F. Houzay
Impact in
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- Semiconductor Quantum Structures and Devices
- Surface and Thin Film Phenomena
- Quantum and electron transport phenomena
- Surfaces, Coatings and Films top 2%
- Electron and X-Ray Spectroscopy Techniques
Papers in
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- Electron and X-Ray Spectroscopy Techniques 18
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- Semiconductor Quantum Structures and Devices 16
- Surface and Thin Film Phenomena 15
- Advanced Chemical Physics Studies 6
- Semiconductor materials and interfaces 3
F. Houzay
36 papers receiving 1.9k citations
Hit Papers
Peers
Comparison fields: 5 of 39
- Atomic and Molecular Physics, and Optics 1.8k
- Surfaces, Coatings and Films 308
- Electrical and Electronic Engineering 1.4k
- Structural Biology 24
- Condensed Matter Physics 171
Countries citing papers authored by F. Houzay
This map shows the geographic impact of F. Houzay's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by F. Houzay with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites F. Houzay more than expected).
Fields of papers citing papers by F. Houzay
This network shows the impact of papers produced by F. Houzay. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by F. Houzay. The network helps show where F. Houzay may publish in the future.
Co-authorship network
The 25 scholars most cited alongside F. Houzay, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | Self-organized growth of regular nanometer-scale InAs dots on GaAs Hit paper breakdown → | 1994 | 764 |
| 2 | 1993 | 4 | |
| 3 | 1992 | 1 | |
| 4 | 1991 | 5 | |
| 5 | 1990 | 20 | |
| 6 | 1990 | 2 | |
| 7 | 1989 | 346 | |
| 8 | 1989 | 23 | |
| 9 | 1989 | 38 | |
| 10 | 1987 | 127 | |
| 11 | 1986 | 76 | |
| 12 | 1985 | 7 | |
| 13 | 1985 | 11 | |
| 14 | 1984 | 28 | |
| 15 | 1983 | 3 | |
| 16 | 1983 | 27 | |
| 17 | 1983 | 35 | |
| 18 | 1982 | 29 | |
| 19 | 1982 | 18 | |
| 20 | 1980 | 27 |
About F. Houzay
F. Houzay is a scholar working on Surfaces, Coatings and Films, Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering, Materials Chemistry and Radiation, having authored 37 papers that have together received 2.1k indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (18 papers), Semiconductor Quantum Structures and Devices (16 papers), Semiconductor materials and devices (16 papers), Surface and Thin Film Phenomena (15 papers), Advanced Chemical Physics Studies (6 papers), Advanced Semiconductor Detectors and Materials (5 papers), Semiconductor materials and interfaces (3 papers) and Thin-Film Transistor Technologies (3 papers). The work is most often cited by research in Atomic and Molecular Physics, and Optics (1.8k citations), Surfaces, Coatings and Films (308 citations), Electrical and Electronic Engineering (1.4k citations), Structural Biology (24 citations) and Condensed Matter Physics (171 citations). F. Houzay has collaborated with scholars based in France and United States. Frequent co-authors include J. M. Moison, F. Barthe, L. Leprince, E. André, O. Vatel, C. Guille, M. Bensoussan, R. Pinchaux, G.M. Guichar and Étienne Petit. Their work appears in journals such as Surface Science, Physical review. B, Condensed matter, Applied Surface Science, Journal of Crystal Growth and Applied Physics Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.