F. Salvan
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- Surface and Thin Film Phenomena 39
- Semiconductor materials and interfaces 18
- Force Microscopy Techniques and Applications 16
- Structural Biology top 2%
- Advanced Electron Microscopy Techniques and Applications 6
- Surfaces, Coatings and Films top 1%
- Electron and X-Ray Spectroscopy Techniques 17
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- Semiconductor materials and devices 13
- Materials Chemistry top 10%
- Silicon Nanostructures and Photoluminescence 5
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- Advanced Materials Characterization Techniques 14
- Journals
- Surface Science (17 papers)Applied Physics Letters (4 papers)Physical Review Letters (4 papers)
- Partner nations
- FranceSwitzerlandUnited States
In The Last Decade
F. Salvan
63 papers receiving 2.0k citations
Hit Papers
Peers
Comparison fields: 5 of 54
- Atomic and Molecular Physics, and Optics 1.7k
- Structural Biology 75
- Surfaces, Coatings and Films 371
- Electrical and Electronic Engineering 864
- Materials Chemistry 621
Countries citing papers authored by F. Salvan
This map shows the geographic impact of F. Salvan's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by F. Salvan with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites F. Salvan more than expected).
Fields of papers citing papers by F. Salvan
This network shows the impact of papers produced by F. Salvan. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by F. Salvan. The network helps show where F. Salvan may publish in the future.
Co-authorship network
The 25 scholars most cited alongside F. Salvan, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 1997 | 25 | |
| 2 | 1996 | 10 | |
| 3 | 1993 | 5 | |
| 4 | 1993 | 14 | |
| 5 | 1986 | 63 | |
| 6 | 1986 | 11 | |
| 7 | 1986 | 40 | |
| 8 | 1983 | 60 | |
| 9 | 1983 | 3 | |
| 10 | 1983 | 2 | |
| 11 | 1983 | 1 | |
| 12 | 1981 | 5 | |
| 13 | 1981 | 15 | |
| 14 | 1981 | 23 | |
| 15 | 1980 | 7 | |
| 16 | 1978 | 6 | |
| 17 | 1972 | 103 | |
| 18 | 1971 | 27 | |
| 19 | 1970 | 39 | |
| 20 | RECOMBINATION PROCESSES IN CdS UNDER HIGH EXCITATION. | 1968 | 1 |
About F. Salvan
F. Salvan is a scholar working on Structural Biology, Surfaces, Coatings and Films and Atomic and Molecular Physics, and Optics, having authored 64 papers that have together received 2.1k indexed citations. Recurring topics across this work include Surface and Thin Film Phenomena (39 papers), Semiconductor materials and interfaces (18 papers), Electron and X-Ray Spectroscopy Techniques (17 papers), Force Microscopy Techniques and Applications (16 papers), Advanced Materials Characterization Techniques (14 papers), Semiconductor materials and devices (13 papers), Advanced Electron Microscopy Techniques and Applications (6 papers) and Silicon Nanostructures and Photoluminescence (5 papers). The work is most often cited by research in Atomic and Molecular Physics, and Optics (1.7k citations), Structural Biology (75 citations) and Surfaces, Coatings and Films (371 citations). F. Salvan has collaborated with scholars based in France, Switzerland and United States. Frequent co-authors include J. Derrien, G. Binnig, B. Reihl, Harald Fuchs, A. Cros, H. Rohrer, K. H. Frank, Nicolás García, P. Mathiez and A. R. Williams. Their work appears in journals such as Surface Science, Applied Physics Letters, Physical Review Letters, Europhysics Letters (EPL) and Applied Surface Science.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.