F. Velardi
Impact in
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- Cerebrospinal fluid and hydrocephalus
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- Silicon Carbide Semiconductor Technologies
- Semiconductor materials and devices
- Radiation Effects in Electronics
- Electrostatic Discharge in Electronics
- Integrated Circuits and Semiconductor Failure Analysis
Papers in
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- Silicon Carbide Semiconductor Technologies 22
- Electrostatic Discharge in Electronics 19
- Radiation Effects in Electronics 16
- Semiconductor materials and devices 16
- Integrated Circuits and Semiconductor Failure Analysis 14
- Electromagnetic Compatibility and Noise Suppression 6
- Advanced DC-DC Converters 4
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- GaN-based semiconductor devices and materials 7
- Co-authors
- G. BusattoA. SanseverinoEnrico MarcheseConcezio Di RoccoC. AbbateFrancesco IannuzzoC. VisoneCiro Natale
- Journals
- Microelectronics Reliability (20 papers)IEEE Transactions on Nuclear Science (3 papers)Child s Nervous System (3 papers)IEEE Transactions on Electron Devices (3 papers)Applied Sciences (2 papers)
- Partner nations
- ItalyUnited StatesSwitzerland
In The Last Decade
F. Velardi
46 papers receiving 878 citations
Peers
Comparison fields: 5 of 59
- Cellular and Molecular Neuroscience 193
- Electrical and Electronic Engineering 588
- Condensed Matter Physics 112
- Electronic, Optical and Magnetic Materials 127
- Neurology 101
Countries citing papers authored by F. Velardi
This map shows the geographic impact of F. Velardi's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by F. Velardi with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites F. Velardi more than expected).
Fields of papers citing papers by F. Velardi
This network shows the impact of papers produced by F. Velardi. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by F. Velardi. The network helps show where F. Velardi may publish in the future.
Co-authorship network
The 25 scholars most cited alongside F. Velardi, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2024 | 0 | |
| 2 | 2024 | 0 | |
| 3 | 2021 | 3 | |
| 4 | 2021 | 22 | |
| 5 | 2020 | 11 | |
| 6 | 2019 | 48 | |
| 7 | 2019 | 63 | |
| 8 | 2017 | 16 | |
| 9 | 2016 | 12 | |
| 10 | 2014 | 30 | |
| 11 | 2013 | 9 | |
| 12 | 2012 | 2 | |
| 13 | 2011 | 2 | |
| 14 | 2011 | 13 | |
| 15 | 2011 | 3 | |
| 16 | 2010 | 15 | |
| 17 | 2008 | 8 | |
| 18 | 2001 | 22 | |
| 19 | 2001 | 113 | |
| 20 | 1994 | 182 |
About F. Velardi
F. Velardi is a scholar working on Electrical and Electronic Engineering, Condensed Matter Physics, Cellular and Molecular Neuroscience, Neurology and Safety, Risk, Reliability and Quality, having authored 48 papers that have together received 904 indexed citations. Recurring topics across this work include Silicon Carbide Semiconductor Technologies (22 papers), Electrostatic Discharge in Electronics (19 papers), Radiation Effects in Electronics (16 papers), Semiconductor materials and devices (16 papers), Integrated Circuits and Semiconductor Failure Analysis (14 papers), GaN-based semiconductor devices and materials (7 papers), Electromagnetic Compatibility and Noise Suppression (6 papers) and Advanced DC-DC Converters (4 papers). The work is most often cited by research in Cellular and Molecular Neuroscience (193 citations), Electrical and Electronic Engineering (588 citations), Condensed Matter Physics (112 citations), Electronic, Optical and Magnetic Materials (127 citations) and Neurology (101 citations). F. Velardi has collaborated with scholars based in Italy, United States and Switzerland. Frequent co-authors include G. Busatto, A. Sanseverino, Enrico Marchese, Concezio Di Rocco, C. Abbate, Francesco Iannuzzo, C. Visone, Ciro Natale, J. Wyss and Giuseppe Currò. Their work appears in journals such as Microelectronics Reliability, IEEE Transactions on Nuclear Science, Child s Nervous System, IEEE Transactions on Electron Devices and Applied Sciences.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.