Francesco Iannuzzo

5.4k total citations
271 papers, 4.3k citations indexed

About

Francesco Iannuzzo is a scholar working on Electrical and Electronic Engineering, Mechanical Engineering and Control and Systems Engineering. According to data from OpenAlex, Francesco Iannuzzo has authored 271 papers receiving a total of 4.3k indexed citations (citations by other indexed papers that have themselves been cited), including 266 papers in Electrical and Electronic Engineering, 23 papers in Mechanical Engineering and 16 papers in Control and Systems Engineering. Recurrent topics in Francesco Iannuzzo's work include Silicon Carbide Semiconductor Technologies (232 papers), Electromagnetic Compatibility and Noise Suppression (86 papers) and Electrostatic Discharge in Electronics (81 papers). Francesco Iannuzzo is often cited by papers focused on Silicon Carbide Semiconductor Technologies (232 papers), Electromagnetic Compatibility and Noise Suppression (86 papers) and Electrostatic Discharge in Electronics (81 papers). Francesco Iannuzzo collaborates with scholars based in Denmark, Italy and China. Francesco Iannuzzo's co-authors include Frede Blaabjerg, G. Busatto, Haoze Luo, Paula Diaz Reigosa, Nick Baker, Amir Sajjad Bahman, Huai Wang, Marco Liserre, C. Abbate and Lorenzo Ceccarelli and has published in prestigious journals such as SHILAP Revista de lepidopterología, IEEE Transactions on Industrial Electronics and IEEE Transactions on Power Electronics.

In The Last Decade

Francesco Iannuzzo

261 papers receiving 4.1k citations

Peers

Francesco Iannuzzo

EEE

CSE

CMP

Alberto Castellazzi United Kingdom

Josef Lutz Germany

Stig Munk‐Nielsen Denmark

J.L. Hudgins United States

Xu She United States

Haoze Luo China

Philip Mawby United Kingdom

Alan Mantooth United States

Dominik Bortis Switzerland

Zoubir Khatir France

Alberto Castellazzi United Kingdom

Francesco Iannuzzo

3.8k ×0.9

EEE

483 ×0.9

259 ×0.8

CSE

286 ×1.3

CMP

137 ×0.8

Citations per year, relative to Francesco Iannuzzo Francesco Iannuzzo (= 1×) peers Alberto Castellazzi

Countries citing papers authored by Francesco Iannuzzo

Since Specialization

Citations

This map shows the geographic impact of Francesco Iannuzzo's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Francesco Iannuzzo with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Francesco Iannuzzo more than expected).

Fields of papers citing papers by Francesco Iannuzzo

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Francesco Iannuzzo. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Francesco Iannuzzo. The network helps show where Francesco Iannuzzo may publish in the future.

Co-authorship network of co-authors of Francesco Iannuzzo

This figure shows the co-authorship network connecting the top 25 collaborators of Francesco Iannuzzo. A scholar is included among the top collaborators of Francesco Iannuzzo based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Francesco Iannuzzo. Francesco Iannuzzo is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Zhu, Lingyu, et al.. (2024). Intelligent Condition Monitoring of Multiple Thermal Degradation of IGBT Modules Based on Case Temperature Matrix. IEEE Transactions on Power Electronics. 39(10). 12490–12501. 13 indexed citations

Iannuzzo, Francesco, et al.. (2024). Application-Oriented Flexible Power Cycling Test System for Power Electronic Components. IEEE Journal of Emerging and Selected Topics in Power Electronics. 12(6). 5805–5816. 1 indexed citations

Morel, Hervé, et al.. (2023). Failure degradation similarities on power SiC MOSFET devices submitted to short-circuit stress and accelerated switching conditions. Microelectronics Reliability. 148. 115166–115166. 2 indexed citations

Li, Hui, et al.. (2023). Short-Circuit Capability Optimization of Press-Pack IGBT by Improving Active Edge Heat Dissipation. IEEE Transactions on Power Electronics. 38(5). 6143–6156. 2 indexed citations

LeDuc, Charles A., et al.. (2023). Comparison of Junction Temperature Measurement Using the TSEP Method and Optical Fiber Method in IGBT Power Modules without Silicone Gel Removal. VBN Forskningsportal (Aalborg Universitet). 3 indexed citations

Xin, Zhen, et al.. (2022). Analytical Modeling and Sensitivity Analysis on Plasma Extraction Transit Time (PETT) Oscillations in High-Voltage NPT p-i-n Diode. IEEE Journal of Emerging and Selected Topics in Power Electronics. 11(2). 1754–1766. 2 indexed citations

Reigosa, Paula Diaz, Munaf Rahimo, Renato Amaral Minamisawa, & Francesco Iannuzzo. (2021). Switching Stability Analysis of Paralleled RC-IGBTs With Snapback Effect. IEEE Transactions on Electron Devices. 68(7). 3429–3434. 7 indexed citations

Reigosa, Paula Diaz, et al.. (2019). Modeling of IGBT With High Bipolar Gain for Mitigating Gate Voltage Oscillations During Short Circuit. IEEE Journal of Emerging and Selected Topics in Power Electronics. 7(3). 1584–1592. 6 indexed citations

Chen, Chuantong, et al.. (2019). Highly Reliable Package using Cu Particles Sinter Paste for Next Generation Power Devices. VBN Forskningsportal (Aalborg Universitet). 1–4. 3 indexed citations

10.

Reigosa, Paula Diaz, Haoze Luo, & Francesco Iannuzzo. (2019). Implications of Ageing Through Power Cycling on the Short-Circuit Robustness of 1.2-kV SiC mosfets. IEEE Transactions on Power Electronics. 34(11). 11182–11190. 26 indexed citations

11.

Garcia‐Bediaga, Asier, et al.. (2019). Wear-Out Condition Monitoring of IGBT and mosfet Power Modules in Inverter Operation. IEEE Transactions on Industry Applications. 55(6). 6184–6192. 44 indexed citations

12.

Reigosa, Paula Diaz, et al.. (2019). Impact of Repetitive Short-Circuit Tests on the Normal Operation of SiC MOSFETs Considering Case Temperature Influence. IEEE Journal of Emerging and Selected Topics in Power Electronics. 8(1). 195–205. 37 indexed citations

13.

Arias, Manuel, et al.. (2019). Discontinuous PWM for Online Condition Monitoring of SiC Power Modules. IEEE Journal of Emerging and Selected Topics in Power Electronics. 8(1). 323–330. 14 indexed citations

14.

Luo, Haoze, Paula Diaz Reigosa, Francesco Iannuzzo, & Frede Blaabjerg. (2018). On-line solder layer degradation measurement for SiC-MOSFET modules under accelerated power cycling condition. Microelectronics Reliability. 88-90. 563–567. 18 indexed citations

15.

Baker, Nick, Francesco Iannuzzo, & Helong Li. (2018). Impact of Kelvin-Source Resistors on Current Sharing and Failure Detection in Multichip Power Modules. VBN Forskningsportal (Aalborg Universitet). 1–7. 8 indexed citations

16.

Reigosa, Paula Diaz, Francesco Iannuzzo, & Lorenzo Ceccarelli. (2018). Effect of short-circuit stress on the degradation of the SiO2 dielectric in SiC power MOSFETs. Microelectronics Reliability. 88-90. 577–583. 45 indexed citations

17.

Reigosa, Paula Diaz, Francesco Iannuzzo, Munaf Rahimo, & Frede Blaabjerg. (2017). Capacitive effects in IGBTs limiting their reliability under short circuit. Microelectronics Reliability. 76-77. 485–489. 4 indexed citations

18.

Reigosa, Paula Diaz, et al.. (2017). Improving the Short-Circuit Reliability in IGBTs: How to Mitigate Oscillations. IEEE Transactions on Power Electronics. 33(7). 5603–5612. 18 indexed citations

19.

Busatto, G., C. Abbate, & Francesco Iannuzzo. (2010). Non destructive SOA testing of power modules. 1–6. 6 indexed citations

20.

Abbate, C., G. Busatto, & Francesco Iannuzzo. (2009). The effects of the stray elements on the failure of parallel connected IGBTs during Turn-Off. European Conference on Power Electronics and Applications. 1–9. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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