Toshihiro Ichikawa
- Atomic and Molecular Physics, and Optics top 5%
- Electrical and Electronic Engineering
- Surfaces, Coatings and Films top 5%
- Materials Chemistry
- Biomedical Engineering
- Co-authors
- Shozo InoYouiti YamamotoKohei ChoHiroshi IwasakiShiro OgawaHiroki OhnoMasayuki HasegawaKazuya Yamashita
- Topics
- Surface and Thin Film Phenomena (12 papers)Electron and X-Ray Spectroscopy Techniques (10 papers)Semiconductor Quantum Structures and Devices (6 papers)
- Partner nations
- JapanTaiwanUnited States
In The Last Decade
Toshihiro Ichikawa
25 papers receiving 578 citations
Peers
Comparison fields: 5 of 34
- Atomic and Molecular Physics, and Optics 475
- Electrical and Electronic Engineering 226
- Surfaces, Coatings and Films 181
- Materials Chemistry 150
- Biomedical Engineering 80
Countries citing papers authored by Toshihiro Ichikawa
This map shows the geographic impact of Toshihiro Ichikawa's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Toshihiro Ichikawa with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Toshihiro Ichikawa more than expected).
Fields of papers citing papers by Toshihiro Ichikawa
This network shows the impact of papers produced by Toshihiro Ichikawa. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Toshihiro Ichikawa. The network helps show where Toshihiro Ichikawa may publish in the future.
Co-authorship network of co-authors of Toshihiro Ichikawa
This figure shows the co-authorship network connecting the top 25 collaborators of Toshihiro Ichikawa. A scholar is included among the top collaborators of Toshihiro Ichikawa based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Toshihiro Ichikawa. Toshihiro Ichikawa is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 1 | |
| 2 | 15 | |
| 3 | 14 | |
| 4 | 29 | |
| 5 | 11 | |
| 6 | 3 | |
| 7 | 1 | |
| 8 | 2 | |
| 9 | 82 | |
| 10 | 27 | |
| 11 | 65 | |
| 12 | 16 | |
| 13 | 9 | |
| 14 | 104 | |
| 15 | 25 | |
| 16 | 37 | |
| 17 | 10 | |
| 18 | 1 | |
| 19 | 15 | |
| 20 | 5 |
About Toshihiro Ichikawa
Toshihiro Ichikawa is a scholar working on Surfaces, Coatings and Films, Structural Biology and Atomic and Molecular Physics, and Optics, having authored 25 papers that have together received 601 indexed citations. Recurring topics across this work include Surface and Thin Film Phenomena (12 papers), Electron and X-Ray Spectroscopy Techniques (10 papers) and Semiconductor Quantum Structures and Devices (6 papers). The work is most often cited by research in Surfaces, Coatings and Films (181 citations), Structural Biology (30 citations) and Atomic and Molecular Physics, and Optics (475 citations). Toshihiro Ichikawa has collaborated with scholars based in Japan, Taiwan and United States. Frequent co-authors include Shozo Ino, Youiti Yamamoto, Kohei Cho, Hiroshi Iwasaki, Shiro Ogawa, Hiroki Ohno, Masayuki Hasegawa, Kazuya Yamashita and Yoshihiko Gotoh. Their work appears in journals such as Journal of Materials Science, Applied Surface Science and Surface Science.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.