Photolithography Techniques (22 papers), Electron and X-Ray Spectroscopy Techniques (8 papers) and Industrial Vision Systems and Defect Detection (8 papers). James Oberschmidt is often cited by papers focused on Advancements in Photolithography Techniques (22 papers), Electron and X-Ray Spectroscopy Techniques (8 papers) and Industrial Vision Systems and Defect Detection (8 papers). James Oberschmidt collaborates with scholars based in United States, India and Hungary. James Oberschmidt's co-authors include David Lazarus, P. Boolchand, D. K. Gupta, J. P. Silverman, Charles N. Archie, Azalia A. Krasnoperova, Ramya Viswanathan, Daniel Fischer, Lars W. Liebmann and Mohammed Talbi and has published in prestigious journals such as Physical Review Letters, Physical review. B, Condensed matter and Journal of Applied Physics.

In The Last Decade

James Oberschmidt

32 papers receiving 418 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
James Oberschmidt United States 12 220 190 114 68 60 34 446
Wilhelm Kleppmann Germany 13 103 0.5× 225 1.2× 86 0.8× 65 1.0× 37 0.6× 25 489
K.V. Namjoshi Canada 11 150 0.7× 246 1.3× 25 0.2× 77 1.1× 71 1.2× 31 419
R. H. Borcherts United States 12 104 0.5× 154 0.8× 73 0.6× 35 0.5× 50 0.8× 27 436
Akiko Harasaki Japan 5 208 0.9× 122 0.6× 25 0.2× 171 2.5× 165 2.8× 10 654
S. Elschner Germany 21 735 3.3× 247 1.3× 34 0.3× 28 0.4× 556 9.3× 73 1.3k
Hiroyuki Serizawa Japan 17 335 1.5× 322 1.7× 164 1.4× 50 0.7× 20 0.3× 56 674
Louis James Vernon United States 12 91 0.4× 439 2.3× 33 0.3× 78 1.1× 22 0.4× 16 537
В. В. Новиков Russia 17 58 0.3× 456 2.4× 113 1.0× 183 2.7× 65 1.1× 105 818
Anton Bochkarev Germany 13 92 0.4× 466 2.5× 31 0.3× 71 1.0× 31 0.5× 18 565
P. Mikołajczak Poland 11 93 0.4× 215 1.1× 50 0.4× 30 0.4× 21 0.3× 40 367

Countries citing papers authored by James Oberschmidt

Since Specialization
Citations

This map shows the geographic impact of James Oberschmidt's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by James Oberschmidt with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites James Oberschmidt more than expected).

Fields of papers citing papers by James Oberschmidt

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by James Oberschmidt. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by James Oberschmidt. The network helps show where James Oberschmidt may publish in the future.

Co-authorship network of co-authors of James Oberschmidt

This figure shows the co-authorship network connecting the top 25 collaborators of James Oberschmidt. A scholar is included among the top collaborators of James Oberschmidt based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with James Oberschmidt. James Oberschmidt is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Gabrani, Maria, et al.. (2014). Automated sample plan selection for OPC modeling. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 9052. 90520J–90520J. 7 indexed citations
2.
Oberschmidt, James, et al.. (2011). Efficient method for SRAF rule determination. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8081. 80810T–80810T. 3 indexed citations
3.
Oberschmidt, James, et al.. (2010). Automation of sample plan creation for process model calibration. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 7640. 76401G–76401G. 13 indexed citations
4.
Tirapu-Azpiroz, Jaione, et al.. (2009). Improving yield through the application of process window OPC. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 7274. 727411–727411. 15 indexed citations
5.
Oberschmidt, James, et al.. (2006). The effect of OPC optical and resist model parameters on the model accuracy, run time, and stability. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 6349. 634923–634923. 8 indexed citations
6.
Madkour, Loutfy H., et al.. (2005). The effect of calibration feature weighting on OPC optical and resist models: investigating the influence on model coefficients and on the overall model fitting. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 5992. 599253–599253. 5 indexed citations
7.
Oberschmidt, James, et al.. (2002). A low inductance capacitor technology. 284–288. 3 indexed citations
8.
Hargrove, M., S. Crowder, E. Nowak, et al.. (2002). High-performance sub-0.08 μm CMOS with dual gate oxide and 9.7 ps inverter delay. 627–630. 26 indexed citations
9.
Liebmann, Lars W., et al.. (1999). Alternating phase-shifted mask for logic gate levels, design, and mask manufacturing. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 3679. 27–27. 12 indexed citations
10.
Agnello, P., et al.. (1996). <title>X-ray exposure in the manufacture of sub-150-nm gate lines</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 2723. 237–248. 2 indexed citations
11.
Capasso, C., Andrew Pomerene, Sai T. Chu, et al.. (1996). X-ray induced mask contamination and particulate monitoring in x-ray steppers. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 14(6). 4336–4340. 7 indexed citations
12.
Nelson, Christine M., Scott D. Hector, William Chu, et al.. (1995). Electrical linewidth measurements and simulations studying the effects of dose and gap on exposure latitude in x-ray lithography. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 2437. 50–50. 1 indexed citations
13.
Cummings, K. D., et al.. (1994). Overlay measurement and analysis of x-ray/optical lithography for mix-and-match device applications. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 2194. 36–36.
14.
Oberschmidt, James, et al.. (1992). Low-inductance decoupling capacitor for the thermal conduction modules of the IBM Enterprise System/9000 processors. IBM Journal of Research and Development. 36(5). 935–942. 11 indexed citations
15.
Gupta, D. K. & James Oberschmidt. (1990). Diffusion Processes and Their Modifications in Some Pb-Sn-Cu Alloy Solders. Defect and diffusion forum/Diffusion and defect data, solid state data. Part A, Defect and diffusion forum. 66-69. 605–624. 3 indexed citations
16.
Oberschmidt, James, et al.. (1989). Design Of An X-Ray Lithography Beam Line. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 1089. 252–252. 3 indexed citations
17.
Oberschmidt, James. (1981). Effect of Frenkel defects on the high-pressure phase transitions in PbF2and SrCl2. Physical review. B, Condensed matter. 24(6). 3584–3587. 8 indexed citations
18.
Oberschmidt, James. (1981). Simple thermodynamic model for the specific-heat anomaly and several other properties of crystals with the fluorite structure. Physical review. B, Condensed matter. 23(10). 5038–5047. 52 indexed citations
19.
Oberschmidt, James & David Lazarus. (1980). Ionic conductivity, activation volumes, and frequency-dependent conductivity in crystals with the fluorite structure. Physical review. B, Condensed matter. 21(12). 5823–5834. 61 indexed citations
20.
Oberschmidt, James & P. Boolchand. (1973). Observation of Natural Linewidth for the 35.5-keVγResonance inTe125. Physical review. B, Solid state. 8(11). 4953–4955. 5 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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