J. Derrien
- Surfaces, Coatings and Films top 0.5%
- Electron and X-Ray Spectroscopy Techniques 36
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- Semiconductor materials and interfaces 60
- Surface and Thin Film Phenomena 56
- Semiconductor Quantum Structures and Devices 15
- Structural Biology top 5%
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- Semiconductor materials and devices 39
- Thin-Film Transistor Technologies 8
- Materials Chemistry top 5%
- Silicon Nanostructures and Photoluminescence 13
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- Advanced Materials Characterization Techniques 22
J. Derrien
126 papers receiving 3.4k citations
Peers
Comparison fields: 5 of 65
- Surfaces, Coatings and Films 684
- Atomic and Molecular Physics, and Optics 2.6k
- Structural Biology 46
- Electrical and Electronic Engineering 1.8k
- Materials Chemistry 1.1k
Countries citing papers authored by J. Derrien
This map shows the geographic impact of J. Derrien's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Derrien with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Derrien more than expected).
Fields of papers citing papers by J. Derrien
This network shows the impact of papers produced by J. Derrien. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Derrien. The network helps show where J. Derrien may publish in the future.
Co-authorship network
The 25 scholars most cited alongside J. Derrien, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 1998 | 10 | |
| 2 | 1998 | 13 | |
| 3 | 1998 | 25 | |
| 4 | 1998 | 2 | |
| 5 | 1998 | 21 | |
| 6 | Kinetic roughening during epitaxial growth of iron and silicon | 1994 | 1 |
| 7 | 1994 | 16 | |
| 8 | 1989 | 12 | |
| 9 | 1987 | 1 | |
| 10 | Semiconductor interfaces : formation and properties : proceedings of the workshops, Les Houches, France, February 24-March 6, 1987 | 1987 | 1 |
| 11 | 1986 | 46 | |
| 12 | 1986 | 18 | |
| 13 | 1985 | 17 | |
| 14 | 1983 | 60 | |
| 15 | 1983 | 3 | |
| 16 | 1983 | 31 | |
| 17 | 1983 | 1 | |
| 18 | 1981 | 5 | |
| 19 | 1981 | 15 | |
| 20 | 1980 | 7 |
About J. Derrien
J. Derrien is a scholar working on Surfaces, Coatings and Films, Atomic and Molecular Physics, and Optics, Structural Biology, Electrical and Electronic Engineering and Biomedical Engineering, having authored 130 papers that have together received 3.6k indexed citations. Recurring topics across this work include Semiconductor materials and interfaces (60 papers), Surface and Thin Film Phenomena (56 papers), Semiconductor materials and devices (39 papers), Electron and X-Ray Spectroscopy Techniques (36 papers), Advanced Materials Characterization Techniques (22 papers), Semiconductor Quantum Structures and Devices (15 papers), Silicon Nanostructures and Photoluminescence (13 papers) and Thin-Film Transistor Technologies (8 papers). The work is most often cited by research in Surfaces, Coatings and Films (684 citations), Atomic and Molecular Physics, and Optics (2.6k citations), Structural Biology (46 citations), Electrical and Electronic Engineering (1.8k citations) and Materials Chemistry (1.1k citations). J. Derrien has collaborated with scholars based in France, Italy and Germany. Frequent co-authors include Joël Chevrier, V. Le Thanh, F. Salvan, Jean‐Claude Vial, A. Cros, M. De Crescenzi, Isabelle Berbézier, F. Arnaud d’Avitaya, R.C. Cinti and T.A. Nguyen Tan. Their work appears in journals such as Surface Science, Physical review. B, Condensed matter, Applied Surface Science, Thin Solid Films and Applied Physics Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.