J. Knall
- Surfaces, Coatings and Films top 5%
- Electron and X-Ray Spectroscopy Techniques 5
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- Semiconductor materials and interfaces 10
- Surface and Thin Film Phenomena 8
- Force Microscopy Techniques and Applications 6
- Structural Biology top 10%
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- Silicon and Solar Cell Technologies 11
- Integrated Circuits and Semiconductor Failure Analysis 9
- Semiconductor materials and devices 9
- Computational Mechanics top 5%
- Ion-surface interactions and analysis 9
J. Knall
34 papers receiving 1.1k citations
Peers
Comparison fields: 5 of 37
- Surfaces, Coatings and Films 191
- Atomic and Molecular Physics, and Optics 728
- Structural Biology 25
- Electrical and Electronic Engineering 710
- Computational Mechanics 172
Countries citing papers authored by J. Knall
This map shows the geographic impact of J. Knall's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Knall with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Knall more than expected).
Fields of papers citing papers by J. Knall
This network shows the impact of papers produced by J. Knall. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Knall. The network helps show where J. Knall may publish in the future.
Co-authorship network
The 25 scholars most cited alongside J. Knall, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2004 | 37 | |
| 2 | 1994 | 18 | |
| 3 | 1994 | 11 | |
| 4 | 1993 | 73 | |
| 5 | 1992 | 16 | |
| 6 | 1992 | 19 | |
| 7 | 1992 | 23 | |
| 8 | 1991 | 15 | |
| 9 | 1991 | 3 | |
| 10 | 1991 | 112 | |
| 11 | 1989 | 7 | |
| 12 | 1989 | 3 | |
| 13 | 1989 | 55 | |
| 14 | 1989 | 34 | |
| 15 | 1989 | 58 | |
| 16 | 1988 | 26 | |
| 17 | 1988 | 7 | |
| 18 | 1987 | 38 | |
| 19 | 1985 | 16 | |
| 20 | 1984 | 38 |
About J. Knall
J. Knall is a scholar working on Structural Biology, Surfaces, Coatings and Films, Atomic and Molecular Physics, and Optics, Computational Mechanics and Electrical and Electronic Engineering, having authored 34 papers that have together received 1.1k indexed citations. Recurring topics across this work include Silicon and Solar Cell Technologies (11 papers), Semiconductor materials and interfaces (10 papers), Ion-surface interactions and analysis (9 papers), Integrated Circuits and Semiconductor Failure Analysis (9 papers), Semiconductor materials and devices (9 papers), Surface and Thin Film Phenomena (8 papers), Force Microscopy Techniques and Applications (6 papers) and Electron and X-Ray Spectroscopy Techniques (5 papers). The work is most often cited by research in Surfaces, Coatings and Films (191 citations), Atomic and Molecular Physics, and Optics (728 citations), Structural Biology (25 citations), Electrical and Electronic Engineering (710 citations) and Computational Mechanics (172 citations). J. Knall has collaborated with scholars based in United States, Sweden and United Kingdom. Frequent co-authors include J. B. Pethica, J.‐E. Sundgren, G. V. Hansson, J. E. Greene, Scott A. Barnett, W. H. Weinberg, J.H. Wilson, Andrew J. Mayne, T. S. Jones and A. R. Avery. Their work appears in journals such as Surface Science, Applied Physics Letters, Journal of Applied Physics, Physical review. B, Condensed matter and Journal of Vacuum Science & Technology A Vacuum Surfaces and Films.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.