G.M. Guichar
Impact in
- Surfaces, Coatings and Films top 2%
- Electron and X-Ray Spectroscopy Techniques
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- Surface and Thin Film Phenomena
- Advanced Chemical Physics Studies
- Semiconductor materials and interfaces
- Semiconductor Quantum Structures and Devices
Papers in
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- Electron and X-Ray Spectroscopy Techniques 17
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- Surface and Thin Film Phenomena 16
- Advanced Chemical Physics Studies 6
- Magnetic properties of thin films 3
- Semiconductor materials and interfaces 2
G.M. Guichar
23 papers receiving 624 citations
Peers
Comparison fields: 5 of 32
- Surfaces, Coatings and Films 306
- Atomic and Molecular Physics, and Optics 474
- Structural Biology 14
- Electrical and Electronic Engineering 277
- Computational Mechanics 74
Countries citing papers authored by G.M. Guichar
This map shows the geographic impact of G.M. Guichar's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by G.M. Guichar with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites G.M. Guichar more than expected).
Fields of papers citing papers by G.M. Guichar
This network shows the impact of papers produced by G.M. Guichar. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by G.M. Guichar. The network helps show where G.M. Guichar may publish in the future.
Co-authorship network
The 25 scholars most cited alongside G.M. Guichar, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2004 | 22 | |
| 2 | 2002 | 23 | |
| 3 | 2001 | 1 | |
| 4 | 1983 | 3 | |
| 5 | 1983 | 27 | |
| 6 | 1983 | 35 | |
| 7 | 1982 | 29 | |
| 8 | 1982 | 18 | |
| 9 | 1981 | 44 | |
| 10 | 1981 | 5 | |
| 11 | 1980 | 27 | |
| 12 | 1979 | 20 | |
| 13 | 1979 | 40 | |
| 14 | 1979 | 20 | |
| 15 | 1979 | 21 | |
| 16 | 1979 | 24 | |
| 17 | 1975 | 118 | |
| 18 | 1974 | 13 | |
| 19 | 1972 | 3 | |
| 20 | 1972 | 9 |
About G.M. Guichar
G.M. Guichar is a scholar working on Surfaces, Coatings and Films, Atomic and Molecular Physics, and Optics, Radiation, Biomedical Engineering and Electrical and Electronic Engineering, having authored 23 papers that have together received 667 indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (17 papers), Surface and Thin Film Phenomena (16 papers), Advanced Chemical Physics Studies (6 papers), Photocathodes and Microchannel Plates (5 papers), Magnetic properties of thin films (3 papers), Thermal properties of materials (2 papers), Advanced Semiconductor Detectors and Materials (2 papers) and Semiconductor materials and interfaces (2 papers). The work is most often cited by research in Surfaces, Coatings and Films (306 citations), Atomic and Molecular Physics, and Optics (474 citations), Structural Biology (14 citations), Electrical and Electronic Engineering (277 citations) and Computational Mechanics (74 citations). G.M. Guichar has collaborated with scholars based in France, Brazil and United States. Frequent co-authors include C.A. Sébenne, M. Bałkanski, F. Houzay, R. Pinchaux, G. Garry, D. Bolmont, Y. Pétroff, A. Cros, J. Derrien and F. Salvan. Their work appears in journals such as Surface Science, Physical Review Letters, Japanese Journal of Applied Physics, Applied Physics Letters and Physical Review B.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.